POSITRON SOURCE FOR ANNIHILATION SPECTROSCOPY
R.M. Djilkiabev, INR, Moscow
Friday, September 21, 2012
POSITRON SOURCE FOR ANNIHILATION SPECTROSCOPY R.M. Djilkiabev, - - PowerPoint PPT Presentation
POSITRON SOURCE FOR ANNIHILATION SPECTROSCOPY R.M. Djilkiabev, INR, Moscow Friday, September 21, 2012 SLOW POSITRON SOURCE FOR FUNDAMENTAL AND APPLIED PHYSICS Positronium (e + e - ) is a simplest atom and ideal system to probe a new
Friday, September 21, 2012
Friday, September 21, 2012
1S0 para-positronium (p-Ps)
3S1 ortho-positronium (o-Ps)
Friday, September 21, 2012
R.Foot, Phys.Rev.D78,043529,2008
Friday, September 21, 2012
P.Crivelli et al. “A new exp. to search for mirror dark matter”, arXiv:1005.4802.v4[hep-ex] PhysRevD.75.032004,2007 Signal
Friday, September 21, 2012
OM - optical microscope, TEM - transmission electron microscope, nS - neutron scattering, XRS - x-ray scattering with synchrotron radiation, STM - scanning tunneling microscope, AFM - atomic force microscope Web site www.positronsystems.com
Friday, September 21, 2012
V.I. Grafutin, E.P. Prokopiev, UFN 172, 1
Friday, September 21, 2012
А.С. Белов, А.И. Берлев, С.Н. Гниненко и др. ” Технологический комплекс позитронной аннигиляционной спектроскопии для исследования наноструктурных материалов и неразрушающего контроля, диагностики и анализа присутствующих в них примесях”, Москва, 2011
Friday, September 21, 2012
52Co (72d), 64Cu (13h) 18F (92h)
Friday, September 21, 2012
Friday, September 21, 2012
Friday, September 21, 2012
B.E. O’Rourke et al., ‘AIST simulation of slow positron production ...’, arXiv: 1102.1220v2, 10 May 2011, Advanced Industrial Science and Technology (AIST),Japan
Friday, September 21, 2012
Friday, September 21, 2012
Friday, September 21, 2012
Moderator Target
Friday, September 21, 2012
0.6 T 0.6 T
Friday, September 21, 2012
Target Moderator
Friday, September 21, 2012