When (Low ) Pow er Really Matters When (Low ) Pow er Really Matters - - PowerPoint PPT Presentation
When (Low ) Pow er Really Matters When (Low ) Pow er Really Matters - - PowerPoint PPT Presentation
When (Low ) Pow er Really Matters When (Low ) Pow er Really Matters When (Low ) Pow er Really Matters When (Low ) Pow er Really Matters Yogesh K. Ramadass, AnanthaGroup Microsystems Technology Laboratory Outline Outline Outline Outline
Outline Outline Outline Outline
Introduction Voltage Scaling techniques Challenges with Low voltage operation System Examples Conclusion
Moore Moore Moore Moore ’ ’s Law s Law s Law s Law
- No. of transistors doubles every two years
Not a physical law, started of as a graphical observation Exponential increase in circuit complexity
Gordon Moore Co-founder, INTEL
Processor Pow er Levels Processor Pow er Levels Processor Pow er Levels Processor Pow er Levels
More Speed More Power More Processing More Power
So Where is the Pow er Lost? So Where is the Pow er Lost? So Where is the Pow er Lost? So Where is the Pow er Lost?
Analog Circuits – Opamps, ADC/DAC’s, Current/Voltage
references
Bias Currents Switches
Digital Circuits – Processors, Memory
Charging up capacitances
Leakage!!
Imagine burning calories when sitting idle 30% of total power in big microprocessors More on this later
A simplistic view of process scaling A simplistic view of process scaling A simplistic view of process scaling A simplistic view of process scaling
VBAT CL
Reduce CL , reduce power Area reduces too!!
Area = Cost
Faster switches
More processing
Downside, switches don’t turn off completely
250, 180, 130, 90, 65, 45, 32, 22 Process Scaling enables Moore’s Law
s 2 BAT L 2 BAT L cycle
f V C Power V C E . = =
( )
BAT L 2 T BAT s
V C V V f . − ∝
Outline Outline Outline Outline
Introduction Voltage Scaling techniques Challenges with Low voltage operation System Examples Conclusion
Dynamic Voltage Scaling Dynamic Voltage Scaling Dynamic Voltage Scaling Dynamic Voltage Scaling
Goal: Operate Circuits at just enough voltage
- B. Calhoun
- B. Calhoun
( )
BAT L 2 T BAT s
V C V V f . − ∝
Implementation of a DVS System Implementation of a DVS System Implementation of a DVS System Implementation of a DVS System
- V. Gutnik
- V. Gutnik
1996 1996
Change Voltage with change in workload
Pow er Savings by DVS Pow er Savings by DVS Pow er Savings by DVS Pow er Savings by DVS
Courtesy : intel.com Exponential drop both voltage and frequency scale Linear drop only frequency scales, min. voltage Power (Normalized)
Intel Core Duo Processor
Energy Constrained Applications Energy Constrained Applications Energy Constrained Applications Energy Constrained Applications
Micro-sensor networks RFID Tags Medical devices Portable Electronics
Target Tracking & Detection (Courtesy of ARL)
Inductive Link Inductive Link Inductive Link Inductive Link
Try to reduce power consumption to fit in energy budget
Sub-threshold Operation: slower, minimum energy Strong Inversion Operation: fast, high-energy
0.2 0.4 0.6 0.8 1 10
- 8
10
- 6
10
- 4
10
- 2
100
VDD (Normalized) ID (Normalized)
Sub-threshold logic operates with VDD < VT Both on and off current are sub-threshold “leakage”
Sub Sub Sub Sub-
- threshold Operation
threshold Operation threshold Operation threshold Operation
D
I Speed ∝
Minimum Energy Point (MEP) Minimum Energy Point (MEP) Minimum Energy Point (MEP) Minimum Energy Point (MEP)
LEAKAGE ACTIVE TOTAL
E E E + =
⎟ ⎟ ⎠ ⎞ ⎜ ⎜ ⎝ ⎛ + = + =
−
th DD
nV V eff eff D D OFF DD
e L C T V I CV
2 DD 2
V
65nm simulation
for 7-tap FIR filter showing minimum energy
- peration
Leakage Energy Total Energy Active Energy MEP
