Current status of the thick-GEM TPC for the J-PARC E15 experiment - - PowerPoint PPT Presentation

current status of the thick gem tpc for the j parc e15
SMART_READER_LITE
LIVE PREVIEW

Current status of the thick-GEM TPC for the J-PARC E15 experiment - - PowerPoint PPT Presentation

Current status of the thick-GEM TPC for the J-PARC E15 experiment Fuminori Sakuma (RIKEN) Tum-Riken Kick-Off Meeting @ TUM, May 10-11, 2010. 1 Contents Introduction TGEM-TPC for the J-PARC E15 exp. Thick GEM (TGEM) goal: gain


slide-1
SLIDE 1

Current status of the thick-GEM TPC for the J-PARC E15 experiment

Fuminori Sakuma (RIKEN)

1

Tum-Riken Kick-Off Meeting @ TUM, May 10-11, 2010.

slide-2
SLIDE 2

Contents

 Introduction  TGEM-TPC for the J-PARC E15 exp.  Thick GEM (TGEM)

goal: gain〜104 with stable operation in P10 @ NTP

 Results of TGEMs in P10 @ NTP

  • Cu-electrode TGEMs
  • C-electrode TGEMs
  • C/Cu-electrode Hybrid TGEMs

 Summary

2

slide-3
SLIDE 3

3

J-PARC E15 Experiment

search for K-pp bound state using 3He(K-,n) reaction K-

3He

Formation

exclusive measurement by Missing mass spectroscopy

and

I nvariant mass reconstruction

Decay

K-pp cluster

neutron

Λ

p p

π-

Mode to decay charged particles

at at J-PAR ARC

slide-4
SLIDE 4

4

J-PARC E15 Setup

1GeV/c K- beam

p π− p n

mass resolution for K-pp

invariant mass σ = 19MeV/c2 (σCDC = 250µm) missing mass (for 1.3GeV/c neutron) σ = 9.2MeV/c2 (σToF = 150ps)

Neutron ToF Wall Cylindrical Detector System Beam Sweeping Magnet

K1.8BR Beam Line

Beam trajectory CDS & target Sweeping Magnet Neutron Counter Beam Line Spectrometer

slide-5
SLIDE 5

important to measure not only non-mesonic decay mode but also mesonic decay mode

Thick-GEM TPC improves z-resolution

measurement of mesonic decay-mode of K-pp

mesonic mode is suppressed!

slide-6
SLIDE 6

6

TGEM-TPC for the J-PARC E15 exp.

slide-7
SLIDE 7

TGEM-TPC for the J-PARC E15 exp.

7

TGEM-TPC is located at the center of Cylindrical Detector System

  • located between CDC and target-chamber
  • cover the CDC acceptance of AUVA
  • minimum materials in the acceptance
  • 1mm spatial resolution in the z-direction

TGEM TPC

〜2m

Cylindrical Detector System TGEM-TPC TGEM

filled with P10 gas at atmospheric pressure

slide-8
SLIDE 8

Gas connector HV connector

R/O pad size 4mm×20mm # of pad = 4×4×9 = 144 field strip

  • double sided
  • FPC
  • 8mm strip
  • 10mm pitch

8mm 10mm 2 cm 28 cm R/O

TGEM

completed TGEM-TPC

4mm

non-necessity of support-structure!

slide-9
SLIDE 9

9

making of Field Cages

Large FPC board sticking support frames on the FPC soldering resisters(1MΩ) rolling up the FPC Inner and Outer field cages uniting the two cages completed

slide-10
SLIDE 10

10

HV & Readout

HV connector (LEMO, max. 15kV) preamp attachment (test) readout pad readout with TGEM TGEM installation close up view of double-TGEM to reduce detector capacitance,

  • ne side of TGEM is

divided into 3 parts

slide-11
SLIDE 11

11

Readout Electronics is the same as that of CDC

preamp cards and cables are attached TDC’s in the counting room LVDSECL converters at the exp. hall

