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FI RST MGPA V2 TEST RESULTS wit h I PNL SETUP And MGPA V2 TEST PRODUCTI ON
- R. Della-Negra, M. Dupanloup, J . Fay, S. Gascon, H. El Mamouni, B. I lle, H. Mat hez
FI RST MGPA V2 TEST RESULTS wit h I PNL SETUP And MGPA V2 TEST - - PowerPoint PPT Presentation
FI RST MGPA V2 TEST RESULTS wit h I PNL SETUP And MGPA V2 TEST PRODUCTI ON R. Della-Negra, M. Dupanloup, J . Fay, S. Gascon, H. El Mamouni, B. I lle, H. Mat hez 1 CMS FRANCE MAI 2004 h. mathez MGPA V2 TEST SETUP (0) Dif f
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MGPA V2 test board I 2C
Scope or CSA803
PC Labview PicoPulse Gen Trigger 3 Gains
50Ω input
Bessel Filt er 30 ns
Data
± 40 V in 400 ps
Cinj = 1. 0 pF Calibrat ed
Dif f erent ial t o single ended 50Ω out put
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ARI ES SOCKET
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Q=40pC, Gain X1 Rs1 = 3.3 Ohms Rs2 = 4.7 Ohms
X1
Rs1 = 10 Ohms Rs2 = 10 Ohms
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Qin = 4.5pC Rs1,2 = 10 Ohms Af t er Reset , I 2C = 64 Pkt X1 ≈ 50ns Pkt X6 ≈ 50ns Pkt X12 ≈ 50ns Pkt PA ≈ 25ns
X1 X6 X12 PA
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X12 p X12 m PA
Qin = 4.5pC Rs1,2 = 10 Ohms Af t er Reset I 2C = 64 X1 plus and minus out put Base line are :
1.7 V (ADC input )
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X1 p X1 m PA
Qin = 40pC Rs1,2 = 10 Ohms Af t er Reset I 2C = 64 X1 plus and minus out put Base line are :
0.8 V (ADC input )
1.7 V (ADC input )
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Socket : wit h microst rip, same t echnology as previous (FPPA) package EDQUAD 52 pins ASAT
New problems with Aries socket and ASAT TQFP100 package
Some devices present an excess of plast ic in t he corners Some small chips goes under t he microst rip : no elect rical cont act , t he MGPA does not work ! Microst rips could be t wist ed due t o t his small chips, t he MGPA does not work !
Solutions
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MGPA V2 TESTI NG PRODUCTI ON REQUI REMENTS St art t est ing product ion : middle of Sept ember (if product ion st art s on middle of j une)
PARAMETER MEASUREMENTS TO BE DONE DC power supply
Current
I2C register
Internal Default Value (64) after reset
Scan Chain Functionality
Put some logic input to several values and clock them
Offset Current Generation I2C register 3 I2C values must be tested
Base line on 3 differentials gains amplifiers
Calibration Pulse Generator 3 I2C values which represents 3 different charge injection
(with lookup table values) Output amplitude on 3 differentials gains amplifiers
Qin = 4.5 pC
Rise and Fall Time and peak amplitude on G12 differential gain amplifier
Qin = 8 pC
Rise and Fall Time and peak amplitude on G6 differential gain amplifier
Qin = 50 pC
Rise and Fall Time and peak amplitude on G1 differential gain amplifier
Noise
RMS output amplitude on G12 differential gain amplifier
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TESTI NG HOUSES SUM UP (0)
MICROTEC ASAT EDGETEK TEST PROGRAM DEVELOPMENT € 15 500,00 ? € 12 000,00 HARDWARE DEVELOPMENT € 6 900,00 ? PRICE PER COMPONENT € 0,27 ? € 0,28 TIME PER COMPONENT [s] 10,00 ? TOTAL TIME [h] 361,11 ? TOTAL COST € 57 500,00 ? € 48 400,00 FORECAST TIME SCHEDULE after hardware dev 5/6 weeks >= 8 weeks Chip to be tested 130 000 130 000
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St rengt h Weakness Microt ec Edget ek
3 part ner f or small quant it ies
product ion
TESTI NG HOUSES SUM UP (1) We would suggest t o give t o Microt ec t he MGPA product ion t est s
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TESTI NG CONCLUSI ON (MEETI NG 10 MAY CERN)
Buf f er Test ing House : EDGETEK Forecast Schedule : 100 buf f ers f or J une 10t h 5000 buf f ers f or J uly 15t h MGPA Microt ec or Edget ek but we are wait ing t he Asat ’s answer Edget ek seems t o be t he best way t o t est t he MGPA Forecast Schedule : 1700 MGPA f or j uly 15t h St art t est ing product ion : middle of Sept ember