MTLE-6120: Advanced Electronic Properties of Materials Intrinsic and - - PowerPoint PPT Presentation

mtle 6120 advanced electronic properties of materials
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MTLE-6120: Advanced Electronic Properties of Materials Intrinsic and - - PowerPoint PPT Presentation

1 MTLE-6120: Advanced Electronic Properties of Materials Intrinsic and extrinsic semiconductors Contents: Band-edge density of states Intrinsic Fermi level and carrier concentrations Dopant states and ionization Extrinsic Fermi


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SLIDE 1

MTLE-6120: Advanced Electronic Properties of Materials Intrinsic and extrinsic semiconductors

Contents:

◮ Band-edge density of states ◮ Intrinsic Fermi level and carrier concentrations ◮ Dopant states and ionization ◮ Extrinsic Fermi level and carrier concentrations ◮ Mobility: temperature and carrier density dependence ◮ Recombination mechanisms

Reading:

◮ Kasap: 5.1 - 5.6

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SLIDE 2

Band structure and conduction

◮ Metals: partially filled band(s) i.e. bands cross Fermi level ◮ Semiconductors / insulators: each band either filled or empty (T = 0) ◮ Drude formula applicable, mobility µ = eτ m∗ ◮ Effective mass m∗ = 2[∇ k∇ kEn(

k)]−1 tensorial in general

◮ Filled band does not conduct: eτ

  • dk(m∗)−1 = 0 for each band

◮ Metals conduct due to carriers near Fermi level σ = g(EF )e2v2 F τ/3 ◮ Semiconductors: g(EF ) = 0 (will show shortly) ⇒ no conduction at T = 0

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SLIDE 3

Band structure of silicon (diamond-cubic semiconductor)

E in eV

6 −12 L Λ Γ Δ Χ Σ Γ Ev Ec −6

◮ HOMO = Valence Band Maximum (VBM) with energy Ev

and LUMO = Conduction Band Minimum (CBM) with energy Ec

◮ HOMO-LUMO gap Eg = Ec − Ev ≈ 1.1 eV ◮ HOMO and LUMO at different

k ⇒ indirect band gap

◮ Diamond: similar band structure, much larger gap (≈ 5.5 eV) ⇒ insulator ◮ Valence electrons/cell = 8 (even), configuration: 3s23p2 (two Si/cell)

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SLIDE 4

Band structure of GaAs (zinc-blende semiconductor)

◮ HOMO-LUMO gap Eg = Ec − Ev ≈ 1.4 eV ◮ HOMO and LUMO at same

k (Γ) ⇒ direct band gap

◮ Valence electrons/cell = 8 (even), configuration: Ga(4s24p1), As(4s24p3)

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SLIDE 5

Density of states: silicon

◮ Can calculate numerically from band structure ◮ Parabolic band approximation valid for narrow energy range near gap

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Density of states: parabolic-band semiconductor

1 2 3 4

  • 3
  • 2
  • 1

1 2 3 4 5 E [eV] g(E) [eV-1nm-3] Valence band, m* = -0.3 Conduction band, m* = 0.5

◮ Parabolic bands near each band edge, with different effective masses ◮ Overall DOS reduces with reduced effective mass magnitude ◮ Set Ev = 0 conventionally (overall energy not well-defined) ◮ Conduction band edge Ec = Eg ◮ Where is the Fermi level?

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SLIDE 7

Where is the Fermi level?

◮ At T = 0, valence band fully occupied ⇒ f(Ev = 0) = 1 ⇒ EF > 0 ◮ At T = 0, conduction band fully empty ⇒ f(Ec = Eg) = 0 ⇒ EF < Eg ◮ Therefore, at T = 0, 0 < EF < Eg i.e. Fermi level is in the band gap ◮ Chemical potential µ → EF as T → 0 ◮ In semiconductor physics, typically refer to EF (T) instead of µ(T) ◮ Therefore, Fermi functions will be

f(E, T) = 1 exp E−EF (T )

kBT

+ 1

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SLIDE 8

Where is the Fermi level at T > 0?

