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Development of a QC method for assembly of heat conductive material on new ATLAS pixel sensor module Yuji Onishi Yamanaka Lab Yuji Onishi 01 Year-End Presentation 2019/12/23(Mon) Yuji Onishi 2 5~10 times of LHC (250 fb -1 per year)


  1. Development of a QC method for assembly of heat conductive material on new ATLAS pixel sensor module Yuji Onishi Yamanaka Lab Yuji Onishi 01 Year-End Presentation 2019/12/23(Mon)

  2. Yuji Onishi 2 5~10 times of LHC 
 (250 fb -1 per year) 3000 fb -1 12 year after upgraded introduction • LHC will be upgraded to HL-LHC 
 • L arge H adron C ollider • proton - proton collision in √s = 13 TeV. • Luminosity ~ 10 34 cm -2 s -1 • Integrated luminosity ~ 200 fb -1 (until 2018, run2) 
 • H igh L uminosity LHC • Luminosity 
 • Integrated luminosity 


  3. Yuji Onishi 3 introduction Pixel detector For HL-LHC, we will upgrade the pixel detector. To upgrade, we have to do • ATLAS inner pixel detector will be upgraded for HL-LHC • mass production • QA/QC ( Q uality A ssurance/ Q uality C ontrol )

  4. Yuji Onishi sensor silicon we must detect those “thermal bad” we can not cool the sensor enough. Cooling pipe Thermal glue Cooling Cell FPC ASIC ASIC introduction 4 module. • in production of new pixel sensor module • Cooling Cell (carbon) will be loaded • Because front-end ASIC generate heat (10~20W). • Connected to Cooling pipe • with bad glueing, 


  5. Yuji Onishi 5 
 can know the behaviour of thermal bad. 
 
 introduction • how to detect “thermal bad” • candidate methods • leakage current • surface temperature gradient 
 • by comparing health module and intentional bad module, we • Now I am evaluating the sensitivity of these methods

  6. Yuji Onishi 6 temperature with health FE-I4 module 
 •use module which is intentionally failed to glue, 
 •bad contact between Cell and cooling pipe introduction • procedure • prepare temperature monitor system 
 • Now going on measuring the leakage current and surface • same measurement with intentional bad thermal conduction • exam) 


  7. Yuji Onishi Temperature monitor system calibration looks good. 
 into the climate chamber. and digital thermometer In calibration, I put 8 NTCs R is NTC resistance T is temperature, A,B,C is coefficient, 
 Steinhart-Hart equation temperature coefficient NTC means thermistor which has negative 
 • 7 (NTC6&7 is not important) • Temperature monitor • measure the NTC resistance • calibrate by using 


  8. Yuji Onishi 8 measuring setup ( 2 NTCs already implemented on module flex) digital thermometer & humidity sensor • setup to measure the leakage current & surface temperature • attach NTCs on surface of sensor module with thermal paste. • read the resistance of module NTCs with multimeter. 
 • with cables connected (HV, LV, LAN)

  9. Yuji Onishi changing climate chamber temperature 
 NTC4 NTC3 NTC2 NTC1 NTC0 w/ and w/o ASIC working. Sensor module measuring setup 9 • setup to measure the leakage current & surface temperature • purpose : • to know behaviour of below values at several temperature • leakage current • surface temperature 
 • To do so, • I measure these values 


  10. Yuji Onishi NTC5 is on readout PCB board it means all NTC measure the temperature of same temperature NTC0~4 is almost same surface temperature It looks good to measure NTC 6,7 is on air. • • NTC 0~4 is on module surface. • check NTC temperature without ASIC operation measuring setup 10 silicon plate • setup to measure the leakage current & surface temperature • To confirm temperature readout, 


  11. Yuji Onishi 11 measurement • Now going on measuring leakage current & surface temperature

  12. Yuji Onishi 12 bad” Temperature monitor system & measurement setup 
 Summary • I am working on development the method how to detect “thermal • I am trying two candidate way • leakage current & surface temperature gradient 
 • I prepared 
 • I am going on measuring leakage current & surface temperature

  13. Yuji Onishi 13 Prospects temperature with health module 
 •use module which is intentionally failed to glue, 
 •make bad thermal contact between Cell and cooling pipe • I will continue to measure the leakage current and surface • same measurement with intentional bad thermal conduction • exam) 


  14. Back up

  15. Yuji Onishi 15 (for humidity) NTC reference resister ~10kΩ 4.6kΩ monitor system ADC 5V GND • circuit

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