  • Chip : CXA3183Q

(SONY , low noize ASD IC, τ=16nsec)

  • Output : LVDS differential
  • Gain : 0.8V/pC at preamp
  • 4x4=16ch

8m cables 60m cables

LVDS ECL

τ=80nsec

We measure only time

  • info. with the TPC!
slide-12
SLIDE 12

12

gas

limit of HV module : 15kV GEM HV : 4kV drift length : 30cm maximum drift-field voltage : ~350V/cm

We choose P10 (Ar/CH4=90/10) for the TGEM-TPC gas

2 2 2 d x eff

C z N σ σ ⋅ = +

σx : total resolution σ0 : resolution w/o diffusion Cd : diffusion constant z : drift distance Neff : effective number of electrons

expected resolution

E = 150V/cm  Cdl = 0.34mm, Cdt = 0.60mm σ0l = 0.5mm σ0t = 0.2mm Neff = 38.7*0.4(cm) = 15.5

0.0 0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 5 10 15 20 25 30 35

resolution(mm) z(cm)

longitudinal transverse

z Dl Dt σl σt (c (cm) (mm) mm) (mm) mm) (mm) mm) (mm) mm) 0.00 0.00 0.50 0.20 10 1.09 1.89 0.57 0.52 20 1.54 2.67 0.63 0.71 30 1.88 3.27 0.69 0.85

longitudinal transverse

φ-direction resolution is limited by pad size, e.g., 20.0/sqrt(12) = 5.8mm So we use only z-direction info.

slide-13
SLIDE 13

13

Thick GEM (TGEM)

goal: gain〜104 with stable operation

slide-14
SLIDE 14

What is TGEM ?

TGEM@RIKEN

Drilled hole 300µm Rim 100µm

Garfield Simulation avalanche thickness:400µm ∆VGEM∼1kV

avalanche

TGEM cross-section and drift line

14

Thick-GEM is …

cost-effectively fabricated from double-clad G10 plates, using standard printed circuit board (PCB) techniques

holes are mechanically drilled (and, if necessary, the hole’s rim is chemically etched to prevent discharges) a robust, simple to manufacture, high-gain gaseous electron multiplier easy to operate and feasible to cover large areas, compared to the standard foil GEM

slide-15
SLIDE 15

15

 gain〜104 @ P10, NTP (double TGEMs)  stabile operation for a month, with gain fluctuation within ~a few ten % for a month & a few % for a day many groups have reported TGEMs work successfully, but actually it’s NOT so easy to operate TGEM with high gain stably!

  • they use small TGEMs, e.g. ~3x3cm2
  • most of them don’t discuss stability of TGEM

TGEM prototypes

We have studied basic TGEM behavior and performance.

goal

slide-16
SLIDE 16

TGEM prototypes @ RIKEN

produced by REPIC corp. and TOUKAI DENSHI KOUGYOU corp.

16

No. No. Electrod rode Ins nsul ulator Thickn kness[ ss[µm] Hol Hole-diame meter[ r[µm] m] Rim[µm] 1 Cu Cu FR4/U 4/UV 200 200 300 300 50 50 ×2 2 Cu Cu FR4/U 4/UV 200 200 500 500

  • ×2

3 Cu Cu FR4/U 4/UV 400 400 300 300

  • ×5

4 Cu Cu FR4/U 4/UV 400 400 300 300 30 30 ×2 5 Cu Cu FR4/U 4/UV 400 400 300 300 50 50 ×2 6 Cu Cu FR FR4 400 400 300 300 100 100 ×2 7 Cu Cu FR4/U 4/UV 400 400 500 500

