2019 OIC Manufacturing Problem Contest Daniel Poitras 1 , Li Li 1 - - PowerPoint PPT Presentation

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2019 OIC Manufacturing Problem Contest Daniel Poitras 1 , Li Li 1 - - PowerPoint PPT Presentation

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2019 OIC Manufacturing Problem Contest Daniel Poitras 1 , Li Li 1 Michael Jacobson 2 , Catherine Cooksey 3 1 National Research Council of Canada, Ottawa, Canada. 2 Optical Data Associates, Tucson, USA. 3 National Institute of Standards and

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SLIDE 1

2019 OIC 1

Daniel Poitras1, Li Li1 Michael Jacobson2, Catherine Cooksey3

1 National Research Council of Canada, Ottawa, Canada. 2 Optical Data Associates, Tucson, USA. 3 National Institute of Standards and Technology, Gaithersburg, USA.

June 2019, Santa Ana Pueblo, New Mexico, USA

2019 OIC Manufacturing Problem Contest

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SLIDE 2

2019 OIC 2

2019 OIC Manufacturing Problem Contest

Past Contest Problems

1. 2001 – Bow Lake Problem – R,T

targets, R+T=1, visible

2. 2004 – Oblique AOI, visible 3. 2007 – CIE, yellow-blue-clear,

absorbing layer

4. 2010 – T, Log-scale, vis 5. 2013 – T, vis-NIR 6. 2016 – Moose Skull Problem – R,T

targets, R+T<1

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SLIDE 3

Dictionnary.com

2019 OIC 3

2019 Problem

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SLIDE 4
  • 2019

“Yucca” Problem

  • Wavelength range: 400–1100nm
  • Transmittance spectra
  • Angles of incidence: 10°, 50°
  • Polarization: S
  • Substrate: BK7, 1-mm thick, 2” ϕ

(Edmund Optics)

  • Any design
  • Any fabrication method
  • No hazardous materials

2019 OIC 4

2019 OIC Manufacturing Problem Contest 10° 50°

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SLIDE 5
  • Evaluation Team

2019 OIC 5

2019 OIC Manufacturing Problem Contest

0.1 0.2 0.3 0.4 0.5 0.6 0.7 0.8 0.9 1 400 500 600 700 800 900 1000 1100

Transmittance (s-pol) Wavelength [nm]

Ts at 10° AOI Ts at 50° AOI

Measurements done at 2 independent evaluation labs:

  • ODA (Mike Jacobson)
  • NIST (Catherine Cooksey)
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SLIDE 6
  • 2019 Problem Analysis

– Design

2019 OIC 6

2019 OIC Manufacturing Problem Contest

1-side design, MF = 3.60 3.8um, 50 layers 2-side design, MF = 2.77 2.68 + 1.73um, 30 + 24 layers

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SLIDE 7

2019 OIC 7

  • 2019 Problem Analysis

– Design: Matching Peaks and Valleys in 2-side Coatings 2019 OIC Manufacturing Problem Contest

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SLIDE 8

2019 OIC 8

2019 OIC Manufacturing Problem Contest

  • 2019 Problem Analysis

– Measurement

  • Sensitivity to polarization variation
  • Beam deviation
  • High angle of incidence
  • Sensitivity to angle variation
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SLIDE 9

2019 OIC 9

2019 OIC Manufacturing Problem Contest

  • Controlling the Polarization: Example with BK7 (at 800 nm)

Polarization Angle Polarization Angle Polarization Angle Transmittance Transmittance Transmittance AOI AOI AOI

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SLIDE 10

2019 OIC 10

2019 OIC Manufacturing Problem Contest

  • Measurements

at Large Oblique Angles

Surface uniformity, beam deviation (alignment, stress)

Variation of Transmittance Wavelength [nm] AOI

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SLIDE 11

2019 OIC 11

2019 OIC Manufacturing Problem Contest

Example of deviation of 3 measurements done on 3 different days

  • Controlling the Angle of Incidence and Position:

AOI

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SLIDE 12

2019 OIC 12

2019 OIC Manufacturing Problem Contest

Example of AOI Sensitivity

AOI

AOI

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SLIDE 13

2019 OIC 13

Some Variable Angle Transmittance Sample Holders…

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SLIDE 14
  • Expected Difficulties

– Design robustness – Measurements – Thickness control

2019 OIC 14

2019 OIC Manufacturing Problem Contest

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SLIDE 15
  • Participants

2019 OIC 15

Team Leaders Organizations

Zach Gerig

FiveNine Optics, Boulder CO , USA

Julien Lumeau

Institut Fresnel, Marseille, France

Vladimir Ponomarev

OptiSpark, LLC Moscow,, Russian Federation

Marc Lappschies Optics Balzers, Jena, Germany Masahiro Akiba

TOPCON Corporation, Tokyo, Japan

Lucas Alves

Viavi Solutions, Santa Rosa CA, USA

Karen Hendrix

Viavi Solutions, Santa Rosa CA, USA

Andrew Hulse

Viavi Solutions, Santa Rosa CA, USA

2019 OIC Manufacturing Problem Contest

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SLIDE 16
  • Samples and Info Received from Participants

