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Thermal-Effective Clustered Microarchitectures Thermal-Effective Clustered Microarchitectures
P.
- P. Chaparro
Chaparro, J. , J. Gonz Gonzá ález lez and A. and A. Gonz Gonzá ález lez Intel Labs Intel Labs -
- UPC
Thermal-Effective Clustered Thermal-Effective Clustered - - PowerPoint PPT Presentation
Thermal-Effective Clustered Thermal-Effective Clustered Microarchitectures Microarchitectures P. Chaparro Chaparro, J. , J. Gonz Gonz lez lez and A. and A. Gonz Gonz lez lez P. Intel Labs - - UPC UPC Intel Labs 1
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Expensive thermal solution guarantees peak performance performance
Usually temperatures are lower
A localized hotspot may… …
trigger global emergency mechanisms: But it could be avoided by focusing only on that hotspot avoided by focusing only on that hotspot
not be detected: Sensors covering wider areas
Peak temperature 33%
Average temperature 12%
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Activity distribution
Trade off unit location vs. wire delay
Voltage and clock domains
Leakage control
Vdd
dd gating
gating
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32Kuop trace cache
dispatch 8 uops uops/cycle /cycle
80-
entry issue queue
384-
entry MOB
4 int int + 3 + 3 fp fp + 4 ld/ + 4 ld/st st
544+544 physical regs regs
64KB, 2-
way L1 Memory Bus
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Point to Point Link Memory Bus Disambiguation Bus ...
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Bicluster Each cluster has half the resources of the
backend
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Quadcluster Each cluster has a quarter of the resources
monolithic backend
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Performance model Performance Performance model model Dynamic power model Dynamic Dynamic power power model model Temperature model Temperature Temperature model model Leakage model Leakage Leakage model model
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Die Die Die Heat spreader Heat Heat spreader spreader Heat sink Heat sink Heat sink Ambient Ambient Ambient R-C pairs R R-
C pairs T2 T2 T1 T1 R1-2 R1-2 C1-2 C1-2 P2 P2
Time constant Time constant τ τ = R = R · · C C ( (s s) ) Capacity Capacity ( (J / K J / K) ) Capacity Capacity ( (J / V = F J / V = F) ) Resistance Resistance ( (K / W K / W) ) Resistance Resistance ( (V / A = V / A = Ω Ω) ) Power Power ( (W W) ) Current Current ( (A A) ) Temperature Temperature ( (K K) ) Voltage Voltage ( (V V) ) Thermal Thermal Electrical Electrical
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Maximum sensed temperature
Average temperature of the chip area over time
Average temperature over time of the maximum sensed temperature sensed temperature
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0% 10% 20% 30% 40% AbsMax Average AverageMax IPC degradation AbsMax Average AverageMax IPC degradation 2 Clusters 4 Clusters Reduction Backends UL2 Frontend Processor
Average temperature reduction for 16 SPEC
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dd gate a subset of clusters
Before gating cluster must be emptied
Proactive: Per interval basis
Reactive: On thermal events
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HOP-3 HOP-2
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0% 5% 10% 15% 20% 25% 30% 35% 40% 45% 50% AbsMax Average AverageMax IPC degradation AbsMax Average AverageMax Slowdown Hop-3 Hop-2 Recuction Backends UL2 Frontend Processor
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Reduces processor peak temperature 33%
Reduces 12% average temperature
IPC penalty of 14%
Ignored other benefits of clustering for this study
Peak temperature is reduced 37%
Average temperature of the processor 14%
Extra penalty of 3%