◮ Given Fermi level EF and density of states g(E) ◮ Number of electrons in conduction band is Ne =

Eg dEg(E)f(E) ◮ Number of holes in valence band is Nh = −∞ dEg(E)(1 − f(E)) ◮ Total number of electrons cannot change with T ⇒ Ne = Nh −∞

dEg(E)(1 − f(E)) = ∞

Eg

dEg(E)f(E)

−∞

dEg(E) exp E−EF

kBT

exp E−EF

kBT

+ 1 = ∞

Eg

dEg(E) 1 exp E−EF

kBT

+ 1

−∞

dEg(E)e−(EF −E)/(kBT ) ≈ ∞

Eg

dEg(E)e−(E−EF )(kBT ) e−EF /(kBT ) ∞ dεg(−ε)e−

ε kBT

  • ≡Nv

≈ e(EF −Eg)/(kBT ) ∞ dεg(Eg + ε)e−

ε kBT

  • ≡Nc

Assuming EF , Eg − EF ≫ kBT, ε ≡ energy from band edge

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SLIDE 9

Band edge effective density of states

◮ Given density of states as a function of energy away from band edge

Nc/v ≡ ∞ dεgc/v(ε)e−

ε kBT

◮ In parabolic band approximation g(ε) =

2m∗ 2π

3 4π√ε for both bands (but with different m∗; for tensor m∗, above defines DOS meff)

◮ Therefore band-edge effective of density states:

Nc/v ≡ ∞ dε  

  • 2m∗

c/v

2π  

3

4π√εe−

ε kBT

=  

  • 2m∗

c/v

2π  

3

4πΓ(3/2)(kBT)3/2 = 2  

  • 2πm∗

c/vkBT

2π  

3 ◮ Nc/v ∝ (m∗ c/v)3/2 (steeper g(ε) parabola) ◮ Nc/v ∝ T 3/2 (climb higher up the g(ε) parabola)

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SLIDE 10

Fermi level for T > 0

◮ Charge neutrality imposes

Nve−EF /(kBT ) = Nce(EF −Eg)/(kBT )

◮ Solve for Fermi level position:

EF (T) = Eg 2 + kBT 2 ln Nv Nc

◮ At T → 0, EF is exactly at the middle of the band gap ◮ At finite T, EF moves away ∼ kBT ≪ Eg (still close to gap center) ◮ Which way does the Fermi level move with increasing T? ◮ For electrons in metals (and classical gases), µ ↓ with T ↑ ◮ For semiconductors, EF (T) ↓ with T ↑ iff Nc > Nv

(more DOS in positive m∗ band; negative m∗ pulls µ other way)

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SLIDE 11

Electron and hole concentrations

◮ Number density of electrons n ≡ Ne = Nce−(Eg−EF )/(kBT ) ◮ Number density of holes p ≡ Nh = Nve−EF /(kBT ) ◮ Which one is larger? So far, they are equal: charge neutrality! ◮ Note product np = NcNve−Eg/(kBT ) ≡ n2 i , independent of EF ◮ Neutral pure semiconductor, n = p = ni, intrinsic carrier density ◮ If EF ↑, then n ↑ and p ↓ (more electrons than holes) ◮ If EF ↓, then n ↓ and p ↑ (more holes than electrons) ◮ But np = n2 i , constant in all these cases ◮ This is an equilibrium constant, eg. [H+][OH−] = 10−14 M2 in water ◮ How do you change EF ? Doping! (Also later, gating)

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Intrinsic semiconductor thermodynamics and transport

◮ Fermi level far from band edges ⇒ Boltzmann statistics in both bands ◮ Velocity distribution: Maxwell-Boltzmann distribution (classical gases) ◮ Internal energy of electrons n · (Eg + 3kBT/2) ◮ Internal energy of holes −p · (−3kBT/2) (holes are missing electrons!) ◮ Net internal energy n · (Eg + 3kBT/2) − p · (−3kBT/2) ◮ Drude theory conductivity σ = neµe + peµh

