/ E T . Significance scans of E miss /H T and E miss T T Mariyan - - PowerPoint PPT Presentation

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/ E T . Significance scans of E miss /H T and E miss T T Mariyan Petrov University of Oxford mpetrov@cern.ch November 6, 2016 Mariyan Petrov (Oxford) Oxford November 6, 2016 1 / 28 Table of Contents 1 Introduction 2 Significance 3

slide-1
SLIDE 1

Significance scans of Emiss

T

/HT and Emiss

T

/ ET.

Mariyan Petrov

University of Oxford mpetrov@cern.ch

November 6, 2016

Mariyan Petrov (Oxford) Oxford November 6, 2016 1 / 28

slide-2
SLIDE 2

Table of Contents

1 Introduction 2 Significance 3 Tables 4 Modelling 5 Jet pT scan 6 Conclusion

Mariyan Petrov (Oxford) Oxford November 6, 2016 2 / 28

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SLIDE 3

Introduction I

Follow up from last week

  • 1. We showed a significant decrease in the Zjets background by

introducing an additional selection

  • 2. The two selections under consideration are Emiss

T

/HT > 0.5 and/or Emiss

T

/ ET > 0.5

  • 3. Reduction by more than 50%
  • 4. However some reduction in our signal yields
  • 5. Some ”fine-tuning” of the cut may be needed

Mariyan Petrov (Oxford) Oxford November 6, 2016 3 / 28

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SLIDE 4

Significance Scan I

Significance definition

  • 1. We use the version of the significance adopted by ℓℓνν group
  • 2. That is the version of a counting experiment where the background B

is known and treated as constant

  • 3. Following this logic gives us:

Z =

  • 2 × ((S + B) × log (1 + S/B) − S)

(1)

  • 4. Where S is the total signal yield after all high/low mass selection and

B is the total background for the same selections

  • 5. We scanned through Z for different values of Emiss

T

/HT and Emiss

T

/ ET

Mariyan Petrov (Oxford) Oxford November 6, 2016 4 / 28

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SLIDE 5

Significance Scan, Electron (left), Muon (right)

T

/H

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

Significance Z

3 4 5 6 7 8

ggH1000 ggH300 ggH400 ggH500 ggH600 ggH700 ggH800 ggH900 ZHinv

T

/H

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

Significance Z

3 4 5 6 7 8

ggH1000 ggH300 ggH400 ggH500 ggH600 ggH700 ggH800 ggH900 ZHinv

Mariyan Petrov (Oxford) Oxford November 6, 2016 5 / 28

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SLIDE 6

Significance Scan, Electron (left), Muon (right)

T

E

∑

/

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

Significance Z

1 2 3 4 5 6 7 8 9

ggH1000 ggH300 ggH400 ggH500 ggH600 ggH700 ggH800 ggH900 ZHinv

T

E

∑

/

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

Significance Z

1 2 3 4 5 6 7 8 9

ggH1000 ggH300 ggH400 ggH500 ggH600 ggH700 ggH800 ggH900 ZHinv

Mariyan Petrov (Oxford) Oxford November 6, 2016 6 / 28

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SLIDE 7

Tables of Yields I

High Mass Yields

  • 1. The total background decreases by 12.8% (21.5%) for

Emiss

T

/HT > 0.5 (Emiss

T

/ ET > 0.5)

  • 2. The 600GeV signal decreases by 7.2% (13%) for Emiss

T

/HT > 0.5 (Emiss

T

/ ET > 0.5)

  • 3. The error on the total background decreases by 40%

Mariyan Petrov (Oxford) Oxford November 6, 2016 7 / 28

slide-8
SLIDE 8

Tables of Yields II

Low Mass Yields

  • 1. The total background decreases by 8.2% (22%) for Emiss

T

/HT > 0.5 (Emiss

T

/ ET > 0.5)

