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A Sub-pA Current Sensing Front-End for Transient Induced Molecular Spectroscopy Da Ying, Ping-Wei Chen, Chi-Yang Tseng, Yu-Hwa Lo, and Drew A. Hall University of California, San Diego, CA, USA Symposia on VLSI Technology and Circuits New Drug


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Symposia on VLSI Technology and Circuits

A Sub-pA Current Sensing Front-End for Transient Induced Molecular Spectroscopy

Da Ying, Ping-Wei Chen, Chi-Yang Tseng, Yu-Hwa Lo, and Drew A. Hall University of California, San Diego, CA, USA

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Symposia on VLSI Technology and Circuits

New Drug Discovery

  • High-cost (>$2.6B/drug1) and failure rate from mid- to late-stage
  • Many diseases are highly linked to protein-ligand abnormality

Slide 1

Need a solution for accurate in-vitro study of protein-ligand interactions

[1] Pharmaceutical Research and Manufacturers of America

[1]

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Symposia on VLSI Technology and Circuits

Existing Methods for Protein-Ligand Detection

ü Binding kinetics û Immobilization of ligand

Slide 2

[1] J. Homola, Analytical and Bioanalytical Chemistry, 2003; [2] C. Fan, TRENDS in Biotechnology, 2005

[1]

Surface Plasmon Resonance Labeling and immobilization significantly limit degree of freedom for binding

[2]

ü Solution phase û Labelling of ligand

FRET

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Symposia on VLSI Technology and Circuits

Transient Induced Molecular Spectroscopy (TIMES)

ü Label- and immobilization-free in-vitro protein-ligand detection ü Closer to physiological conditions and better signal integrity

Slide 3

Requires a sensitive AFE for charge sensing

  • T. Zhang, Y. Lo, Scientific Reports, 2016

𝐽 = 𝜖𝑅 𝜖𝑢

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Symposia on VLSI Technology and Circuits

µTIMES Specification

  • Active area < 0.2 mm2/ch.
  • Partition across 4 references with 80dB SNDR each
  • WE/RE à pseudo-differential input

Slide 4

Parameter Application Circuit Sensor size 8 channels 300µm×300µm M6 Resolution 0.1 µM sensitivity 100 fA Cross-scale DR 0.1 µM – 10 mM range 100 fA – 1 µA Bandwidth 5 cm/s flow rate 10 Hz

  • T. Zhang, Y. Lo, ACS Central Science, 2016
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Symposia on VLSI Technology and Circuits

Existing Sub-pA Current AFEs

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û Sensitive to aliasing û Input sampling à noise folding û Charge injection to sensor

[H. Li, TBioCAS’16]

û Heavy digital backend û Large area, limited # of channels

[C. Hsu, ISSCC’18] Aim to achieve 100fA sensitivity with small area/power

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Symposia on VLSI Technology and Circuits

µTIMES à 1st-order current-mode ΔΣ + digital IIR (linear predictor)

Proposed µTIMES AFE Architecture

Slide 6

① 1-bit quantizer + digital IIR achieves quasi multi-bit quantization

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Symposia on VLSI Technology and Circuits

Integrator only needs to process half of original pulse amplitude

Proposed µTIMES AFE Architecture

Slide 7

② Tri-level PWM avoids intensive hardware and relaxes filter linearity

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Symposia on VLSI Technology and Circuits

Proposed µTIMES AFE Architecture

Slide 8

③ Multi-bit feedback effectively reduces 𝑔

'

Lower 𝑔

( relaxes speed requirement and improves anti-aliasing

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Symposia on VLSI Technology and Circuits

Issues with Single-bit Quantization

Slide 9

  • Limited SQNR for given OSR
  • Deterministic quantization noise
  • Arbitrary quantizer gain

Limited SQNR à Large OSR à Power hungry & poor anti-aliasing

𝑃𝑇𝑆,-./ 𝑃𝑇𝑆0-./ ∝ 23 45

4670

𝑜 = Quantizer bits 𝑀 = order

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Symposia on VLSI Technology and Circuits

Issues with Single-bit Quantization

Slide 10

  • Limited SQNR for given OSR
  • Deterministic quantization noise
  • Arbitrary quantizer gain

Deterministic quantization noise à tonal à SNRò

What we will find later: More transitions and quantization levels à less tonal effect

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Symposia on VLSI Technology and Circuits

Issues with Single-bit Quantization

Slide 11

  • Limited SQNR for given OSR
  • Deterministic quantization noise
  • Arbitrary quantizer gain

Arbitrary quantizer gain à deviate from linear model

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Symposia on VLSI Technology and Circuits

Motivation: Linear Prediction in ΔΣ

Slide 12 𝑦 n + 1 = 𝑦 n + 𝜖𝑦 𝜖𝑢 > ∆𝑈 = 𝑦 n + 𝑦 n − 𝑦[n − 1]

𝑬𝐩𝐯𝐮 n = 𝐸IJ/ n − 1 + 2×𝑅IJ/ n − 𝑅IJ/[n − 1]

à Multi-bit achieved with only a 4-bit adder, scaler, and two FFs

IIR filter à

LMNO [P] QMNO[P] = 43PRS 03PRS

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Symposia on VLSI Technology and Circuits

Turning 1-bit Into Multi-bit

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First-order observations:

  • Dout closely tracks input signal
  • More transitions à less tonal
  • Quantization step ∈ {∆, 3∆}
  • 𝑔

(.Y,Z[\ and PSD?

