Tracking and Timing with Induced Current Detectors Ronald Lipton - - PowerPoint PPT Presentation

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Tracking and Timing with Induced Current Detectors Ronald Lipton - - PowerPoint PPT Presentation

Tracking and Timing with Induced Current Detectors Ronald Lipton CPAD 2019 Dec. 10 2019 Introduction There has been increasing interest in fast timing as well as intelligent detector systems. I would like to present some ideas for


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Ronald Lipton CPAD 2019

  • Dec. 10 2019

Tracking and Timing with Induced Current Detectors

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Ronald Lipton

Introduction

There has been increasing interest in fast timing as well as “intelligent” detector systems. I would like to present some ideas for alternate designs of such systems looking at how technology for silicon-based detectors might

  • evolve. This is a talk about the future - next generation of collider experiments.

We focus on capability enabled by new technologies that provide small pixels with low capacitance and sophisticated processing

  • 3D integration of sensors and electronics
  • Monolithic active devices
  • Semiconductor substrate engineering

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Some Basics - time resolution

  • The rule of thumb for the time resolution of a system dominated by jitter is:



 
 
 
 


  • slew rate (dV/dt) is related to the inverse amplifier rise time, CL is the load

capacitance td and ta are the detector and amplifier rise times and gm is the input transistor transductance - related to input current, and A is a characteristic of the amplifier.

  • Fast timing -> large S/N, fast amp, small load capacitance
  • There are tradeoffs available

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σ t ~ σ noise ∂V ∂t ⎛ ⎝ ⎜ ⎞ ⎠ ⎟ ~ tr Noise Signal ⎛ ⎝ ⎜ ⎞ ⎠ ⎟

σ n

2 = CL 2 4ktA

( )

gmta

Front end noise

σ t ~ CL gmta ta

2 + td 2

Signal

Jitter Time resolution

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More Basics - Signal Development

  • Signal induced by moving charges

depends on work done by circuit. The charge induced on an electrode depends

  • n the coupling between the moving

charge and the electrode (Ramo’s theorem)

  • We usually work with simple parallel plate

systems

  • In a multi-electrode system the induced

current on an electrode depends on the velocity of the charge and the value of the effective “weighting” field

  • Weighting field is calculated with 1 V on

measuring elected, 0 V on others

  • There are fast transient induced currents
  • n neighbor electrodes that integrate to

zero - can we use them?

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i = −q ! Ew × ! v Qs = idt = q ! Ew

∫ ∫

d! x Q

1→2 = q(Vw2 −Vw1)

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3D Integration and small pixels

Fermilab has been involved the development of 3D sensor/ASIC integration for almost a decade and have demonstrated (with industrial partners):

  • Hybrid bonding technology
  • Oxide bonding with imbedded metal

through silicon vias (TSV)

  • Bond pitch of 4 microns
  • First 3-tier electronics-sensor stack
  • Small pixels with ADC, TDC (24 microns)
  • Small TSV capacitance (~7 ff)
  • The noise in hybrid bonded VIPIC 3D

assembly is almost a factor of two lower than the equivalent conventionally bump 
 bonded parts due to lower Cload

5

0" 50" 100" 150" 200" 250" 300" 350" 400" 450" 500" 25" 30" 35" 40" 45" 50" 55" 60" 65" Counts' noise'(electrons)'

Unbonded" Bump"bonded" Fusion"Bonded"

.5 mm sensor (BNL) 34 micron high 2-tier VICTR chip

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Methodology

We explore simple systems with various pixel sizes, detector thickness and pulse shapes

  • Build a (Silvaco) TCAD (2D or 3D) detector

model

  • Inject a Qtot=4 fc pulse
  • Extract the capacitance and pulse shapes at

the electrodes

  • Inject the resulting pulse into a SPICE model
  • f a generic 65nm charge sensitive amplifier

including noise

  • Analyze the characteristics of the 


resulting output pulses

  • For angled track studies I use simple op amp

with defined bandwidth model with adjustable bandwidth

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3D 9 pixel model

Pulses from “x-ray” at~100μ 200μ thick detector

y = 2E-18x2 + 1E-16x + 1E-15 5E-15 1E-14 1.5E-14 2E-14 2.5E-14 3E-14 20 40 60 80 100 120

