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NASA Electronic Parts and Packaging (NEPP) A NASA Office of Safety and Mission Assurance (OSMA) Program Kenneth A. LaBel ken.label@nasa.gov 301-286-9936 Co- Manager, NEPP Program NASA/GSFC To be presented by Kenneth A. LaBel at the 2017


  1. NASA Electronic Parts and Packaging (NEPP) A NASA Office of Safety and Mission Assurance (OSMA) Program Kenneth A. LaBel ken.label@nasa.gov 301-286-9936 Co- Manager, NEPP Program NASA/GSFC To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017.

  2. Acronyms Acronym Definition Acronym Definition 3D Three Dimensional LANL Los Alamos National Laboratories AF Air Force MBMA Model-Based Missions Assurance AF SMC Air Force Space and Missile Systems Center Mil Military AI Artificial Intelligence MOSFET Metal–Oxide–Semiconductor Field-Effect Transistor BAE BAE Systems MPSOC Multi-Processing System on Chip BOK Body of Knowledge NASA National Aeronautics and Space Administration BYU Brigham Young University Navy Crane Naval Surface Warfare Center, Crane, Indiana CLTs NASA CIO Leadership Teams Navy Crane Naval Surface Warfare Center, Crane Division CMOS Complementary Metal Oxide Semiconductor NEPAG NASA EEE Parts Assurance Group COTS Commercial Off The Shelf NEPP NASA Electronic Parts and Packaging Double Data Rate (DDR3 = Generation 3; DDR4 = NESC NASA National Electric Safety Code DDR Generation 4) NRO United States Navy National Reconnaissance Office DiRAM Dis-integrated Random Access Memory OCE Office of the Chief Engineer DLA Defense Logistics Agency NASA Office of Safety and Mission Assurance (OSMA) OSMA DoD Department of Defense Program DOE Department of Energy R&M Reliability and Maintainability DRAM Dynamic Random-Access Memory RH Radiation Hardened EEE Electrical, Electronic, and Electromechanical SAE Society of Automotive Engineers (SAE) ESA European Space Agency SAPP Space Asset Protection Program FinFETs Fin Field Effect Transistors SEB Single Event Burnout FPGA Field Programmable Gate Array SEE Single Event Effect GaN Gallium Nitride SiC Silicon Carbide GIDEP Government-Industry Data Exchange Program SME Small and Medium-sized Enterprises GPU Graphics Processing Unit SNL Sandia National Laboratories IC Integrated Circuit SOC Systems on a Chip IR Infrared STMD NASA's Space Technology Mission Directorate JEDEC Joint Electron Device Engineering Council (JEDEC) TOR Technical Operating Report To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 2

  3. NEPP Mission Statement Provide NASA’s leadership for developing and maintaining guidance for the screening, qualification, test, and reliable usage of electrical, electronic, and electromechanical (EEE) parts by NASA, in collaboration with other government Agencies and industry. To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 3

  4. NEPP - Charter Agency Priorities – Technology Evaluation Independent Support • Advanced /new EEE • Commercial Crew parts/technologies • Small Mission • Ex. Advanced CMOS, Reliability GaN, SiC • Coordination with • Working Groups (NASA NASA Consolidation, , government, CLTs, NESC, STMD, aerospace) Trusted and RH SAPP, and radiation • Screening/qualification/ Electronics block buy test/usage guidelines • Collaboration with EEE Parts • Collaborate with • Partnering: NASA, NASA and other Infrastructure DoD/DOE on space Government Agencies, Agency Supply Chain radiation test Industry, University, • NEPAG Telecons and and Trust/Counterfeit infrastructure Working Groups International Electronics • SME Capabilities Organizations • Communication and • Support DoD efforts Outreach within NASA on Trusted Foundries and to the greater and FPGAs (w/NASA aerospace community STMD and OCE/Space Asset Protection) • Support DoD RH Agency Leadership efforts • NASA Policies and Procedures • Agency Guidelines, Body of Knowledge EEE Parts Problem (BOK) documents, and Best Practices Investigations Mission • Coordination of • Agency/Industry-wide Government and Assurance problems Industry Standards • GIDEP and NASA Alert • Audit Coordination development with AF, NRO, DLA • Partnering within NASA and other Agencies, Industry, University, and International To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 4

