- M. BARBERO, P. BARRILLON, I. BERDALOVIC, C. BESPIN, S. BHAT, P. BREUGNON, I. CAICEDO,
- R. CARDELLA, Z. CHEN, Y. DEGERLI, L. FLORES, J. DINGFELDER, S. GODIOT, F. GUILLOUX, T. HIRONO,
- T. HEMPEREK, F. HÜGGING, H. KRÜGER, T. KUGATHASAN, C. MARIN TOBON, K. MOUSTAKAS,
- P. PANGAUD, H. PERNEGGER, F. PIRO, P. RIEDLER, A. ROZANOV, P. RYMASZEWSKI, P. SCHWEMLING,
- W. SNOEYS, M. VANDENBROUCKE, T. WANG, N. WERMES, S. ZHANG
DEPLETED MONOLITHIC ACTIVE PIXEL SENSORS IN 180 NM TOWERJAZZ AND - - PowerPoint PPT Presentation
DEPLETED MONOLITHIC ACTIVE PIXEL SENSORS IN 180 NM TOWERJAZZ AND - - PowerPoint PPT Presentation
DEPLETED MONOLITHIC ACTIVE PIXEL SENSORS IN 180 NM TOWERJAZZ AND 150 NM LFOUNDRY TECHNOLOGY M. BARBERO, P. BARRILLON, I. BERDALOVIC, C. BESPIN , S. BHAT, P. BREUGNON, I. CAICEDO, R. CARDELLA, Z. CHEN, Y. DEGERLI, L. FLORES, J. DINGFELDER, S.
STANDARD MONOLITHIC PIXEL SENSORS
− Combine sensor and readout on same wafer using commercial CMOS technologies − Charge collection mainly by diffusion in epi-layer (typically low-resistivity)
− Too slow and not-radiation hard for high radiation and high rate experiments like ATLAS ITk
− Need depleted sensor volume for fast charge collection and large signal à DMAPS
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Kolanoski , Wermes 2015
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DEPLETED MONOLITHIC PIXELS
− Depletion depth 𝑒 ∝ 𝜍 𝑊
%&'(
− High resistive substrate material (𝜍 = 100 Ωcm − kΩcm) − High voltage add-ons (50 − 200 Vbias ) − Multiple nested wells for full CMOS − Backside processing (thinning) − Fully depleted high-resistive bulk or epitaxial layer as charge sensitive volume
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CMOS TECHNOLOGY
− Commercial processes with high resistive wafers available
− Large production capabilities − Low cost per wafer − Fast turn around time
− Monolithic designs achievable − Low module cost − Thin modules − Small pixel sizes (50 x 50 µm2 or smaller) − Crucial question: radiation hardness and fast charge collection possible?
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and many more… For example:
16.12.2019
DEPLETED MONOLITHIC ACTIVE PIXELS
Large collection electrode
− Electronics inside charge collection well − Uniform field across pixel volume − Short(er) drift distances
à radiation hard
− Large(r) sensor capacitance
à higher noise at given power
Small collection electrode
− Charge collection well separated from electronics − Longer drift distances & low field regions
à radiation hard?
− Small sensor capacitance
à low noise and power (at given SNR)
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DEVELOPMENT LINES
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5mm 5mm 10mm 9.5mm
CCPD_LF
- Subm. Sep. 2014
- Fast R/O coupled to FE-I4
LF-CPIX (DEMO)
- Subm. Mar. 2016
- Fast R/O coupled to FE-I4
LF-Monopix1
- Subm. Aug. 2016
- Fast column drain R/O
ALICE ALPIDE
5.7 mm 5mm
INVESTIGATOR
- Subm. 2016
- 8 x 8 pixel
submatrices
miniMALTA
- Subm. 2018
- measures for
- rad. hardness
10mm 9.5m m
50 x 250 µm2 50 x 250 µm2 Monolithic
MALTA
TJ-Monopix
36.5 x 36.5 µm2
36 x 40 µm2
MALTA (asynchronous) & TJ-Monopix (column drain)
- Subm. 2018, large matrices
- Fast asynchr & col. drain R/O
20 mm 10 mm 20 mm
TJ-MonoPix2
- Subm. Spring 2020
- Full size 2x2 cm2
- improved sensor
and front end
LF-MonoPix2
- Subm. Spring 2020
- Full height chip
50 x 150 µm2
33 x 33 µm2
LF-MONOPIX AND TJ-MONOPIX
LF-Monopix TJ-Monopix
- Fully monolithic DMAPS prototype chips
- Complete digital logic inside the pixels
- FE-I3 like column-drain readout architecture that can cope with ATLAS ITk outer layer hit rate
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LARGE COLLECTION ELECTRODE DESIGN: LF-MONOPIX LARGE COLLECTION ELECTRODE DESIGN: LF-MONOPIX
LF-MONOPIX: DESIGN
− Large collection electrode design in LFoundry 150 nm CMOS technology − High-resistive substrate (> 2 kΩcm) − 250 x 50 µm2 pixel size (129 rows / 36 columns), nine flavors
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LF-MONOPIX: SIGNAL AND NOISE
− Gain (unirradiated) between 10 and 12 µV / e- − Noise (ENC) 180 – 240 e-, dispersion 30 – 70 e- − Typical signal up to 25 ke- and tuned threshold ca. 1400 e- (dispersion 400 e-) − No loss of gain and up to 150 e- noise increase after irradiation to 1015 neq cm-2
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LF-MONOPIX: EFFICIENCY