200 Micron Thick Detector Farads/micron

TCAD Simulation

Pixel Pitch (microns) Capacitance (farads)

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Simple Example - X-Rays

Suppose an application requires fast timing on high energy x-rays

  • Usually we would like thin detectors for fast timing,

but thin detectors imply low efficiency - can we use induced currents to achieve time resolution in a thick detector?

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Initial Current Spike Central pixel Corner neighbor 0 collected charge Edge neighbor (diffusion collected charge)

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Pulse Shapes - 200 micron detector Χ-ray 2D Simulation

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2ns 2ns 2ns 2ns z=10 z=190 z=100 Central Electrode z=10 z=100 z=190

Central = n n+1 n+2 n+3

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h Entries 25 Mean 104.5 Std Dev 0.0204 / ndf

2

χ 0.4421 / 2 Constant 2.457 ± 9.179 Mean 0.0 ± 104.5 Sigma 0.00445 ± 0.02177

104 104.2 104.4 104.6 104.8 105 2 4 6 8 10

h Entries 25 Mean 104.5 Std Dev 0.0204 / ndf

2

χ 0.4421 / 2 Constant 2.457 ± 9.179 Mean 0.0 ± 104.5 Sigma 0.00445 ± 0.02177

Timing histogram

E1

X-Ray With Noise at 185/200 micron depth

  • Apply a constant threshold of E1~10 mV, E4~130 mV
  • Tabulate time at threshold crossing including noise
  • Edge pixel can provide a “start” time stamp if needed

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Edge pixel Edge pixel σ~ 30ps Central pixel Central pixel σ~ 22ps

730 mV 850 mV 720 mV

10 ns

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Example - MIP in a 50 micron Detector

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h Entries 26 Mean 102.3 Std Dev 0.01593 / ndf

2

c 0.6285 / 1 Constant 3.24 ± 12.34 Mean 0.0 ± 102.3 Sigma 0.00311 ± 0.01657

102 102.1 102.2 102.3 102.4 102.5 102.6 102.7 2 4 6 8 10 12

h Entries 26 Mean 102.3 Std Dev 0.01593 / ndf

2

c 0.6285 / 1 Constant 3.24 ± 12.34 Mean 0.0 ± 102.3 Sigma 0.00311 ± 0.01657

Timing histogram

σ~16ps σ~25 micron pitch, 50 microns thick 200 V, sensor potential distribution Pulse on central pixel

2ns

Amplifier output with noise, 20ff load Threshold

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Comments

The 20-30 ps resolution will be degraded in a real system However:

  • All pixels with spacing small compared to depth will have similar signals ~ 16

pixels for a 25x200 micron sensor x 4 in (uncorrelated) time resolution

  • The central pixel will see a large signal within a few ns of the leading edge -

initial thresholds can be set low and signals latched only if a central pixel fires at a higher threshold

  • The pattern of pixels will provide depth and slope information
  • Multiple thresholds or more sophisticated processing can give a time walk

correction

  • These results are for n-on-p with maximum field at the top. n-on-n sensors

have a maximum field at the bottom. The field profiles can be adjusted to suit the application by varying the applied bias

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Pattern Recognition

Collider based experiments have to 
 deal with increasingly complex events

  • HL LHC with ~200 interactions per 


crossing

  • The CMS experiment is addressing this with stacked sensor arrays to

distinguish low from moderate momentum tracks

  • Can we do this in a single sensor?
  • Muon collider experiments with huge decay backgrounds
  • Muon collider studies use timing - fall x 100 short
  • Backgrounds are from various absorber surfaces/angles
  • We can use the pattern of electrode signals to distinguish between

signal and background tracks signatures To get a feeling for this we use a 25 micron pitch electrode geometry in a ~300 micron thick sensor.