2019 OIC 16

#Layers (front+back coatings) Total thickness (um) MF Design MF Meas Additional information

S01 224 17.6 2.030 3.671 Magnetron sputtering S02 68+57 6.5+5.3 0.59 0.88 Ion-beam sputtering S03 178 12.9 2.14 2.53 Magnetron sputtering S04 255 16.1 1.106 2.411 Magnetron sputtering S05 86+78 6.57+6.40 0.445 1.608 PARMS-Helios800, optical broadband

monitoring

S06 64+62 7.32+6.60 0.740 7.130 PIAD (Bühler SYRUSpro); monitoring

Buhler OMS5000

S07 70+68 6.06+6.47 0.439 2.353 S08 32+42 3.73+4.51 0.46 2.646 SURUSpro 710; monitoring OMS 5000 S09 74+64 7.36+6.67 0.46 2.61 PARMS (Bühler HELIOS); monitoring

Buhler OMS5100

2019 OIC Manufacturing Problem Contest

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SLIDE 17
  • Independent Evaluation of Samples

2019 OIC 17

ODA NIST

Instrument Cary 5000 Perkin Elmer Lambda 1050 Beams Double-grating and double-beam Double-beam Wavelength range 400 – 1100 nm, 1.0 nm step 400 – 1100 nm, 1.0 nm step Light-source Tungsten-halogen / deuterium Tungsten-halogen / deuterium Detectors Photomultiplier / PbS Photomultiplier / InGaAs Transmittance accuracy ±0.2% in visible, ±0.2% in NIR ±0.6% in visible, ±0.6% in NIR

2019 OIC Manufacturing Problem Contest

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SLIDE 18

2019 OIC 18

2019 OIC Manufacturing Problem Contest

  • Sample S01

RESULTS

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SLIDE 19

2019 OIC 19

2019 OIC Manufacturing Problem Contest

  • Sample S02

RESULTS

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SLIDE 20

2019 OIC 20

2019 OIC Manufacturing Problem Contest

  • Sample S03

RESULTS

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SLIDE 21

2019 OIC 21

2019 OIC Manufacturing Problem Contest

  • Sample S04

RESULTS

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SLIDE 22

2019 OIC 22

2019 OIC Manufacturing Problem Contest

  • Sample S05

RESULTS

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SLIDE 23

2019 OIC 23

2019 OIC Manufacturing Problem Contest

  • Sample S06

RESULTS

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SLIDE 24

2019 OIC 24

2019 OIC Manufacturing Problem Contest

  • Sample S07

RESULTS

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SLIDE 25

2019 OIC 25

2019 OIC Manufacturing Problem Contest

  • Sample S08

RESULTS

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SLIDE 26

2019 OIC 26

2019 OIC Manufacturing Problem Contest

  • Sample S09

RESULTS

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SLIDE 27
  • Results Analysis

2019 OIC 27

2019 OIC Manufacturing Problem Contest

Radius ∝ total thickness Blue : front side Red : back side

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SLIDE 28

2019 OIC 28

2019 OIC Manufacturing Problem Contest

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SLIDE 29

2019 OIC 29

2019 OIC Manufacturing Problem Contest

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SLIDE 30

2019 OIC 30 #Layers (front+back coatings) Total thickness (µm) MF Design MF Meas MF ODA MF NIST MF Ave. Rank.

S01 224 17.6 2.030 3.671 3.574

+/-0.006

3.830

+/-0.006

3.020

+/-0.004

8 S02 68+57 6.5+5.3 0.59 0.88 0.891

+/-0.006

1.436

+/-0.006

1.164

+/-0.004

1 S03 178 12.9 2.14 2.53 2.530

+/-0.006

2.640

+/-0.006

2.585

+/-0.004

5 S04 255 16.1 1.106 2.411 2.539

+/-0.006

2.451

+/-0.006

2.495

+/-0.004

4 S05 86+78 6.57+6.40 0.445 1.608 1.728

+/-0.006

1.644

+/-0.006

1.686

+/-0.004

2 S06 64+62 7.32+6.60 0.740 7.130 6.478

+/-0.006

6.141

+/-0.006

6.309

+/-0.004

9 S07 70+68 6.06+6.47 0.439 2.353 2.272

+/-0.006

2.090

+/-0.006

2.181

+/-0.004

3 S08 32+42 3.73+4.51 0.46 2.646 2.890

+/-0.006

3.001

+/-0.006

2.945

+/-0.004

7 S09 74+64 7.36+6.67 0.46 2.61 2.489

+/-0.006

2.852

+/-0.006

2.670

+/-0.004

6

2019 OIC Manufacturing Problem Contest

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SLIDE 31

Conclusions

  • There are problems that are

easier with 2-side coated designs

  • Measurements at high AOI

demand care

  • THANK YOU!!

2019 OIC 31

2019 OIC Manufacturing Problem Contest Acknowledgment

  • We would like to thank

Edmund Optics for the generous donation of BK7 substrates for the contest.