  5. Body of Knowledge (BOK) Documents • What goes into a BOK – An overview of the technology – An overview of technology applicability to space/aeronautics – An overview of technology maturity, produceability and/or commercial availability – Reliability, qualification, and/or radiation knowledge-base – Technology direction or extent of the reliability issue for the future Identification of experts, technology sources, test houses, etc. – Facilities/capabilities – Recommendation for follow-on NEPP task (if applicable) To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 5

  6. NEPP – Product Delivery NASA EEE Parts Policy and Standards Best Practices Government and and Guidelines Industry Standards • Test, usage, Representation screening, qualification • SAE G11/G12/ • Radiation facility JEDEC JC13 studies • Aerospace TORs NEPP Standard Products BOK • Test, summary, and • Technology and audit reports Assurance product status and • Conference and gap analysis workshop presentations • Alerts Related task areas: Technology/parts evaluations lead to new best practices, etc… To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 6

  7. Advanced Technologies • Technology/device evaluations with a nod to developing test methods and user guidance Hynix 3D Flash Memory AMD Ryzen Processor To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 7

  8. NEPP – Processors, Systems on a Chip (SOC), and Field Programmable Gate Arrays (FPGAs) State of the Art “Space” FPGAs COTS • Microsemi RTG4 Processors • Xilinx MPSOC+ • Sub 32nm CMOS, • ESA Brave (future) FinFETs, etc • “Trusted” FPGA • Samsung, Intel, (future) AMD Graphics COTS FPGAs Processor • Xilinx Kintex+ Units (GPUs) • Mitigation evaluation • Intel, AMD, Nvidia • TBD: Microsemi • Enabling data PolarFire processing Partnering Radiation Best Hardened • Processors: Navy Practices Crane, BAE/NRO- Processor • FPGAs: AF SMC, Evaluation and SNL, LANL, BYU,… • BAE • Microsemi, Xilinx, Guidelines • Vorago Synopsis (microcontrollers) • Cubic Aerospace Potential future task areas: artificial intelligence (AI) hardware, Intel Stratix 10 To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 8

  9. NEPP – Memories New materials/ architectures DRAMs • Resistive • DDR4 test capability (in • Fujitsu/Panasonic progress) • Spin torque transfer • Commercial DDR magnetoresistive (various) • Avalanche, Everspin • Tezzaron DiRAM • 3D Xpoint • Enabling high • Intel Optane performance computing • Enabling “universal” memories Commercial Flash Partnering • 3D • Navy Crane • Samsung, Hynix, Micron • NASA STMD • Planar – TBD • Avalanche Best • Enabling data storage • University of Padova density Practices and Guidelines Related task areas: Deprocessing for single event testing (also w/processors, FPGAs,…) To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 9

  10. Working Industry/Agency-Wide Concerns Thermal Image of failure locations Tantalum capacitor failure High magnitude optical Cross-section of failure images of failure location locations Failure analysis of Schottky diode radiation damage To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 10

  11. Vendor Validation Tests Comparison of n-type 60V trench GaN IC – radiation test analysis MOSFET SEB thresholds To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 11

  12. Infrastructure Challenges Using Proton Cancer Therapy Centers for electronics testing To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 12

  13. NEPP - Small Mission Efforts SEE Reliability CubeSat Analysis COTS and Mission Non-Mil Data Success Analysis Best CubeSat Practices and Databases Guidelines Model-Based Reliable Mission Assurance Working Small (MBMA) Groups Missions • W NASA R&M Program Potential future task areas: automotive and avionics resilience To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 13

  14. Partnering is key • Within – NASA • With – Other government agencies – Industry – University – International To be presented by Kenneth A. LaBel at the 2017 IEEE Nuclear and Space Radiation Effects Conference (NSREC 2017), New Orleans, LA, July 17-21, 2017. 14

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