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CMS “Pt module”

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Charge Motion Visualization

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.1 ns 2 ns 1.5 ns 1.0 ns .5 ns 2.5 ns

electrons holes

30 degree track, n on n, maximum field at bottom.

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MIPs at various angles

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0 Deg 30 Deg 20 Deg 10 Deg 10ns 10ns 10ns 10ns Current (Arb. Units) Current (Arb. Units) Current (Arb. Units) Current (Arb. Units) Transient time. Transient time.

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Time resolution and Pattern Recognition

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E2

0.00E+00 2.00E-06 4.00E-06 6.00E-06 8.00E-06 1.00E-05 1.20E-05 1.40E-05 0.00E+00 2.00E-09 4.00E-09 6.00E-09 8.00E-09 1.00E-08 1.20E-08 1.40E-08

E4

1ns Iin 2ns

0.00E+00 2.00E-07 4.00E-07 6.00E-07 8.00E-07 1.00E-06 1.20E-06 1.40E-06 1.60E-06 1.80E-06 2.00E-06 0.00E+00 2.00E-09 4.00E-09 6.00E-09 8.00E-09 1.00E-08 1.20E-08 1.40E-08

Electrode 6

Iin 2ns 1ns

Long drift

  • some collected charge
  • dominated by induced current
  • difficult to measure secondary peak

Medium drift

  • Dominated by collected charge

Short drift

  • collected charge similar 


to induced current

  • Induced and collected 


signals merge

E4 E6

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A look at angular resolution

  • To try to get a feeling for what time and pulse

height resolution is needed we look at 10 and 20 degree tracks

  • 1 nanosecond rise time is assumed
  • Lowest threshold defines time resolution and

provides induced 
 current t0

  • Other thresholds provide time structure and shape
  • f secondary peak

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  • 1.00E-06

0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06 6.00E-06 0.00E+00 5.00E-09 1.00E-08 1.50E-08 2.00E-08 Sig (Arb Units) Time (sec)

20 Deg Track

E2 E3 E4 E5 E6

  • 1.00E-06

0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06 6.00E-06 0.00E+00 5.00E-09 1.00E-08 1.50E-08 2.00E-08 Signal (Arb Units) Time (Sec)

10 Degree Track

E2 E3 E4 E5 E6

0.00E+00 2.00E-07 4.00E-07 6.00E-07 8.00E-07 1.00E-06 0.00E+00 5.00E-09 1.00E-08 1.50E-08 2.00E-08 Sig (Arb Units) Time (sec)

20 Degree Track

E2 E3 E4 E5 E6

ToT end Threshold ToT start Threshold

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Time over Threshold

  • This simple case seems to work, time stamps reflect pulse shape
  • Slope indicates difference in charge drift among electrodes
  • Clear cutoff in signal for 10 degree track
  • Consistent start times (particle impact at 1 ns)

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  • 300ps error bars to

guide the eye 1E-09 2E-09 3E-09 4E-09 5E-09 6E-09 7E-09 8E-09 9E-09

  • 60
  • 40
  • 20

20 40 60 Time (Sec) Electrode Position (microns)

Time over threshold

20 Deg Tend 20 Deg, Tstart 10 Deg, Tstart 10 Deg Tend

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Comments

Patterns of hits on pixels in “thick” detectors can provide a wealth of information - but the devil is in the details

  • S/N and bandwidth are crucial
  • Information is in the first 10 ns
  • This means power
  • The more information about the waveforms the better
  • Time over Threshold (TOT) with multiple threshold points
  • Requires transresistance amplifier
  • Simple diode arrays are more radiation hard than LGADs, but radiation will

affect internal fields and charge collection

  • We also need to process and transmit that information - this implies

“intelligent” pixels where the information in a field of pixels can be processed and decisions made

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σ t ~ CL gmta ta

2 + td 2

Signal f ~ gm gm ∼ Id

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More Work (for someone …)