  • 2. The 600GeV signal decreases by 1.8% (9.8%) for Emiss

T

/HT > 0.5 (Emiss

T

/ ET > 0.5)

  • 3. The error on the total background decreases by 8% (21%) for

Emiss

T

/HT > 0.5 (Emiss

T

/ ET > 0.5)

Mariyan Petrov (Oxford) Oxford November 6, 2016 8 / 28

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SLIDE 9

Nominal Yields I

Sample Yield Error ggH300NW 49.52 1.22 ggH600NW 37.82 0.33 ggH1000NW 20.49 0.17 TotalBkg 276.87 4.41 Sample Yield Error ggH300NW 45.54 1.17 ggH600NW 39.32 0.34 ggH1000NW 22.81 0.18 TotalBkg 259.10 3.47

Table: Nominal high mass final yields in Electron (Left) and Muon (right).

Sample Yield Error ZHinv 24.83 0.57 TotalBkg 419.12 8.50 Sample Yield Error ZHinv 23.54 0.56 TotalBkg 391.58 10.38

Table: Nominal low mass final yields in Electron (Left) and Muon (right).

Mariyan Petrov (Oxford) Oxford November 6, 2016 9 / 28

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SLIDE 10

High Mass Yields I

Sample Yield Error ggH300NW 47.31 1.20 ggH600NW 35.12 0.32 ggH1000NW 19.63 0.17 TotalBkg 241.57 2.82 Sample Yield Error ggH300NW 43.85 1.15 ggH600NW 36.42 0.33 ggH1000NW 21.74 0.18 TotalBkg 225.79 2.40

Table: Final yields after Emiss

T

/HT > 0.5 in Electron (Left) and Muon (right).

Sample Yield Error ggH300NW 40.70 1.11 ggH600NW 32.89 0.31 ggH1000NW 19.13 0.17 TotalBkg 216.28 2.43 Sample Yield Error ggH300NW 37.45 1.06 ggH600NW 34.27 0.32 ggH1000NW 21.21 0.18 TotalBkg 204.51 2.23

Table: Final yields after Emiss

T

/ ET > 0.5 in Electron (Left) and Muon (right).

Mariyan Petrov (Oxford) Oxford November 6, 2016 10 / 28

slide-11
SLIDE 11

Low Mass Yields I

Sample Yield Error ZHinv 24.35 0.57 TotalBkg 382.92 7.65 Sample Yield Error ZHinv 23.14 0.56 TotalBkg 360.95 9.76 Table: Final yields after Emiss

T

/HT > 0.5 in Electron (Left) and Muon (right). Sample Yield Error ZHinv 22.41 0.54 TotalBkg 322.43 5.66 Sample Yield Error ZHinv 21.19 0.52 TotalBkg 309.37 9.35 Table: Final yields after Emiss

T

/ ET > 0.5 in Electron (Left) and Muon (right).

Mariyan Petrov (Oxford) Oxford November 6, 2016 11 / 28

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SLIDE 12

Modelling of ET I

Modelling ET is mismodelled, it’s not anything new Its connected with the general pile up modelling A few questions on the breakdown of terms Most importantly jet and soft terms I don’t have up to date plots currently, but the important behaviour can be seen with 8.5fb−1

Mariyan Petrov (Oxford) Oxford November 6, 2016 12 / 28

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SLIDE 13

Jet ET, Electron (left), Muon (right)

Mariyan Petrov (Oxford) Oxford November 6, 2016 13 / 28

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SLIDE 14

Soft ET, Electron (left), Muon (right)

Mariyan Petrov (Oxford) Oxford November 6, 2016 14 / 28

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SLIDE 15

Scan of Jet pT I

Changing jet pT threshold

  • 1. We use the version of the significance adopted by ℓℓνν group
  • 2. We scanned through Z for different values of the jet pT (cut fixed for

both leading and sub−leading)

  • 3. We restricted the scan to the VBF signal region
  • 4. The total background in Z includes the ggH signal as background