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Symposia on VLSI Technology and Circuits

Theoretical PSD and 𝒈(.Y,Z[\

Slide 14

Conservative SQNR analysis: à 𝑓_ ∈ [− `∆

4 , + `∆ 4 ]

à 𝜏_

4 = `∆ ∫ 3c∆

d c∆ d 𝑣4𝑒𝑣 =

g∆d 04

𝑔

(.Y,Z[\ requirement:

à

hi (.,(4klmnop7q) hp

≤ `∆

t

m

à 𝑔

(.Y ≤ `l

m

4k>4uRS 5vw `l

m

0xk

~9.5dB worse SQNR than ideal 4b Q IIR-ΔΣ requires OSR > 8

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Symposia on VLSI Technology and Circuits

STF & NTF

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𝑂𝑈𝐺(𝑨) = (2 − 𝑨30)(1 − 𝑨30) à 𝑇𝑈𝐺 𝑔 =

|4kl (2 − 𝑓3|4kl)(1 − 𝑓3|4kl)

  • 1st-order shaping NTF
  • ~9dB larger out-of-band gain

Unity in-band STF & inherent anti-aliasing

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Symposia on VLSI Technology and Circuits

IIR Quantizer Gain

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  • 𝑙 - smallest 𝜏~

4 between quantizer input 𝑧 and output 𝑤

– 𝑙 = 𝑤, 𝑧 / 𝑧, 𝑧

[1]

  • Peak SNDR @ 0.8FS input level à define non-overloading range [0, 0.8FS]

𝑂𝑈𝐺‚ 𝑨 = 2 − 𝑨30 1 − 𝑨30 1 + 𝑙 > 𝑀 𝑨 𝑂𝑈𝐺‚(𝑨): NTF (𝑙 ≠ 1) 𝑀 𝑨 : loop gain (𝑙 = 1)

𝑙 shows IIR quantizer can be statistically approximated as a multi-bit quantizer

[1] S. Pavan, R. Schreier, G. Temes, ‘Understanding delta-sigma data converters’, John Wiley & Sons, 2017

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Symposia on VLSI Technology and Circuits

Tri-Level PWM DAC

Slide 17

  • PWM DAC

– Entirely digital coded à less hardware – CT loop filter à pulse shape independent

  • Current-steering DAC

– nA ~ µA reference from current-splitting – No loading à larger loop gain, linearity ñ

  • Two-level PWM à Tri-level PWM

– Lose inherent linearity – Even-order distortion eliminated [1] – RZ DAC à ISI immunity – Half pulse à noise, jitter, OTA linearity ñ

[1] F. Colodro, A. Torralba, TCAS-I, 2009

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Symposia on VLSI Technology and Circuits

Tri-Level PWM DAC

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  • Current-steering DAC with shunt path

– Bypass most noise for small input – Low-pass filtered bias noise – Linearity maintained by careful sizing

  • Lower jitter sensitivity

– 𝑇𝑂𝑆„.//…† ∝

‡ˆ‰Š

d

‡‹

d

– Half pulse amplitude à 𝜏Œ•Ž

4

ò 4x

Current steering

𝑇.,Ž• 𝑔 = 4𝑙𝑈𝛿 2𝐽Œ•Ž 𝑊

ŒŒ/2

Resistive

𝑇.,“ 𝑔 = 4𝑙𝑈 𝐽Œ•Ž 𝑊

ŒŒ/2

PWM ADC à Light weight, multi-bit

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Symposia on VLSI Technology and Circuits

Current-Splitting DAC

Slide 19

  • C. Enz, E. Vittoz, ISCAS, 1996
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Symposia on VLSI Technology and Circuits

Continuous-Time CMFB

Slide 20

  • L. Luh, J. Draper, TCAS-II, 2000
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Symposia on VLSI Technology and Circuits

Chip Micrograph

Slide 21 DAC 16% Integrator 55% Bias 22%

Total power: 50.3µW/ch * Comparator and digital logic consumes negligible power 28µW 11µW 8µW

3 . 5 µ W CMFB 7%

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Symposia on VLSI Technology and Circuits

Measurement Results

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Input-referred current noise PSD Peak SNDR Capacitive loading à noise ñ 123fA sensitivity at 1nA reference

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Symposia on VLSI Technology and Circuits

Measurement Results

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SNDR vs. input amplitude 78.2dB fixed-scale dynamic range

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Symposia on VLSI Technology and Circuits

Measurement Results

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DC input sweep 139dB cross-scale dynamic range

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Symposia on VLSI Technology and Circuits

TIMES In-vitro Measurement Setup

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To inlets FPGA power FPGA USB Power supply µTIMES & microfluidic PDMS cross-section ENIG sensors 3 mm

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Symposia on VLSI Technology and Circuits

