Learning when to stop
Ileana Buhan @ileanabuhan
Learning when to stop Ileana Buhan @ileanabuhan Our story.. 2020 - - PowerPoint PPT Presentation
Learning when to stop Ileana Buhan @ileanabuhan Our story.. 2020 2017 2005 1997 1941 2 Its 1941 3 Its 1997 4 Its 2005 5 SCA (non-profiled) AES(k) closed sample 6 SCA (non-profiled) AES(k) AES
Ileana Buhan @ileanabuhan
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AES(k) closed sample
𝑛
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AES(k) AES
Leakage model Distinguisher
𝑛 𝑛 𝑙
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AES(k)
AES
𝑙!
AES AES
𝑛! 𝑛" 𝑛#
AES
𝑙"
AES AES
𝑛! 𝑛" 𝑛#
AES
𝑙$
AES AES
𝑛! 𝑛" 𝑛#
AES
𝑙%
AES AES
𝑛! 𝑛" 𝑛#
𝑒(𝑙!) 𝑒(𝑙") 𝑒(𝑙#) 𝑒(𝑙$)
𝑛!, 𝑛", 𝑛$. . 𝑛# 𝑙& ≈ 𝑙
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AES
𝑛 𝑙
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AES
𝑛
AES(k)
𝑙
closed sample
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learning ATTACK
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TRACES BUILD the MACHINE USE the MACHINE
Acquisition Learning/Profiling Attack
TRAIN
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TRACES BUILD the MACHINE USE the MACHINE
Acquisition Learning/Profiling Attack
TRAIN CONSTRUCT TRAIN
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TRACES BUILD the MACHINE USE the MACHINE
Acquisition Learning/Profiling Attack
TRAIN CONSTRUCT TRAIN
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Perin G., Buhan I.R., Picek S., Learning when to stop:a mutual information approach to fight overfitting in profiled side-channel analysis a mutual information approach to fight overfitting in profiled side-channel analysis (Submitted to CHES 2020);
Perin G., Buhan I.R., Picek S., Learning when to stop:a mutual information approach to fight overfitting in profiled side-channel analysis a mutual information approach to fight overfitting in profiled side-channel analysis (Submitted to CHES 2020);
data labels Input Layer Hidden Layers Output Layer
lets give a name to this layer Input Layer Hidden Layers Output Layer
!
Perin G., Buhan I.R., Picek S., Learning when to stop:a mutual information approach to fight overfitting in profiled side-channel analysis a mutual information approach to fight overfitting in profiled side-channel analysis (Submitted to CHES 2020);
Input Layer Hidden Layers Output Layer the information this layer has about the data
!), 𝐽(𝑈 !; 𝑍)
!
Perin G., Buhan I.R., Picek S., Learning when to stop:a mutual information approach to fight overfitting in profiled side-channel analysis a mutual information approach to fight overfitting in profiled side-channel analysis (Submitted to CHES 2020);
Input Layer Hidden Layers Output Layer the information layer T1 has about the labels
!), 𝐽(𝑈 !; 𝑍)
!
Perin G., Buhan I.R., Picek S., Learning when to stop:a mutual information approach to fight overfitting in profiled side-channel analysis a mutual information approach to fight overfitting in profiled side-channel analysis (Submitted to CHES 2020);
Input Layer Hidden Layers Output Layer
!
Perin G., Buhan I.R., Picek S., Learning when to stop:a mutual information approach to fight overfitting in profiled side-channel analysis a mutual information approach to fight overfitting in profiled side-channel analysis (Submitted to CHES 2020);
Input Layer Hidden Layers Output Layer
#), 𝐽(𝑈 #; 𝑍)
!
#
Perin G., Buhan I.R., Picek S., Learning when to stop:a mutual information approach to fight overfitting in profiled side-channel analysis a mutual information approach to fight overfitting in profiled side-channel analysis (Submitted to CHES 2020);
Input Layer Hidden Layers Output Layer
!
#
Perin G., Buhan I.R., Picek S., Learning when to stop:a mutual information approach to fight overfitting in profiled side-channel analysis a mutual information approach to fight overfitting in profiled side-channel analysis (Submitted to CHES 2020);
validation set
Best epoch
Perin G., Buhan I.R., Picek S., Learning when to stop:a mutual information approach to fight overfitting in profiled side-channel analysis a mutual information approach to fight overfitting in profiled side-channel analysis (Submitted to CHES 2020);
GE AND Success Rate on ASCAD database
Perin G., Buhan I.R., Picek S., Learning when to stop:a mutual information approach to fight overfitting in profiled side-channel analysis a mutual information approach to fight overfitting in profiled side-channel analysis (Submitted to CHES 2020);
GE AND Success Rate on CHES AES database
2003 Numerical Methods Full-time teacher 2002 Mathematics and Computer Science Oct 2004 PhD, University of Twente Oct 2008 2008 (Senior) Research Scientist Philips Research 2011 Product Manager Training 2010 consultant Siemens Guest Researcher Radboud University 2019