Mariyan Petrov (Oxford) Oxford November 6, 2016 15 / 28

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SLIDE 16

Shape comparison for Jet pT, Electron (left), Muon (right)

[GeV]

jet T

p 10 20 30 40 50 60 70 80 90 100 a.u 0.05 0.1 0.15 0.2 0.25 0.3 0.35

VBF 600 GeV Total Background VBF 600 GeV Total Background

[GeV]

jet T

p 10 20 30 40 50 60 70 80 90 100 a.u 0.05 0.1 0.15 0.2 0.25 0.3 0.35

VBF 600 GeV Total Background

Mariyan Petrov (Oxford) Oxford November 6, 2016 16 / 28

slide-17
SLIDE 17

Yields variation with Jet pT, Electron (left), Muon (right)

[GeV]

jet T

p 20 30 40 50 60 70 80 90

VBF Event Yields

1 2 3 4 5 6 7

600 mass point, Electron Ch. Signal Background

[GeV]

jet T

p 20 30 40 50 60 70 80 90

VBF Event Yields

1 2 3 4 5 6 7 8 9

600 mass point, Muon Ch. Signal Background

Mariyan Petrov (Oxford) Oxford November 6, 2016 17 / 28

slide-18
SLIDE 18

Scan of Jet pT, Electron (left), Muon (right)

[GeV]

jet T

p 20 30 40 50 60 70 80 90

Significance Z

0.2 0.4 0.6 0.8 1 1.2 1.4

VBF 300 VBF 400 VBF 500 VBF 600 VBF 700 VBF 800 VBF 900 VBF 1000

[GeV]

jet T

p 20 30 40 50 60 70 80 90

Significance Z

0.2 0.4 0.6 0.8 1 1.2 1.4

VBF 300 VBF 400 VBF 500 VBF 600 VBF 700 VBF 800 VBF 900 VBF 1000

Mariyan Petrov (Oxford) Oxford November 6, 2016 18 / 28

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SLIDE 19

Summary

Conclusions We can reject more Z+jets background with the Emiss

T

/ ET and Emiss

T

/HT Emiss

T

/ ET rejects more background but Emiss

T

/HT accepts more signal and better modelling I am in favour for a cut of > 0.5, as this removes more Zjets background The settling factor is probably a limit setting with each cut and

  • bserve how the limit changes

To do: Currently working on making new ntuples, running into difficulties in production of ntuples Currently working on limit setting for ggF and VBF

Mariyan Petrov (Oxford) Oxford November 6, 2016 19 / 28

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SLIDE 20

Backups

Mariyan Petrov (Oxford) Oxford November 6, 2016 20 / 28

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SLIDE 21

High mass event yields,Emiss

T

/HT , Electron (left), Muon (right)

T

/H

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

VBF Event Yields

50 100 150 200 250

600 Gev mass, Electron Signal Background

T

/H

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

VBF Event Yields

50 100 150 200 250 300

600 Gev mass, Muon Signal Background

Mariyan Petrov (Oxford) Oxford November 6, 2016 21 / 28

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SLIDE 22

Low mass event yields,Emiss

T

/HT , Electron (left), Muon (right)

T

/H

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

VBF Event Yields

50 100 150 200 250 300 350

ZHinv, Electron Signal Background

T

/H

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

VBF Event Yields

50 100 150 200 250 300 350 400

ZHinv, Muon Signal Background

Mariyan Petrov (Oxford) Oxford November 6, 2016 22 / 28

slide-23
SLIDE 23

High mass event yields,Emiss

T

/ ET, Electron (left), Muon (right)

T

E

∑

/

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

VBF Event Yields

50 100 150 200 250

600 Gev mass, Electron Signal Background

T

E

∑

/

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

VBF Event Yields

50 100 150 200 250 300

600 Gev mass, Muon Signal Background

Mariyan Petrov (Oxford) Oxford November 6, 2016 23 / 28

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SLIDE 24

Low mass event yields,Emiss

T

/ ET, Electron (left), Muon (right)