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SLIDE 13

Intrinsic semiconductors: typical values at T = 300 K

Eg [eV] m∗

e/me

m∗

h/me

Nc [cm-3] Nv [cm-3] ni [cm-3] Ge 0.66 0.04,0.28 1.64,0.08 1.0 × 1019 6.0 × 1018 2.3 × 1013 Si 1.10 0.16,0.49 0.98,0.19 2.8 × 1019 1.2 × 1019 1.0 × 1010 GaAs 1.42 0.082 0.067 4.7 × 1017 7.0 × 1018 2.1 × 106

◮ Note that meff for Nc/v is an average of longitudinal / transverse values

(meff = m1/3

L m2/3 T ; for values see Table 5.1 in Kasap) ◮ Nc and Nv increase with meff ◮ ni drops exponentially with increasing Eg

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Diamond-cubic structure: sp3 bonding

◮ Valence s and three p orbitals ⇒ four sp3 hybrid orbitals ◮ Orbitals point towards vertices of regular tetrahedron ◮ Si, C, Ge: 4 valence electrons each ◮ Form covalent bonds with four neighbours (8 shared electrons/atom) ◮ Bonding orbitals → valence band, anti-bonding orbitals → conduction band ◮ Tetrahedral network: FCC lattice with two atoms per cell

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Zinc-blende structure: sp3 bonding

◮ Valence s and three p orbitals ⇒ four sp3 hybrid orbitals ◮ Orbitals point towards vertices of regular tetrahedron ◮ Combine Ga,In (3 electrons) with As,Sb (5 electrons) ◮ Form covalent bonds with four neighbours (8 shared electrons/atom) ◮ Bonding orbitals → valence band, anti-bonding orbitals → conduction band ◮ Tetrahedral network: FCC lattice with two atoms per cell ◮ With Al and N, tend to form closely related Wurtzite structure

(FCC to HCP cell)

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Doping: acceptors and donors

◮ Extra / impurity Group III atoms: one less electron per atom ◮ Extra / impurity Group V atom: one extra electron per atom ◮ Covalent bonding theory: atoms want 8 (filled-shell) of shared electrons ◮ Group III ‘acceptor’: pick up electron from solid ⇒ hole in valence band ◮ Group V ‘donor’: give electron to solid ⇒ electron in conduction band

Simple picture of doping:

◮ Density Na of acceptor atoms: charge −eNa ◮ Density Nd of donor atoms: charge +eNd ◮ Charge neutrality −en + ep − eNa + eNd = 0 ⇒ n − p = Nd − Na ◮ Change in n and p due to shift in EF , but np = n2 i ◮ Solve for n and p, then find EF = Eg 2 + kBT 2

ln nNv

pNc = EF 0 + kBT 2

ln n

p ◮ Even simpler picture: usually Nd, Na ≫ ni ⇒ either p ≫ n or n ≫ p

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Doping: p-type and n-type

n-type semiconductor:

◮ Donor impurities dominate Nd > 0 (Na = 0 or < Nd) ◮ Typically Nd − Na ≫ ni ⇒ n ≫ p (since p = n2 i /n) ◮ Therefore n ≈ Nd − Na, p ≈ n2 i /(Nd − Na) ◮ EF = EF 0 + kBT 2

ln n

p = EF 0 + kBT ln Nd−Na ni

(shifted ↑ towards CBM)

◮ Current predominantly carried by electrons

p-type semiconductor:

◮ Acceptor impurities dominate Na > 0 (Nd = 0 or < Na) ◮ Typically Na − Nd ≫ ni ⇒ p ≫ n (since n = n2 i /p) ◮ Therefore p ≈ Na − Nd, n ≈ n2 i /(Na − Nd) ◮ EF = EF 0 + kBT 2

ln n

p = EF 0 − kBT ln Na−Nd ni

(shifted ↓ towards VBM)

