Pin Accessibility-Driven Detailed Placement Refinement
Yixiao Ding @ Cadence Design System Chris Chu @ Iowa State University Wai-Kei Mak @ National Tsing Hua University
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Detailed Placement Refinement Yixiao Ding @ Cadence Design System - - PowerPoint PPT Presentation
Pin Accessibility-Driven Detailed Placement Refinement Yixiao Ding @ Cadence Design System Chris Chu @ Iowa State University Wai-Kei Mak @ National Tsing Hua University 1 Outline Introduction Why pin access is a critical problem
Yixiao Ding @ Cadence Design System Chris Chu @ Iowa State University Wai-Kei Mak @ National Tsing Hua University
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metal-3 wire metal-2 block via1-2 via2-3 metal-2 wire metal-1 pin metal-2 preroute
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global placement detailed placement global routing detailed routing routability-driven physical design flow local congestion-aware Pin access planning
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Taghavi et al, “New Placement Prediction and Mitigation Techniques for Local Routing Congestion”, In Proc. of ICCAD’10
exact
VLSI global routig”, US Patent’ 13
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Self-Aligned Double Patterning”, In Proc. of DAC’15
in Integrated Circuits”, In TCAD’09
a bad planning a wise planning
A B C
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SCa SCb
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to improve pin access/routability
PA-driven DP refinement Refinement techniques: Phase1: cell flipping & swap Phase2: cell shifting
global placement detailed placement global routing detailed routing physical design flow
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shift SCb to right
SCb SCa
A B
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flip SCb
SCb SCa
swap SCa and SCb
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placement (DP) stage
detailed routing. A cost function is presented to guide DP refinement to improve pin access
cell swap, and cell shifting. Our proposed solution is dynamic programming and linear programming-based.
proposed pin access-driven DP refinement
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adjacent cell swap.
unchanged
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may span several metal-2 tracks.
track and the pin shape
Pin access is to select a TP as a via location to connect metal-1 pin and metal-2 wire segment such that the metal-2 wire segment can be extended toward conn. dir. until the other connected pin.
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TP conn. dir. metal-2 track
connection of each pin
A B C PARAB PARBA PARBC PARCB
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same-row connection different-row connection w fw(dist) 1 dis t minw fw(dist) 1 w dis t min width of metal-2 wire dist w
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PAR
a PAR intersects with its PAR.
due to all the CBs and CCs.
scenarios
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(4) (3) (2) (1)
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pin accessibility-driven placement refinement Phase 1: cell flipping & cell swap
Phase 2: cell shifting
legalized DP refined legalized DP
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1 2 3 4 n-1 n
……
….…
1
….…
1
….…
2
….…
2
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each kind is determined by the last cell placement in solk
cells in solk+1
sol4
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.. ….
4 3
.. ….
4 2
.. ….
4 2
.. ….
4 4
… ….
3
.. …..
3
.. ….. .. …..
2
.. …..
4
.. …..
4
.. …..
sol3
2
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Refinement phase 1 (3/3)
…….
n
soln
…….
n
…….
n-1
…….
n-1
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LL RR
minw fw(dist)
1
w dist linear approximation Two stdCell rows
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for Self-Aligned Double Patterning”, In Proc. of DAC’15
detailed routing with color pre-assignment”, TCAD’16
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ecc efc ctl alu div top #cells 1302 1197 1715 1802 3260 12576
10 20 30 40 50 ecc efc ctl alu div top CPU (s) Phase1&2 CPU Phase1 CPU 0.60 0.70 0.80 0.90 1.00 ecc efc ctl alu div top
Given DP DP after P1 DP after P2
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P1 ave. =0.85 P2 ave. =0.82
0.00 2.00 4.00 6.00 8.00 ecc efc ctl alu div top
0.000 0.100 0.200 0.300 0.400 0.500 ecc efc ctl alu div top
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P2 ave. =6.73 P1 ave. =5.04 P1 ave. =0.33
0.90 0.93 0.96 0.99 1.02 1.05 1.08 1.11 1.14 1.17 1.20 ecc efc ctl alu div top
Given DP DP after p1 DP after p2 0.50 0.58 0.67 0.75 0.83 0.92 1.00 ecc efc ctl alu div top
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P1 ave. =0.77 P2 ave. =0.67 P1 ave. =1.14 P2 ave. =1.09
0.70 0.95 1.20 1.45 1.70 ecc efc ctl alu div top
0.95 0.97 0.98 1.00 1.02 1.04 1.05 1.07 1.09 1.10 1.12 ecc efc ctl alu div top
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P1 ave. =1.06 P2 ave. =1.15 P1 ave. =1.02 P2 ave. =1.05
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