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Neutron irradiated 1015 neq cm-2: 98.9 % (130 V)
− 1700 e- threshold (not minimum achievable for unirradiated chip)
Unirradiated: 99.6 % (200 V)
LF-MONOPIX: IN-PIXEL EFFICIENCY
− High and homogeneous efficiency at 200 V bias voltage before irradiation − Small loss of efficiency (1.8 %) between pixels after irradiation due to a reduced signal shared between adjacent pixels
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Unirradiated Neutron irradiated Horizontal Position
LF-MONOPIX: TID IRRADIATION
− Gain variation < 3 % for all tested flavours − Noise increase of 15 % for CMOS flavors, 25 % for NMOS flavors due to leakage and changing of CSA bias condition, nominally ENCNMOS < ENCCMOS − Irradiation without annealing before measurements
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LF-MONOPIX: TID IRRADIATION
− Gain variation < 3 % for all tested flavours − Noise increase of 15 % for CMOS flavors, 25 % for NMOS flavors due to leakage and changing of CSA bias condition, nominally ENCNMOS < ENCCMOS − Irradiation without annealing before measurements
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SMALL COLLECTION ELECTRODE DESIGN: TJ-MONOPIX
nwell Deep pwell pwell pwell nwell NMOS pwell PMOS Spacing Low dose N implant
P- Epitaxial layer
P++ Substrate
Depleted boundry
TJ-MONOPIX: DESIGN
− Small collection electrode design in 180 nm TowerJazz technology − Low power consumption (≈ 120 mW/cm2) − Modified process with additional n-layer for full depletion − 36 µm x 40 µm pixel size arranged as 448 x 224 pixels in four flavors
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ρ ~1 kΩcm
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TJ-MONOPIX: THRESHOLD & NOISE
Unirradiated Sample Irradiated sample (1015 neq cm-2)
Threshold 350 e- 570 e- Threshold dispersion 34 e- 66 e- ENC 17 e- 23 e-
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TJ-MONOPIX: MEAN EFFICIENCY
Unirradiated: 97% Irradiated (1015 neq cm-2): 69%
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− Testbeam measurement in 2.5 GeV electron beam in Bonn (ELSA)
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TJ-MONOPIX: IN-PIXEL EFFICIENCY
− High resolution in-pixel efficiency from MALTA chip − Modification of sensor geometry (gap & additional p-well) show improved charge collection in pixel corners (homogenous)
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More on MALTA in previous talk (# 196) and poster session (# 343)
- M. Dyndal et al., arXiv:1909.11987
0.5 0.55 0.6 0.65 0.7 0.75 0.8 0.85 0.9 0.95 1
miniMalta in pixel efficiency, sector 1
10 20 30 40 50 60 70 track x pos [um] 10 20 30 40 50 60 70 track y pos [um]
miniMalta in pixel efficiency, sector 1
- Irradiated to 1015 neq cm-2
- Homogenous efficiency of 97.9 %
Modifications on sensor and front-end
TJ-MONOPIX: TID IRRADIATION
PMOS RESET FLAVOR
− Irradiation without annealing before measurements − Due to technical limitation HV diode reset flavor only up to 1 MRad
HV DIODE RESET FLAVOR
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FUTURE MONOPIX DESIGNS
THE MONOPIX2 DESIGNS
LF-MONOPIX2
− Chip size increased to 2 × 1 cm2 − Smaller pixels: 50 × 150 μm2 − Larger matrix: 340 × 56 px − Analog FE improvement − Pixel layout improvement
TJ-MONOPIX2
− Full size chip of 2 × 2 cm2 − Pixel size: 33.04 × 33.04 μm2 − Larger matrix: 512 × 512 px − Analog FE improvement and threshold tuning − Downstream data processing,
e.g. data buffering and triggering
− Diode reset for good TID performance − Sensor improvements for better NIEL and TID performance à see talk of H. Pernegger
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Submission for both chips in spring 2020
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CONCLUSION
− Promising results for monolithic active CMOS sensors in both large and small electrode design − Fully functional fast read-out architecture in both chips − Large collection electrode design radiation hard up to 1015 neq cm-2 NIEL and 100 MRad TID damage − Issues for low efficiency after neutron irradiation in small electrode design identified and solved (talk by H. Pernegger and poster from L. Flores) − Modifications on front-end in small electrode design for better TID performance (talk by
- H. Pernegger)
− Full size prototypes in both technologies currently under development
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