Ronald Lipton CPAD 2019
- Dec. 10 2019
Tracking and Timing with Induced Current Detectors Ronald Lipton - - PowerPoint PPT Presentation
Tracking and Timing with Induced Current Detectors Ronald Lipton CPAD 2019 Dec. 10 2019 Introduction There has been increasing interest in fast timing as well as intelligent detector systems. I would like to present some ideas for
Ronald Lipton CPAD 2019
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2 = CL 2 4ktA
Front end noise
2 + td 2
Jitter Time resolution
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1→2 = q(Vw2 −Vw1)
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0" 50" 100" 150" 200" 250" 300" 350" 400" 450" 500" 25" 30" 35" 40" 45" 50" 55" 60" 65" Counts' noise'(electrons)'
Unbonded" Bump"bonded" Fusion"Bonded"
.5 mm sensor (BNL) 34 micron high 2-tier VICTR chip
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Pulses from “x-ray” at~100μ 200μ thick detector
y = 2E-18x2 + 1E-16x + 1E-15 5E-15 1E-14 1.5E-14 2E-14 2.5E-14 3E-14 20 40 60 80 100 120
200 Micron Thick Detector Farads/micron
TCAD Simulation
Pixel Pitch (microns) Capacitance (farads)
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Initial Current Spike Central pixel Corner neighbor 0 collected charge Edge neighbor (diffusion collected charge)
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2ns 2ns 2ns 2ns z=10 z=190 z=100 Central Electrode z=10 z=100 z=190
Central = n n+1 n+2 n+3
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h Entries 25 Mean 104.5 Std Dev 0.0204 / ndf
2χ 0.4421 / 2 Constant 2.457 ± 9.179 Mean 0.0 ± 104.5 Sigma 0.00445 ± 0.02177
104 104.2 104.4 104.6 104.8 105 2 4 6 8 10
h Entries 25 Mean 104.5 Std Dev 0.0204 / ndf
2χ 0.4421 / 2 Constant 2.457 ± 9.179 Mean 0.0 ± 104.5 Sigma 0.00445 ± 0.02177
Timing histogram
E1
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Edge pixel Edge pixel σ~ 30ps Central pixel Central pixel σ~ 22ps
10 ns
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h Entries 26 Mean 102.3 Std Dev 0.01593 / ndf
2c 0.6285 / 1 Constant 3.24 ± 12.34 Mean 0.0 ± 102.3 Sigma 0.00311 ± 0.01657
102 102.1 102.2 102.3 102.4 102.5 102.6 102.7 2 4 6 8 10 12
h Entries 26 Mean 102.3 Std Dev 0.01593 / ndf
2c 0.6285 / 1 Constant 3.24 ± 12.34 Mean 0.0 ± 102.3 Sigma 0.00311 ± 0.01657
Timing histogram
σ~16ps σ~25 micron pitch, 50 microns thick 200 V, sensor potential distribution Pulse on central pixel
2ns
Amplifier output with noise, 20ff load Threshold
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CMS “Pt module”
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.1 ns 2 ns 1.5 ns 1.0 ns .5 ns 2.5 ns
electrons holes
30 degree track, n on n, maximum field at bottom.
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0 Deg 30 Deg 20 Deg 10 Deg 10ns 10ns 10ns 10ns Current (Arb. Units) Current (Arb. Units) Current (Arb. Units) Current (Arb. Units) Transient time. Transient time.
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E2
0.00E+00 2.00E-06 4.00E-06 6.00E-06 8.00E-06 1.00E-05 1.20E-05 1.40E-05 0.00E+00 2.00E-09 4.00E-09 6.00E-09 8.00E-09 1.00E-08 1.20E-08 1.40E-08
E4
1ns Iin 2ns
0.00E+00 2.00E-07 4.00E-07 6.00E-07 8.00E-07 1.00E-06 1.20E-06 1.40E-06 1.60E-06 1.80E-06 2.00E-06 0.00E+00 2.00E-09 4.00E-09 6.00E-09 8.00E-09 1.00E-08 1.20E-08 1.40E-08
Electrode 6
Iin 2ns 1ns
Long drift
Medium drift
Short drift
to induced current
signals merge
E4 E6
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height resolution is needed we look at 10 and 20 degree tracks
provides induced current t0
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0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06 6.00E-06 0.00E+00 5.00E-09 1.00E-08 1.50E-08 2.00E-08 Sig (Arb Units) Time (sec)
20 Deg Track
E2 E3 E4 E5 E6
0.00E+00 1.00E-06 2.00E-06 3.00E-06 4.00E-06 5.00E-06 6.00E-06 0.00E+00 5.00E-09 1.00E-08 1.50E-08 2.00E-08 Signal (Arb Units) Time (Sec)
10 Degree Track
E2 E3 E4 E5 E6
0.00E+00 2.00E-07 4.00E-07 6.00E-07 8.00E-07 1.00E-06 0.00E+00 5.00E-09 1.00E-08 1.50E-08 2.00E-08 Sig (Arb Units) Time (sec)
20 Degree Track
E2 E3 E4 E5 E6
ToT end Threshold ToT start Threshold
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guide the eye 1E-09 2E-09 3E-09 4E-09 5E-09 6E-09 7E-09 8E-09 9E-09
20 40 60 Time (Sec) Electrode Position (microns)
Time over threshold
20 Deg Tend 20 Deg, Tstart 10 Deg, Tstart 10 Deg Tend
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2 + td 2
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VICTR& VIP& VIP& VIPIC& VIPIC&
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Expose TSVs, pattern Top aluminum Wafer-wafer 3D Bond Oxide bond Handle wafer Expose sensor side TSVs, pattern DBI structures DBI bond ROIC chips to sensor wafer (RT pick+Place) Grind and etch to expose top connections
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25µ Digital tier processes a field of pixels
Analog electronics tier with discriminators timing and memory
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Electrode 1 – small pulse, but fast rise Deposit at Z=185 – note scales are not equal Electrode 3 – Deposit at Z=25
Edge pixel peak at 25 mV, 2 ns 0 total charge collected Central pixel peak at 1V, 12 ns 100ns 110ns
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y = 2E-18x2 + 1E-16x + 1E-15 5E-15 1E-14 1.5E-14 2E-14 2.5E-14 3E-14 20 40 60 80 100 120
200 Micron Thick Detector Farads/micron
σ t,pixel σ t,LGAD ∼ Cpixel CLGAD × 1 GainLGAD ≥102 × 1 20 ∼ 5
α
(α ~ 1)
TCAD Simulation TSV Test Structure
Pixel Pitch (microns) Capacitance (farads)
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Vendor Wafer Diam Wafer-Wafer Die-Wafer TSV Sony
8” ✓ ✓ ~1 um? Teledyne Dalsa 6”, 8” ✓ ~5 um Sandia 6”->8” developing ✓ no IZM 12” ✓ no ~5 um Raytheon 8” ✓