◮ Current predominantly carried by holes

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SLIDE 18

Doping: a more complete picture

◮ Simple picture: donor atom donates an electron, becomes positively

charged

◮ Positively charged donor ion can bind electrons: like a hydrogen atom ◮ Binding energy of pseudo-hydrogenic atom Eb = ǫ−2 r m∗ me Ryd ∼ 0.05 eV ◮ Donor level: Ed = Ec − Eb (electrons bound relative to CBM) ◮ Exact argument for acceptors and holes, with charges swapped ◮ Acceptor level: Ea = Ev + Eb (holes bound relative to VBM) ◮ Levels in Si: note some impurities introduce multiple levels

Physics of Semiconductor Devices, S. M. Sze

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SLIDE 19

Dopant levels in Ge and GaAs

◮ For GaAs, Group II or Group VI are shallow dopants ◮ For GaAs, Group IV can be donor and acceptor dopants: how?

Physics of Semiconductor Devices, S. M. Sze

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Donor charge density

◮ For each donor atom, degenerate donor levels typically with gd = 2 (spin) ◮ Electron occupation: zero or one for the whole atom (repulsions) ◮ Probability of occupation zero ∝ 1 ◮ Probability of occupation one ∝ gd exp EF −Ed kBT ◮ Normalized probability of ionized donor (occupation zero):

P +

d =

1 1 + gd exp EF −Ed

kBT ◮ Therefore number density of ionized donors:

N +

d =

Nd 1 + gd exp EF −Ed

kBT

(which is ≈ Nd as long as EF several kBT below Ed)

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Acceptor charge density

◮ For each acceptor atom, degenerate acceptor levels typically with ga = 4

(two for spin, two for dgenerate hole bands)

◮ Hole occupation: zero or one for the whole atom (repulsions) ◮ Probability of hole occupation zero ∝ 1 ◮ Probability of hole occupation one ∝ ga exp Ea−EF kBT

(tricky: flip energy axis when thinking in terms of holes)

◮ Normalized probability of ionized donor (hole occupation zero):

P −

a =

1 1 + ga exp Ea−EF

kBT ◮ Therefore number density of ionized acceptors:

N −

a =

Na 1 + ga exp Ea−EF

kBT

(which is ≈ Na as long as EF several kBT above Ea)

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SLIDE 22

Charge neutrality

0 = ρ(EF ) = −en + ep + eN +

d − eN − a

= e  − Nce−

Eg−EF kBT

  • n

+ Nve− EF

kBT

  • p

+ Nd 1 + gde

EF −Ed kBT

− Na 1 + gae

Ea−EF kBT

 

◮ If Na − Nd ≫ ni, then p ≫ n (p-type) ◮ If Nd − Na ≫ ni, then n ≫ p (n-type) ◮ Previous simple analysis holds if:

◮ Net doping is stronger than ni (one of the two regimes above), and ◮ Doping is small enough that EF is far above Ea and far below Ed

(remember EF moves up/down ∼ kBT ln

Nd/a ni )

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SLIDE 23

ρ(EF): intrinsic semiconductor

1010 1012 1014 1016 1018 1020 0.2 0.4 0.6 0.8 1 ρ/e [cm-3] E [eV] Na = 0, Nd = 0 +

  • ◮ Electrons increase with increaisng EF (hence ρ decreases)

◮ Cross-over point from + to − is neutral EF

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SLIDE 24

ρ(EF): moderate p doping

1010 1012 1014 1016 1018 1020 0.2 0.4 0.6 0.8 1 ρ/e [cm-3] E [eV] Na = 1014, Nd = 0 +

  • ◮ Acceptors pull down Fermi level

◮ At moderate doping level, far from mid-gap and acceptor levels

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SLIDE 25

ρ(EF): moderate n doping

1010 1012 1014 1016 1018 1020 0.2 0.4 0.6 0.8 1 ρ/e [cm-3] E [eV] Na = 0, Nd = 1014 +

