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Metrology for Phase-referenced Imaging and Narrow-Angle Astrometry with the VLTI
Samuel Lévêque
European Southern Observatory sleveque@eso.org
SPIE 4006-45
Metrology for Phase-referenced Imaging and Narrow-Angle Astrometry - - PowerPoint PPT Presentation
Metrology for Phase-referenced Imaging and Narrow-Angle Astrometry with the VLTI Samuel Lvque European Southern Observatory sleveque@eso.org SPIE 4006-45 1 Introduction The Phase-Referenced Imaging and Micro-arcsecond Astrometry
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SPIE 4006-45
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The “Phase-Referenced Imaging and Micro-arcsecond Astrometry” (PRIMA) facility [1] of the VLTI is based on the simultaneous coherent observation of two celestial objects in which the two interferometric signals are tied together by an internal metrology system. The role of this metrology system is to monitor the PRIMA instrumental optical path errors to possibly reach a final instrumental phase accuracy limited by atmospheric piston anisoplanatism[2].
∆OPD =B.(S2 - S1)=+ ∆L OPD1 =B. S1=+ L1 OPD2 =B. S2=+ L2
Accuracy Goal: 5 nm (driven by Astrometry at 10
µarsec accuracy, B=100m)
Range: 60 mm
contamination on existing detectors
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Laser Heterodyne Assembly Control Electronics Light Source Beam Relay Beam injection Beam Launcher Optics Mechanics Metrology end points Beam extraction Relay Opto-mechanics Beam Combiner(s) Detection Signal conditioning Signal Processing Control HW/SW Phase meter Metrology System
4 Allocation of heterodyne frequencies
ν ν ν ν ∆ν ∆ν ∆ν ∆ν= = = = 2 MHz f1
1 1 1=
= = = 650 kHz f2
2 2 2=
= = = 450 kHz ν+ ν+ ν+ ν+f1
1 1 1
ν+ ν+ ν+ ν+∆ν ∆ν ∆ν ∆ν+f2
2 2 2
ν+ ν+ ν+ ν+∆ν ∆ν ∆ν ∆ν f1
1 1 1=
= = = 650 kHz f2
2 2 2=
= = = 450 kHz Cross-talk noise δ δ δ δf2=±25 kHz δ δ δ δf1=±35 kHz 200 kHz ∆ν ∆ν ∆ν ∆ν=2 MHz Intensity noise
5 Phase Meter
Up/down counter
Counter
PLL xN
Adder i f
Integer Nb. Read signal Probe:
Probe 1 L1(φ1) ref 1 ref.2 Integer fringe counter δφ Probe 2 L2 (φ2) f1
δf1
f2
δf2
f1-f2
δf Ref:
cos [2.π π π π(f1-f2).t+φ φ φ φ1-φ φ φ φ2] cos 2.π π π π(f1-f2).t
f1
δf1
f2
δf2
f1-f2
δf Fractional Nb.
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Mode: Gaussian TEM00 Polarization: Linear (W-direction) Wavelength: 1 µm Power: 1mW Waist size: 4.1 mm (image of central obscuration for the UT’s)
intensity [W m–2] –0.1 –0.05 0.05 0.1 0.01 0.02 0.03 v [m] BEAM CLIPPED AT RETROREFLECTOR Retroreflector Ø = 120 mm w –u POLARIZATION MODE AT EXIT PUPIL Injected beam linearly polarized in w-direction
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Error sources on ∆ ∆ ∆ ∆L Layout errors Instrumental errors
routing (OPL
and misalignments) Retro-reflector Beam injection/combination VLTI optical train Active mirror Air turbulence Mechanical stability Thermal effects
Deformable mirror Internal air turbulence
Frequency stability Power stability
Detection noise Signal conditioning noise Demodulation noise
errors Chromatic errors on coatings Air dispersion
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Received Optical power in microWatts OPD error in nm
V=1 V=0.5 V=0.1 V=fringe visibility
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The PRIMA metrology system must clearly meet an ambitious accuracy goal. A baseline for this metrology system has been identified, including a phase demodulation architecture. The next steps will include the consolidation of the metrology error budget. The development of a prototype of the phase meter is planned in the course of this year and measurements will be performed at Paranal to characterize in more detail the effect of internal turbulence in the context of PRIMA. The author would like to thank U.Johann, E.Manske, R,Sesselmann from Dornier Satellitensystem GmbH for fruitful discussion about the metrology system during the PRIMA feasibility Study, as well as Y.Salvadé, A.Courteville, and R.Dändliker from the Institute of Micro-Technology in Neuchâtel, who conducted the PRIMA metrology rider study. The contribution of R.Wilhelm, who simulated the gaussian beam propagation, is gratefully acknowledged.
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proceedings.
ISBN 90-6464-016-6.
proceedings.
Science with the VLTI, ESO Astrophysics symposia, editors J.R.Walsh and I.J.Danziger, ISBN 3-540-59169-9, 1995
DSS-15700-0001, July 1999.
Neuchâtel, ESO technical report VLT-TRE-IMT-15700-0001, January 2000.
these proceedings.
to the VLTI", these proceedings