In-vitro Protein-Ligand Measurement

Slide 26

Characteristic shape due to unique dipole moment and charge locality

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Symposia on VLSI Technology and Circuits

Performance Summary

Slide 27

Stanaćević TBCAS’07 Li TBCAS’16 Sim TBCAS’17 Hsu ISSCC’18 Nazari TBCAS’13 This Work AFE Architecture

  • Inc. ΔΣ
  • Inc. ΔΣ

ΔΣ Hourglass ΔΣ CC + SS ADC IIR-ΔΣ Process [µm] 0.5 0.5 0.35 0.18 0.35 0.18 Max Input [µA] 1 16 2.8 10 0.35 1.1 Resolution [fA] @ BW [Hz] 100 @ 0.1 100 @ 1 100,000 @ 10 100 @ 1.8 24,000 @ 100 123 @ 10 Conversion Time @ Min. Input [ms] 8,388 1,000 4 400 10 100 Input-referred Noise [fA/√Hz]

  • 6,960

58.9 1,850 30.3 Fixed-/cross- scale DR [dB] 40* / 140 54.0* / 164 77.5 160 60.7 / 95 78.2 / 139 On-chip Sensors? NO NO NO NO YES YES

  • Num. of Channels

16 50 1 1 192 8 Area/ch. [mm2] 0.25* 0.157 0.5 0.2† 0.04 0.11 Power/ch. [µW] 3.4‡ 241 16.8 295 188 50.3

* estimated from figures; † not including synthesized digital area and DEM; ‡ off-chip bias

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Symposia on VLSI Technology and Circuits

Performance Summary

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Stanaćević TBCAS’07 Li TBCAS’16 Sim TBCAS’17 Hsu ISSCC’18 Nazari TBCAS’13 This Work AFE Architecture

  • Inc. ΔΣ
  • Inc. ΔΣ

ΔΣ Hourglass ΔΣ CC + SS ADC IIR-ΔΣ Process [µm] 0.5 0.5 0.35 0.18 0.35 0.18 Max Input [µA] 1 16 2.8 10 0.35 1.1 Resolution [fA] @ BW [Hz] 100 @ 0.1 100 @ 1 100,000 @ 10 100 @ 1.8 24,000 @ 100 123 @ 10 Conversion Time @ Min. Input [ms] 8,388 1,000 4 400 10 100 Input-referred Noise [fA/√Hz]

  • 6,960

58.9 1,850 30.3 Fixed-/cross- scale DR [dB] 40* / 140 54.0* / 164 77.5 160 60.7 / 95 78.2 / 139 On-chip Sensors? NO NO NO NO YES YES

  • Num. of Channels

16 50 1 1 192 8 Area/ch. [mm2] 0.25* 0.157 0.5 0.2† 0.04 0.11 Power/ch. [µW] 3.4‡ 241 16.8 295 188 50.3

* estimated from figures; † not including synthesized digital area and DEM; ‡ off-chip bias

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Symposia on VLSI Technology and Circuits

Performance Summary

Slide 29

Stanaćević TBCAS’07 Li TBCAS’16 Sim TBCAS’17 Hsu ISSCC’18 Nazari TBCAS’13 This Work AFE Architecture

  • Inc. ΔΣ
  • Inc. ΔΣ

ΔΣ Hourglass ΔΣ CC + SS ADC IIR-ΔΣ Process [µm] 0.5 0.5 0.35 0.18 0.35 0.18 Max Input [µA] 1 16 2.8 10 0.35 1.1 Resolution [fA] @ BW [Hz] 100 @ 0.1 100 @ 1 100,000 @ 10 100 @ 1.8 24,000 @ 100 123 @ 10 Conversion Time @ Min. Input [ms] 8,388 1,000 4 400 10 100 Input-referred Noise [fA/√Hz]

  • 6,960

58.9 1,850 30.3 Fixed-/cross- scale DR [dB] 40* / 140 54.0* / 164 77.5 160 60.7 / 95 78.2 / 139 On-chip Sensors? NO NO NO NO YES YES

  • Num. of Channels

16 50 1 1 192 8 Area/ch. [mm2] 0.25* 0.157 0.5 0.2† 0.04 0.11 Power/ch. [µW] 3.4‡ 241 16.8 295 188 50.3

* estimated from figures; † not including synthesized digital area and DEM; ‡ off-chip bias

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Symposia on VLSI Technology and Circuits

Conclusion

Slide 30

Motivation:

  • A compact, energy-efficient, high-sensitivity AFE for TIMES biosensing

Techniques:

  • Linear prediction in 1st-order CT-ΔΣ achieved by digital IIR filter
  • Relaxed hardware complexity with tri-level PWM DAC

Results:

  • Low-noise (30.3fA/√Hz)
  • High sensitivity (123fA)
  • Large dynamic range (78.2dB/139dB)
  • Small area (0.11mm2) and low power (50.3µW) per channel
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Symposia on VLSI Technology and Circuits

Acknowledgement

Slide 31

  • This work was supported in part by the National Science Foundation

under Grant ECCS-1610516.

Thank you for your attention!