This work is very much at a conceptual stage Details will need to be understood to validate the concept and understand it’s range of application To Do:

  • Define an overall toy->serious algorithm
  • What is the angular resolution as a function of bandwidth?
  • How do Landau fluctuations affect the reconstruction?
  • What is the overall time resolution?
  • Implement a realistic transimpedance amplifier in 65 nm and access power

requirements

  • Re-acquire hybrid bonding technology for sensor/readout integration
  • Access optimal detector thickness and depletion fields

Build something

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Prospects

Fast timing in small pixels and thin detectors - most technologies have been demonstrated

  • Thin sensors (8” wafers)
  • Time of arrival (demonstrated with LGADs)
  • fine pitch bonding (3D hybrid bonding)
  • Chip to wafer bonding (dead regions?)

The use of induced currents

  • Small signal/noise, large bandwidth
  • Power consumption
  • Assembly geometry and size
  • Data processing - intelligent pixels to 


select hits around a central core

  • Data bandwidth

Vendors - The basic hybrid bonding technology is now licensed to several foundries (inc MIT-LL, Sandia, IZM), used in cell phone cameras many

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VICTR& VIP& VIP& VIPIC& VIPIC&

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Conclusions

I have discussed some possible applications of small pixels enabled by emerging technologies.

  • It is one way of addressing some of the extreme challenges of future

experiments (FCC, Muon Collider, EIC …)

  • Fast timing
  • Radiation hard
  • Complex event topologies
  • I have presented toy models without engineering detail

To do more, a specific application and real engineering is needed

  • What power is needed? Cooling mass? Support geometry
  • Amplifier/discriminator design
  • Design of the digital tiers
  • Area to be deployed? Coverage? Cost? - What Experiment?

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Chip to Wafer

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DBI bonding of ROICs (VICTR, VIPIC, VIP) to BNL sensor wafer

Expose TSVs, pattern Top aluminum Wafer-wafer 3D Bond Oxide bond Handle wafer Expose sensor side TSVs, pattern DBI structures DBI bond ROIC chips to sensor wafer (RT pick+Place) Grind and etch to expose top connections

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Integrator Circuit

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Implementation

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25µ Digital tier processes a field of pixels

Analog electronics tier with discriminators timing and memory

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Time resolution of a thick detector

  • We use the TCAD/SPICE simulation chain to model an x-ray in the thicker

detector going into a 65nm charge sensitive amplifier

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Electrode 1 – small pulse, but fast rise Deposit at Z=185 – note scales are not equal Electrode 3 – Deposit at Z=25

Edge pixel peak at 25 mV, 2 ns 0 total charge collected Central pixel 
 peak at 1V, 12 ns 100ns 110ns

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Pixel Capacitance

A detector with low capacitance can provide excellent time resolution:
 
 
 Before this improvement is realized other effects will dominate including charge deposition

  • variations. Power considerations will limit front-

end current which will reduce transistor transductance
 
 
 
 However with “spare” margin we can become more adventurous

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y = 2E-18x2 + 1E-16x + 1E-15 5E-15 1E-14 1.5E-14 2E-14 2.5E-14 3E-14 20 40 60 80 100 120

200 Micron Thick Detector Farads/micron

σ t,pixel σ t,LGAD ∼ Cpixel CLGAD × 1 GainLGAD ≥102 × 1 20 ∼ 5

σ t ∼ 1 gm , gm ∼ Id

α

(α ~ 1)

TCAD Simulation TSV Test Structure

Pixel Pitch (microns) Capacitance (farads)

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Hybrid Bonding Vendors (2019)

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Vendor Wafer Diam Wafer-Wafer Die-Wafer TSV Sony

  • NHanced

8” ✓ ✓ ~1 um? Teledyne Dalsa 6”, 8” ✓ ~5 um Sandia 6”->8” developing ✓ no IZM 12” ✓ no ~5 um Raytheon 8” ✓