Highlights From ILC R&D at SCIPP LCWS 2010 Friendship Hotel, - - PowerPoint PPT Presentation

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Highlights From ILC R&D at SCIPP LCWS 2010 Friendship Hotel, - - PowerPoint PPT Presentation

Mar 13, 2023 30 likes •304 views

Highlights From ILC R&D at SCIPP LCWS 2010 Friendship Hotel, Beijing, PRC March 26-30 2010 Bruce Schumm Santa Cruz Institute for Particle Physics The SCIPP/UCSC SiLC/SiD GROUP (R&D Participants)

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Highlights From ILC R&D at SCIPP

LCWS 2010 Friendship Hotel, Beijing, PRC March 26-30 2010 Bruce Schumm Santa Cruz Institute for Particle Physics

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The SCIPP/UCSC SiLC/SiD GROUP (R&D Participants)

Lead Engineer: Ned Spencer Technical Staff: Max Wilder, Forest Martinez-McKinney All participants are mostly working on other things (BaBar, ATLAS, biophysics…)

Students: undergrad physics and/or engineering majors at UCSC

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Current Areas of Inquiry

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Current Areas of Inquiry Cont’d

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15.0 14.0 13.0 12.0 11.0 10.0 9.0 8.0 7.0 6.0 5.0 4.0 3.0 2.0 S/N 9 8 7 6 5 4 3 2 1 Charge Injection Node 'Single Channel Model' 'Five Channel Model: Center Channel' ~13% Difference At Center Node

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Standard Form for Readout Noise (Spieler)

Series Resistance Amplifier Noise (series) Amplifier Noise (parallel) Parallel Resistance

Fi and Fv are signal shape parameters that can be determined from average scope traces.

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CDF L00 Sensor “Snake”

CDF L00 strips: 310 Ohms per 7.75cm strip (~3x GLAST) Long-ladder readout noise dominated by series noise (?) Construct ladder by bonding strips together in “snake” pattern (Sean Crosby) At long shaping-time, bias resistors introduce dominant parallel noise contribution Sever and replace with custom biasing structure (significant challenge…) Thanks to Sean Crosby and Kelsey Collier, UCSC undergraduate thesis students

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Expected Noise for Custom-Biased L00 Ladder

Spieler formula suggests that series noise should dominate for ladders of greater than 5 or so sensors.

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CDF L00 Sensor “Snake” CDF L00 “Snake” LSTFE1 chip on Readout Board

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Naïve expectation Expectation with measured shape factors Fi, Fv Measured (end readout) Measured (center-tap)

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CURVATURE RECONSTRUCTION PERFORMANCE ?1 *"! **,

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CURVATURE ERROR vs. CURVATURE

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SiD02 Detector Model

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Results for Stiff, Central Tracks σ.3 µ3π *%?;; "CEθEF;1B* µ µ µ µ π π π π $

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