  • ◮ Donors pull up Fermi level

◮ At moderate doping level, far from mid-gap and donor levels

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SLIDE 26

ρ(EF): high n doping

1010 1012 1014 1016 1018 1020 0.2 0.4 0.6 0.8 1 ρ/e [cm-3] E [eV] Na = 0, Nd = 1019 +

  • ◮ At high n doping level, approach / cross donor level

◮ Donors may be partially ionized (simple model no longer works)

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SLIDE 27

ρ(EF): high p doping

1010 1012 1014 1016 1018 1020 0.2 0.4 0.6 0.8 1 ρ/e [cm-3] E [eV] Na = 1019, Nd = 0 +

  • ◮ At high p doping level, approach / cross acceptor level

◮ Acceptors may be partially ionized (simple model no longer works)

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Degenerate doping

◮ High-enough n doping: Fermi level enters conduction band (‘n+’) ◮ High-enough p doping: Fermi level enters valence band (‘p+’) ◮ One of our approximations breaks down for n+ case with EF > Eg,

n ≈ Nce−(Eg−EF )/(kBT ) but instead n ≈ 1 3π2

  • 2m∗(EF − Eg)
  • 3

◮ Similarly, for p+ case with EF < 0:

p ≈ 1 3π2

  • 2m∗(−EF )
  • 3

◮ These are the Fermi theory expressions with kF = √2m∗εF /

(where εF is Fermi energy relative to band edge)!

◮ Important: partial donor / acceptor ionization in this regime

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Partial donor ionization

◮ Consider a p-type material (Nd = 0) with EF = Ea

(we cross this point as we increase p-doping before getting to p+)

◮ Around this EF , acceptors are partially ionized ◮ When exactly does this occur? ◮ Since EF far from conduction band, neglect n ≪ p ◮ Charge neutrality yields

Nve− EF

kBT =

Na 1 + ga exp Ea−EF

kBT

⇒ Nve− Ea

kBT =

Na 1 + ga ⇒ kBT = Ea log (1+ga)Nv

Na ◮ Therefore, this happens for high Na when Ea ≪ kBT ◮ But also, for kBT lower than Ea: dopant freeze-out ◮ Importance of shallow donor/acceptor levels!

(for donors, replace Ea → Eg − Ed)

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Carrier density in ionization regime

◮ If T much smaller than ionization threshold, neutrality:

Nve− EF

kBT =

Na 1 + ga exp Ea−EF

kBT

→ Nve− EF

kBT ≈ Na

ga e− Ea−EF

kBT

⇒ EF = Ea 2 + kBT 2 log gaNv Na

◮ Very similar to intrinsic case, except Na/ga replaces Nc ◮ Effective gap between valence band and acceptor level! ◮ In this regime, p2 = p · N − a = (NvNa/ga) exp −Ea kBT ◮ Similar behavior for frozen-out donors in ionization regime for n-type

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Temperature dependence of EF

1/50 1/100 1/300 1/1000 1/T [K

1]

0.0 0.2 0.4 0.6 0.8 1.0 EF [eV] Na/d = 1012 Na/d = 1014 Na/d = 1016 Na/d = 1018

◮ Doping dominates at low T, approach intrinsic level at high T ◮ At low T, Fermi level decided by donor/acceptor level ◮ Note using Ea/d = 0.1 eV from band edges to exaggerate effect

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Temperature dependence of carrier concentration

1/50 1/100 1/300 1/1000 1/T [K

1]

1010 1012 1014 1016 1018 1020 n [cm

3]

I

  • n

i z a t i

  • n

Extrinsic Intrinsic Na/d = 1012 Na/d = 1014 Na/d = 1016 Na/d = 1018

◮ Ionization regime at low T upto threhsold which increases with Nd/a ◮ Constant concentration in extrinsic regime; threshold increases with Nd/a ◮ At high T, dopants don’t matter: intrinsic regime