0.2 0.4 0.6 0.8 1 1.2 0.5 1 1.5 2 2.5 3 3.5 4
VDD (V) Eop (Normalized)
Motivation Motivation Motivation Motivation – – Minimum Energy Tracking Minimum Energy Tracking Minimum Energy Tracking Minimum Energy Tracking
Minimum Energy Point (MEP) varies with workload and
temperature
MEP moves when ratio of active to leakage energy
changes
Tracking the MEP : 0.5X – 1.5X energy savings Increasing Workload 0.25 0.3 0.35 0.4 0.45 0.5 1 1.5 2 2.5 3 3.5 4 4.5 5
2-taps 5-taps 10-taps 12-taps
VDD (V) Eop (Normalized)
Temperature, Duration of Leakage
ELEAKAGE
VMEP
EACTIVE
Workload, Activity
VMEP
Operation of the Energy Minimizing Loop Operation of the Energy Minimizing Loop Operation of the Energy Minimizing Loop Operation of the Energy Minimizing Loop
VDD
Loop Start Loop Stop VDD starts at 420mV VDD settles at 370mV
370mV 320mV
VDD
Loop Start Loop Stop VDD starts at 420mV VDD settles at 370mV
370mV 320mV
- Y. Ramadass
- Y. Ramadass
Parallelism Parallelism Parallelism Parallelism
Correlator Bank Demodulation
Correlator Sub-bank 1
Correlator 1 Correlator 2 Correlator L
Correlator Sub-bank 2
Retiming Block
5 Tap FIR Filter 5 Tap FIR Filter 5 Tap FIR Filter 5 Tap FIR Filter
… … …
………
Correlator L+1 Correlator L+2 Correlator 2L
Correlator Sub-bank M
Correlator (M-1)L+1 Correlator (M-1)L+2 Correlator ML
5-bit Input from ADC Serial to Parallel Threshold Detector/ Position Encoder Bit Decoder
… … … … … … … … … Demodulated Bits
Acquisition/ Timing Control
FIR Coefficients
L = 20 M = 31 Total # of correlators = 620
- V. Sze
- V. Sze
Reduce Voltage Slower Operation Parallel banks Recover Performance Low power, with good performance (best of both worlds)
400mV 100Mbps baseband processor
Outline Outline Outline Outline
Introduction Voltage Scaling techniques Challenges with Low voltage operation System Examples Conclusion
A Typical System A Typical System A Typical System A Typical System
DSP DMA Accelerators Power Supplies Data Memory
Instruction Cache
Extreme Voltage Scaling: Sub-threshold Operation Standby Power Reduction
- Fine-grained power down
- Standby voltage scaling
Sensor(s) Radio
Sub-VT Memory Modeling and Theory
th DD
nV V DD g DP eff DD eff Total
e V KC L W V C E
−
+ =
2 2
Ultra-Dynamic Voltage Scaling
Challenges w ith sub Challenges w ith sub Challenges w ith sub Challenges w ith sub-
- threshold logic
threshold logic threshold logic threshold logic
Weak Weak
20 40 60 80 100 120 0.05 0.1 0.15 0.2 0.25 0.3 0.35 0.4 time (ns)
Ratioed FF Non-ratioed FF Weak Weak Strong Strong N1 N2 N3 N1 N2 N3 N1 N2 N3 N3, non- ratioed CK CK CK CK CK D Q D Q Ratioed FF fails to write a 1 at strong N, weak P corner at 400mV
Performance Order of Magnitude Higher Variability in Sub Order of Magnitude Higher Variability in Sub-
- V
VT
T
Global Local
Functionality
Local VT variation → large spread in voltage swing, delay, energy Errors due to degraded noise margins and timing violations Variation-tolerant circuits (e.g. asynchronous logic, soft error correction)
Challenges w ith sub Challenges w ith sub Challenges w ith sub Challenges w ith sub-
- threshold logic
threshold logic threshold logic threshold logic
J.Kw ong J.Kw ong
A 180mV FFT Processor A 180mV FFT Processor A 180mV FFT Processor A 180mV FFT Processor
FFT – Fast Fourier Transform Operates down to 180mV!!! 5X savings in energy at the
minimum energy point
- A. Wang
- A. Wang
SRAM Challenges SRAM Challenges SRAM Challenges SRAM Challenges
WL BL BLB WL
Static Noise Margin (SNM) degraded by variation: Cannot hold data during read!! Feedback too strong: Cannot write new data!! Bitline leakage impacts read value: Cannot read correctly!!