  • ×2

8 C FR FR4 400 400 300 300

  • ×4

9 C FR4/U 4/UV 400 400 300 300

  • ×7

10 10 C G10 400 400 300 300

  • ×2

11 11 C CEM EM3 400 400 300 300

  • ×2

12 12 C FR FR4 600 600 300 300

  • ×2

13 13 C/ C/Cu Cu FR4/U 4/UV 400 400 300 300

  • ×4

Tota tal 40 size : 10cm x 10cm

slide-17
SLIDE 17

17

many TGEM prototypes

slide-18
SLIDE 18

readout pad

test chamber Ga Gas : : P10 a 10 at 1a 1atm, no normal t tem emper eratur ure

DC 1M 2200p 1M 2M 1M 2M 1M GEM1 GEM1 GEM2 GEM2 mesh 20M 20M 20M 20M 11mm 2mm 400um 2mm 400um R/O 20M 72Hz low-pass

HV V div ivid ider w wit ith h res esis istive cha chain in

18

Test bench setup

doub uble TGE TGEMs

 Ratio of ∆VGEM/Etrns/Eind is const. 11mm 2mm 2mm drift mesh TGEM 1 TGEM 2 R/O pad CS preamp

55Fe

Double GEM setup X-ray e- ΔVGEM ΔVGEM Etrns Eind Edrift

(150V/cm)

slide-19
SLIDE 19

19

Results of TGEMs

slide-20
SLIDE 20

Cu-electrode TGEM

TGEMs with thickness of 400μm and hole diameter

  • f 300μm achieve maximum gain of 104

20

No. No. Electrod rode Ins nsul ulator Thickn kness[ ss[µm] Hol Hole-diame meter[ r[µm] m] Rim[µm] Max g gain 1 Cu Cu FR4/U 4/UV 200 200 300 300 50 50 〜10 103 2 Cu Cu FR4/U 4/UV 200 200 500 500

  • 3

Cu Cu FR4/U 4/UV 400 400 300 300

  • 〜10

104 4 Cu Cu FR4/U 4/UV 400 400 300 300 30 30

  • v
  • ver

r 2×10 104 5 Cu Cu FR4/U 4/UV 400 400 300 300 50 50

  • v
  • ver

r 2×10 104 6 Cu Cu FR FR4 400 400 300 300 100 100

  • v
  • ver

r 2×10 104 7 Cu Cu FR4/U 4/UV 400 400 500 500

  • 〜10

103 Rim of 50,100μm : Weizmann method (drilling + masked etching) Rim of 30μm : CERN method (drilling + resist etching) w/o Rim (#3) : w/ hydrogen peroxide - sulfuric acid etching

slide-21
SLIDE 21

1.0E+00 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 800 900 1000 1100 1200

effective gain

ΔVGEM[V]

Cu Rim 100μm Cu Rim 50μm Cu Rim 30μm Cu no Rim

goal the limits of gain around 105 is caused by reather limit (source = 55Fe).

Edrift=150V/cm ∆VGEM (V) : Etrans (V/cm) : Einduct (V/cm) 1 : 2.5 : 7.5

dependence on rim size

21

TGEM with larger rims requires higher voltage, but enables higher gain

slide-22
SLIDE 22

gain 〜2.5×104

initial drop of gain is caused by charge-up (polarization?) of the insulator? instability of TGEMs with rims is caused by charge-up of the insulator not metalized. mismatch of the center of the etched and drilled holes and incomplete round-shape of rims cause the instability.

gain and resolution stability (24h)

22

energy resolution@5.9keV(σ)

gain

TGEMs with rims ( , , ) are NOT so stable TGEM without rims ( ) is stable

100µm 50µm 30µm No Rim 100µm 50µm 30µm No Rim corrected relative gain resolution(σ) [%]

slide-23
SLIDE 23

23

TGEM with 30µm rims can be operated with gain of more than 104 for the long term @ P10, NTP gain stability is within ~50%/week & ~10%/day

long term stability (30µm rims TGEM, 10days)

relative gain

gain=2.5×104

raw data

2 1 0 10days resolution(σ) [%] 40 20 0 10days relative gain

gain~2.5×104

P/T corrected data

2 1 0 10days ∆VGEM is turned up by hand gain=1.0×104

slide-24
SLIDE 24

24

C-electrode TGEM

No. No. Electrod rode Ins nsul ulator Thickn kness[ ss[µm] Hol Hole-diame meter[ r[µm] m] Rim[µm] Max g gain 8 C FR FR4 400 400 300 300