T

E

∑

/

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

VBF Event Yields

50 100 150 200 250 300 350

ZHinv, Electron Signal Background

T

E

∑

/

miss T

E 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9

VBF Event Yields

50 100 150 200 250 300 350 400

ZHinv, Muon Signal Background

Mariyan Petrov (Oxford) Oxford November 6, 2016 24 / 28

slide-25
SLIDE 25

High Mass Yields

Sample Yield Error ggH300NW 49.44 1.22 ggH600NW 37.66 0.33 ggH1000NW 20.45 0.17 TotalBkg 271.12 4.27 Sample Yield Error ggH300NW 45.54 1.17 ggH600NW 39.15 0.34 ggH1000NW 22.77 0.18 TotalBkg 254.39 3.36

Table: Final yields after Emiss

T

/HT > 0.3 in Electron (Left) and Muon (right).

Sample Yield Error ggH300NW 49.32 1.22 ggH600NW 37.49 0.33 ggH1000NW 20.41 0.17 TotalBkg 269.75 3.68 Sample Yield Error ggH300NW 45.48 1.17 ggH600NW 38.98 0.34 ggH1000NW 22.73 0.18 TotalBkg 249.95 3.17

Table: Final yields after Emiss

T

/ ET > 0.3 in Electron (Left) and Muon (right).

Mariyan Petrov (Oxford) Oxford November 6, 2016 25 / 28

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SLIDE 26

High Mass Yields

Sample Yield Error ggH300NW 49.12 1.22 ggH600NW 36.89 0.33 ggH1000NW 20.22 0.17 TotalBkg 262.45 3.48 Sample Yield Error ggH300NW 45.12 1.16 ggH600NW 38.33 0.34 ggH1000NW 22.47 0.18 TotalBkg 241.73 2.96

Table: Final yields after Emiss

T

/HT > 0.4 in Electron (Left) and Muon (right).

Sample Yield Error ggH300NW 47.42 1.20 ggH600NW 36.10 0.33 ggH1000NW 20.07 0.17 TotalBkg 250.11 3.05 Sample Yield Error ggH300NW 43.79 1.15 ggH600NW 37.58 0.34 ggH1000NW 22.27 0.18 TotalBkg 231.91 2.49

Table: Final yields after Emiss

T

/ ET > 0.4 in Electron (Left) and Muon (right).

Mariyan Petrov (Oxford) Oxford November 6, 2016 26 / 28

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SLIDE 27

Low Mass Yields

Sample Yield Error ZHinv 24.81 0.57 TotalBkg 414.17 8.44 Sample Yield Error ZHinv 23.52 0.56 TotalBkg 385.50 10.32

Table: Final yields after Emiss

T

/HT > 0.3 in Electron (Left) and Muon (right).

Sample Yield Error ZHinv 24.76 0.57 TotalBkg 409.89 8.31 Sample Yield Error ZHinv 23.48 0.56 TotalBkg 380.14 10.04

Table: Final yields after Emiss

T

/ ET > 0.3 in Electron (Left) and Muon (right).

Mariyan Petrov (Oxford) Oxford November 6, 2016 27 / 28

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SLIDE 28

Low Mass Yields

Sample Yield Error ZHinv 24.68 0.57 TotalBkg 402.83 7.95 Sample Yield Error ZHinv 23.42 0.56 TotalBkg 377.37 9.98

Table: Final yields after Emiss

T

/HT > 0.4 in Electron (Left) and Muon (right).

Sample Yield Error ZHinv 24.41 0.57 TotalBkg 380.32 7.26 Sample Yield Error ZHinv 23.01 0.55 TotalBkg 360.35 9.75

Table: Final yields after Emiss

T

/ ET > 0.4 in Electron (Left) and Muon (right).

Mariyan Petrov (Oxford) Oxford November 6, 2016 28 / 28