Lowest previous demonstrated SRAM in 65nm is 0.7V
Problem #1 Problem 2 Problem 3
Sub Sub Sub Sub-
- threshold SRAM design
threshold SRAM design threshold SRAM design threshold SRAM design
- N. Verma
- N. Verma
8-transistor SRAM cell Operates down to 350mV!!! 20X leakage power savings
Outline Outline Outline Outline
Introduction Voltage Scaling techniques Challenges with Low voltage operation System Examples Conclusion
Wireless Sensor Netw orks Wireless Sensor Netw orks Wireless Sensor Netw orks Wireless Sensor Netw orks
ADC ADC Scalable rate (0-100KS/s) and precision (12b & 8b) 25mW at 100kS/s
ADC DSP RF
Low -Ra Rate te RF RF On-Off Keying using a rectification based receiver Rx Energy: 1-3 nJ/bit [N. Verma] [D. Daly] Se Sens nsor
- r D
DSP 16-bit DSP with FFT (128-1024 points) 10pJ/instuction [D. Finchelstein
- D. Finchelstein
and N. Ickes and N. Ickes ] ADC ADC Scalable rate (0-100KS/s) and precision (12b & 8b) 25mW at 100kS/s
ADC DSP RF
Low -Ra Rate te RF RF On-Off Keying using a rectification based receiver Rx Energy: 1-3 nJ/bit [N. Verma] [D. Daly] Se Sens nsor
- r D
DSP 16-bit DSP with FFT (128-1024 points) 10pJ/instuction [D. Finchelstein
- D. Finchelstein
and N. Ickes and N. Ickes ]
Wireless Sensor Netw orks Wireless Sensor Netw orks Wireless Sensor Netw orks Wireless Sensor Netw orks
AD ADC Scalable rate (0-100KS/s) and precision (12b & 8b) 25mW at 100kS/s
ADC DSP RF
Low -Rate RF Low -Rate RF On-Off Keying using a rectification based receiver Rx Energy: 1-3 nJ/bit [N. Verma] [D. Daly] Sen Sensor DS
- r DSP
16-bit DSP with FFT (128-1024 points) 10pJ/instuction [D. Finchelstein
- D. Finchelstein
and N. Ickes and N. Ickes ] AD ADC Scalable rate (0-100KS/s) and precision (12b & 8b) 25mW at 100kS/s
ADC DSP RF
Low -Rate RF Low -Rate RF On-Off Keying using a rectification based receiver Rx Energy: 1-3 nJ/bit [N. Verma] [D. Daly] Sen Sensor DS
- r DSP
16-bit DSP with FFT (128-1024 points) 10pJ/instuction [D. Finchelstein
- D. Finchelstein
and N. Ickes and N. Ickes ]
Ultra Ultra Ultra Ultra -
- w ideband (UWB) Radio
w ideband (UWB) Radio w ideband (UWB) Radio w ideband (UWB) Radio
distance
1m 10m 100m 500Mb 50Mb 5Mb 500kb WLAN Wireless USB & Multimedia Locationing/Tagging
Advantages of UWB communications include
High Data Rate Low Interference
Integrate UWB radios on battery operated devices Need an energy efficient UWB System
Narrowband Narrowband UWB UWB
Possible UWB Applications UWB versus Narrowband
freq time
Ultra Ultra Ultra Ultra -
- low
low low low -
- Pow er Low Rate UWB
Pow er Low Rate UWB Pow er Low Rate UWB Pow er Low Rate UWB
S/H S/H S/H
S/H 4:2 MUX RF Front-end Bits Out Bits Out RF RFin
in
Center Freq Gain Control Duty Cycle
Transmitter Receiver
Edge Combiner N Digital Calibrated Channel Selection PPM Del data PRF Clock RF RFout
- ut
Pulse-width Phase Scrambling
Transmitter uses no
static power
Duty cycled at the bit level for
power savings
- D. Wentzloff and F. Lee
- D. Wentzloff and F. Lee
Hybrid CMOS/Carbon Hybrid CMOS/Carbon Hybrid CMOS/Carbon Hybrid CMOS/Carbon Nanotube Nanotube Nanotube Nanotube Systems Systems Systems Systems
Carbon Nanotube Characterization
CNT DC Impedance Characterization Chemical Sensor System CNT Sensors CMOS Interface
Parasitics Parasitics Parasitics Parasitics
CNT RF Impedance Characterization
Carbon Nanotube – CMOS Hybrid System Design
CNT Power Transistor Design
- T. Cho, K. Lee, T. Pan (Prof. J. Kong)
- T. Cho, K. Lee, T. Pan (Prof. J. Kong)
Chip Design Flow Chip Design Flow Chip Design Flow Chip Design Flow
Specifications Design (4-5 months)
Cadence Verilog (Synopsys tools,
Astro…)
Spice
Layout (1-2 months) Long Wait…(3-6 months, Prof.
asks you to start next design)
Chip comes back
Package PCB (test board) Test
Write paper (hopefully the
chip has worked)
Sub Sub Sub Sub-
- Threshold ICs
Threshold ICs Threshold ICs Threshold ICs
Sub-VT Library Test Chip and FIR (65nm CMOS)
256kb 8-T SRAM 65nm with Redundancy 256kb SRAM Array 65nm
32kb Block
DC-DC Converter & Energy Minimizing Loop ( 65nm) Highly Parallel UWB Baseband (90nm)
- Ch. 6
- Ch. 5
- Ch. 4
- Ch. 1
- Ch. 2
- Ch. 3
500MS/s ADC For UWB Using 6-way Interleaving (65nm)
500Ms/s ADC Using 36-parallel Channels (65nm)
Switched Capacitor DC-DC Converter (0.18µm)
[ISLPED06] [ISSCC06] [ISSCC07] [ISSCC07] [ICASSP06 and ISSCC07] [VLSI Symposium 06] [PESC07]
U-DVS [90nm] Adder
[ISSCC05]
Helpful Classes Helpful Classes Helpful Classes Helpful Classes
Circuits – 6.002, 6.301, 6.374, 6.376, 6.775, 6.776, 6.334 Devices – 6.012, 6.728, 6.730, 6.774 Control Theory – 6.302, 6.331 Signal/Image Processing – 6.003, 6.341, 6.344 Communication – 6.450, 6.451
Groups at MIT Groups at MIT Groups at MIT Groups at MIT
Circuit Design
- Prof. Anantha Chandrakasan
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