  • v
  • ver

r 2×10 104 9 C FR4/U 4/UV 400 400 300 300

  • 10

10 C G10 400 400 300 300

  • 〜10

103 11 11 C CEM EM3 400 400 300 300

  • v
  • ver

r 2×10 104 12 12 C FR FR4 600 600 300 300

  • 〜10

102

To avoid the effects of rims, we are developing a new resistive-electrode TGEM (RETGEM ) which has electrodes coated with graphite paint. RETGEMs have an advantage of being fully spark-protected.

slide-25
SLIDE 25

Results of the first sample

1.E+01 1.E+02 1.E+03 1.E+04 1.E+05 750 800 850 900 950 1000 gain ΔVGEM[V]

Carbon

ΔVGEM×7.5

gain〜2.5×104

25

gain

energy resolution@5.9keV(σ)

It seemed that C-electrode TGEMs

work excellent!!! However...

Edrift=150V/cm ∆VGEM (V) : Etrans (V/cm) : Einduct (V/cm) 1 : 2.5 : 7.5

goal

slide-26
SLIDE 26
  • nly first 2 out of 11 samples of RETGEMs work !!!

discharge from burrs arising from drilling process (but these can be removed using antistatic-brush) carbon attachment inside the holes caused by knot of FR4 fiber

26

now, we have been studying another insulator of CEM3 not FR4/G10

carbon TGEMs have no reproducibility at all !!!

cross section of FR4 (400µm) knot of fiber

  • nly 2

RETGEMs work burrs

slide-27
SLIDE 27

C/Cu-electrode Hybrid-TGEM

In principle, if one side of electrode is resistive then that would be spark-protected.

Cu Cu+Cu electrode Cu C+C electrode C+Cu electrode C C C Cu

spark-protected spark-protected

Hybrid-TGEM would have a possibility of reduction of carbon attachment inside the holes.

27

C+C electrode C+Cu electrode No. No. Electrod rode Ins nsul ulator Thickn kness[ ss[µm] Hol Hole-diame meter[ r[µm] m] drill ill 13 13 C/ C/Cu Cu FR4/U 4/UV 400 400 300 300 Cu→C ×2 C/ C/Cu Cu FR4/U 4/UV 400 400 300 300 C→Cu ×2

slide-28
SLIDE 28

28

1.0E+00 1.0E+01 1.0E+02 1.0E+03 1.0E+04 1.0E+05 800 850 900 950 1000 effective gain ΔVGEM[V]

Results of C/Cu-electrode Hybrid TGEM

gain〜2.5×104

The 2 fabrication methods work similarly corrected gain

energy resolution@5.9keV(σ)

We tried 2 drilling directions, i.e. CuC and CCu

Cu C C Cu Edrift=150V/cm

∆VGEM (V) : Etrans (V/cm) : Einduct (V/cm) 1 : 2.5 : 7.5

slide-29
SLIDE 29

29

0 25days

hybrid TGEM can be operated with more than gain

  • f 104 for the long term @ P10, NTP

gain stability is within ~20%/week & ~5%/day

40 20 resolution(σ) [%]

raw data

blanks in the plots are

  • ut of 55Fe source,

but keep to turn on HV gain=2.5×104 gain=1.0×104 relative gain

P/T corrected data

0 25days ∆VGEM is turned up by hand 2 1

long term stability (hybrid TGEM, 25days)

slide-30
SLIDE 30

30

  • We have been developing a TGEM-TPC for the J-PARC

E15 upgrade

  • TGEM-TPC was completed, and commissioning

will be started soon

  • Cu electrode TGEM with 30µm rims can be operated

with gain of more than 104 for the long term rather stably @ P10, NTP

  • C-electrode TGEM is far from goal...
  • C/Cu electrode TGEM can be operated with gain of

more than 104 for the long term stably @ P10, NTP

Summary

slide-31
SLIDE 31

31

slide-32
SLIDE 32

32

C electrode TGEM with CEM3 insulator

cross section of CEM3

A cross section of CEM3 is very clean compared with that of FR4.