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Intrinsic mobility

◮ Drude theory: mobility µ = eτ/m∗ ◮ Typically semiconductor m∗ ∼ 0.1 − 1 me, so expect higher µ than metals ◮ At room temperature, µe i-Si ∼ 1400 cm2/(Vs) and µAg ∼ 60 cm2/(Vs) ◮ Effective mass alone does not explain it! ◮ Remember τ −1 e-ph ∝ g(E)T ◮ For metals, g(E) → g(EF ) since most carriers near Fermi level ◮ For semiconductors, carriers within few kBT of band edge

where g(E) ∝ √ E (and much smaller than metals)

◮ Averaged over carriers, g(E) ∝

√ T

◮ Therefore, τ −1 e-ph ∝ T 3/2 and µ ∝ τ ∝ T −3/2

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Impurity scattering

◮ Doped semiconductor contains ionized donors / acceptors ◮ Charged impurities cause electron PE ∝ 1/r near them ◮ Electrons with KE ≫ PE not scattered significantly ◮ Electrons with KE ≪ PE scattered most strongly ◮ Effective cross-section ∝ r2 c, where PE(rc) ∼ KE ∼ kBT ◮ Therefore rc ∝ T −1 and cross-section σcs ∝ T −2 ◮ Scattering time τI = (Na/dσcsv)−1 ◮ Average velocity v ∝

√ T

◮ Therefore τI ∝ N −1 a/dT 3/2

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Extrinsic mobility

◮ Intrinsic scattering time τe-ph ∝ T −3/2 ◮ Dopant / impurity scattering time τI ∝ N −1 a/dT 3/2 ◮ Net scattering time τ ∝

  • T 3/2 + Na/dT −3/2−1 (Mathiessen rule)

◮ Therefore mobility µ ∝

  • T 3/2 + Na/dT −3/2−1

◮ At high T, e-ph scattering dominates (intrinsic regime) ◮ At high doping concentration (or low T), impurity scattering dominates

  • Fig. 5.18 and 5.19 from Kasap

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SLIDE 36

Extrinsic conductivity

◮ Conductivity σ = neµe + peµh: similar dependence as n

(exponentials dominate over polynomial)

◮ µ effect visible mainly in extrinsic regime where n is constant

  • Fig. 5.20 from Kasap

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SLIDE 37

Recombination

E in eV

6 −12 L Λ Γ Δ Χ Σ Γ Ev Ec −6

◮ Excite electrons and holes in semiconductor to higher energy ◮ e-ph scattering brings electrons and holes to band edges ◮ If np = n2 i , equilibrium: nothing further happens ◮ What if you make more electron-hole pairs (eg. using light)

such that np = n2

i ? ◮ Electrons and holes will recombine to restore equilibrium

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SLIDE 38

Recombination: direct vs indirect

E in eV

6 −12 L Λ Γ Δ Χ Σ Γ Ev Ec −6

◮ Direct gap: electrons and holes at band edges at same k ◮ Indirect gap: band edge carriers at different k ◮ Which will recombine faster? ◮ Direct gap: momentum conservation, recombine and emit light (usually) ◮ Indirect gap: cannot directly recombine: momentum not conserved

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SLIDE 39

Recombination mechanisms

◮ Recombination rate proportional to np − n2 i ◮ Radiative / direct recombination (direct gap materials) ◮ Trap-assisted (Shockley-Read-Hall recombination)

◮ Trap level in gap captures electron (hole), becoming − (+) charged ◮ Later captures hole (electron), becoming neutral ◮ Energy from recombination emitted to phonons ◮ Probability of each capture ∝ Boltzmann factor of trap depth from band

edge

◮ Net rate ∼ sech2 Et−Eg/2

2kBT

(trap level Et)

◮ Strongest for mid-band-gap states!

◮ Auger recombination

◮ Energy and momentum of e-h pair go to excite another e or h ◮ Need e or h to excite, so rate ∝ n, p ◮ Dominates at very high carrier concentrations

◮ Recombination rate = α(np − n2 i ) ◮ Minority carrier lifetime = 1/(max(n, p)α)

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