Internal Memory Patrick Happ Raul Queiroz Feitosa Objective To - - PowerPoint PPT Presentation

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Internal Memory Patrick Happ Raul Queiroz Feitosa Objective To - - PowerPoint PPT Presentation

Internal Memory Patrick Happ Raul Queiroz Feitosa Objective To present a survey of semiconductor main memory technology. 2 Internal Memory Outline Semiconductor Main Memory Flash Memory Random Access Memories RAMs


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SLIDE 1

Internal Memory

Patrick Happ Raul Queiroz Feitosa

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SLIDE 2 Internal Memory 2

Objective

To present a survey of semiconductor main memory technology.

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SLIDE 3 Internal Memory 3

Outline

 Semiconductor Main Memory  Flash Memory  Random Access Memories – RAMs  Advanced DRAM Organization  Error Detection/Correction

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SLIDE 4 Internal Memory 4 17/09/2020

Semiconductor Memory Types

Memory Type Category Erasure Write Mechanism Volatility Random-access memory (RAM) Read-write memory Electrically, byte- level Electrically Volatile Read-only memory (ROM) Read-only memory Not possible Masks Nonvolatile Programmable ROM (PROM) Electrically Erasable PROM (EPROM) Read-mostly memory UV light, chip- level (EEPROM) Electrically, byte- level Flash memory Electrically, block- level
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Semiconductor Memory Types

RAM ROM PROM EPROM EEPROM E2PROM FLASH

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Memory Cell Operation

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Read Only Memory (ROM)

 Permanent storage

Nonvolatile

 Microprogramming (see later)  Library subroutines  Systems programs (BIOS)  Function tables

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Types of ROM

Written during manufacture

 Very expensive for small runs

Programmable (once)

 PROM  Needs special equipment to program

Read “mostly”

 Erasable Programmable (EPROM)

 Erased by UV

 Electrically Erasable (EEPROM)

 Takes much longer to write than read

 Flash memory

 Erase whole memory electrically
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SLIDE 9 Internal Memory 9

Outline

 Semiconductor Main Memory  Flash Memory  Random Access Memories – RAMs  Advanced DRAM Organization  Error Detection/Correction

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SLIDE 10

How a flash memory works

A flash cell is a npn MOSFET with two gates: control and floating, separated by an isolating oxide layer.

Internal Memory 10 17/09/2020 Source: https://www.explainthatstuff.com/flashmemory.html
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SLIDE 11

How a flash memory works

To switch it “on”, a positive voltage is applied to the bit line and the word line. Electrons flow from the source to the drain. Some also bypass the oxide layer by a process called tunneling and get stuck in the floating gate.

Internal Memory 11 17/09/2020 Source: https://www.explainthatstuff.com/flashmemory.html
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SLIDE 12

To switch it back “off”, a negative voltage on the wordline, repels the electrons back the way they came, clearing the floating gate and making the transistorstore a zero again. An in-circuit wiring is used to apply the electric field either to the entire chip or to predetermined sections known as blocs.

How a flash memory works

Internal Memory 12 17/09/2020 Source: https://www.explainthatstuff.com/flashmemory.html
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SLIDE 13 Internal Memory 13

Outline

 Semiconductor Main Memory  Flash Memory  Random Access Memories – RAMs  Advanced DRAM Organization  Error Detection/Correction

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Misnamed as all semiconductor memory is random

access

Read/Write Volatile Temporary storage Static or dynamic

Random Access Memory RAM

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Static RAM

 Bits stored as on/off switches  No charges to leak  No refreshing needed when powered  More complex construction  Larger per bit  More expensive  Faster  Used to implement cache memory (seen in a later chapter)  Digital→ Uses flip-flops

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SLIDE 16 Internal Memory 16 17/09/2020

Static RAM Structure

high low

  • ff
  • ff
  • n
  • n

state 1 state 1 low high

  • n
  • n
  • ff
  • ff

state 0 Read value is on line B Write applies value to B and compliment to B

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SLIDE 17 Internal Memory 17 17/09/2020

Dynamic RAM

 Bits stored as charge in capacitors  Charges leak  Need refreshing even when powered  Simpler construction  Smaller per bit  Less expensive  Need refresh circuits  Slower  Used to implement main memory  Essentially analogue → Level of charge determines value

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Dynamic RAM Structure

0/1

  • n

charge transfered to capacitor Write 0/1

  • n

charge fed through line to sensor Read

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SLIDE 19 Internal Memory 19 17/09/2020

Refreshing

Refresh circuit included on chip Disable chip Count through rows Read & Write back Takes time Slows down apparent performance

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SRAM vs. DRAM

Both volatile

 Power needed to preserve data

Dynamic cell

 Simpler to build, smaller  More dense  Less expensive  Needs refresh  Larger memory units

Static

 Faster  Cache

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Typical 16 Mb DRAM (4M x 4)

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Simplified DRAM Read Timing

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Packaging

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SLIDE 24

Module Organization

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Example 1: a 256K 8 bit word organization

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SLIDE 25

Module Organization

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Example 1: a 1M 8 bit word organization

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Outline

 Semiconductor Main Memory  Flash Memory  Random Access Memories – RAMs  Advanced DRAM Organization  Error Detection/Correction

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Advanced DRAM Organization

 Basic DRAM same since 70’s.  Enhanced DRAM

Contains small SRAM as well SRAM holds last line read (c.f. Cache!)

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Synchronous DRAM (SDRAM)

 Access is synchronized with an external clock  Address is presented to RAM  RAM finds data (CPU waits in conventional DRAM)  Since SDRAM moves data in time with system clock, CPU

knows when data will be ready

 CPU does not have to wait, it can do something else  Burst mode allows SDRAM to set up stream of data and fire

it out in block

 DDR-SDRAM sends data twice per clock cycle (leading &

trailing edge)

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SLIDE 29 Internal Memory 29 17/09/2020

SDRAM Read Timing

valid data valid data valid data valid data
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DDR SDRAM

 SDRAM can only send data once per clock  Double-data-rate SDRAM can send data

twice per clock cycle

Rising edge and falling edge

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SLIDE 31 Internal Memory 31 17/09/2020

DDR SDRAM - Read Timing

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DDR Generations

By increasing the operational frequency and the prefetch buffer from 2 to 4 and to 8 bits higher data rates were achieved

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DDR SDRAM Standard Bus clock (MHz) Internal rate (MHz) Prefetch (min burst) Transfer Rate (MT/s) First release

DDR 100–200 100–200 2n 200–400 2000 DDR2 200–533 100–266 4n 400–1066 2004 DDR3 400–1066 100–266 8n 800–2133 2007 DDR4 1066–2133 133–266 8n 2133–4266 2011 DDR5 Specifications released in July 2020 ?
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SLIDE 33 Internal Memory 33

Outline

 Semiconductor Main Memory  Flash Memory  Random Access Memories – RAMs  Advanced DRAM Organization  Error Detection/Correction

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Error Correction

 Hard Failure

Permanent defect

 Soft Error

Random, non-destructive No permanent damage to memory

 Detected using Hamming error correcting

code

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Error Correcting Code Function

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Text Book References

Stallings 11th edition, chapter 6

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Internal Memory

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