cross section of FR4 knot of FR4 fibers

reduction of carbon attachment inside the holes

Now we are investigating reproducibility of CEM3 RETGEM

A disadvantage of CEM3 RETGEM is its flexibility

1.E+01 1.E+02 1.E+03 1.E+04 1.E+05 800 850 900 950 1000

effective gain ΔVGEM[V]

gain resolution gain〜2.5×104

slide-33
SLIDE 33

33

How to make Rims

There are 2 ways

Weizmann method CERN method CERN method Weizmann method masking pattern drilling etching masking off drilling etching masking off (failure) drilling + masked etching Advantage: large rims can be made easily Disadvantage: difficult to center etched and drilled holes drilling + resist etching Advantage: center of etched and drilled holes are the same Disadvantage: difficult to make large rims

It’s known that large rims cause instability of TGEMS, although those enable TGEMs to reach high gain.

Weizmann CERN resist film

slide-34
SLIDE 34

drift mesh TGEM 1 TGEM 2 R/O pad ED=150 V/cm

1.0E+02 1.0E+03 1.0E+04 1.0E+05 1000 2000 3000 4000 5000 6000

effective gain ET [ V/cm]

ΔVGEM=900V ΔVGEM=940 ΔVGEM=980V ΔVGEM=1020V ΔVGEM=1060V

ET

1.E+02 1.E+03 1.E+04 1.E+05 2000 4000 6000 8000 10000

effective gain EI [ V/cm]

ΔVGEM=900V ΔVGEM=940V ΔVGEM=980V ΔVGEM=1020V ΔVGEM=1060V

EI

55Fe

1.0E+02 1.0E+03 1.0E+04 1.0E+05 850 900 950 1000 1050 1100

effective gain ΔVGEM [V]

ΔVGEM ΔVGEM

ET, EI dependence (Rim 30µm TGEM)

slide-35
SLIDE 35

プリアンプアウト

preamp

35

raw signal

in consideration of TPC

  • peration,

effective gain ~ 104 long time stability of gain and resolution

goal for of TGEM study gain 〜2.0×104

Double TGEM #4 P10, 1atm ∆VGEM = 983V

55Fe X-ray

signals and goal of the studies

preamp out ADC spectrum 1mV 100ns 200mV

slide-36
SLIDE 36

correction raw gain corrected relative gain

36

P/T correction of gain

correlation P/T correction function P/T

slide-37
SLIDE 37

・ ethanol cleaning → ×

・does not improve at all

・ plasma etching → △

・improves a little bit, but it’s not perfect ・does not remove burrs of carbon

・ removing burrs with resist-film and/or antistatic-brush → △

・removes burrs, but does not improve

・ steam cleaning → ×

・does not improve at all

・ polyimide etching → ?

・effects are depend on material of the insulator ・and also depend on etching time

・ change insulator (FR4/UV→CEM3) → ?

・CEM3 TGEMs work good, but that are after polyimide etching (we did not check the without the etching)

37

after-treatment of C-electrode TGEM

We tried many items to make the C-electrode TGEMs work We have to study more

slide-38
SLIDE 38

38

Outlook

  • Nonagonal TGEMs (w/o rims and Cu-rim-30μm) and

Hybrid-TGEMs for the TPC were produced, and studies have started now.

  • Development of Carbon TGEMs will be continued in

the year 2010.

slide-39
SLIDE 39

Physics Motivation

39

SPS, RHIC, LHC KEK-PS

W.Weise NPA553, 59 (1993).

E549@KEK-PS FINUDA@DAΦNE DISTO@SATUREN OBELIX@CERN-LEAR

T.Yamazaki, A.Dote, Y .Akiaishi PLB587,167(2004).

deeply-bound kaonic nuclear states exist?

We need conclusive evidence!