I&T Data Products & Focal Plane Behavior Aaron Roodman - - PowerPoint PPT Presentation

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I&T Data Products & Focal Plane Behavior Aaron Roodman - - PowerPoint PPT Presentation

I&T Data Products & Focal Plane Behavior Aaron Roodman Project & Community Workshop 2018 I&T Data Products All needed to verify Camera meets Bad Pixel Map requirements Gain (Fe55 & PTC) Noise Dark Current Maps: by


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SLIDE 1

I&T Data Products & Focal Plane Behavior

Aaron Roodman Project & Community Workshop 2018

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SLIDE 2

Aaron Roodman SLAC National Accelerator Laboratory Project & Community Workshop

I&T Data Products

Bad Pixel Map Gain (Fe55 & PTC) Noise Dark Current Linearity & Full Well Diffusion Response Map (ie. QE) Deferred Charge (EPER, Fe55, Spots) Use EPER & Spots to characterize vs. Flux Brighter-Fatter Correlation Matrix By Amplifier, from Flat Fields Cross-talk Matrix Focal-plane Height Map As-built Optical Model All needed to verify Camera meets requirements Maps: by pixel, supply as FITS files with same structure as images Data by Amplifier: supply using standard identifiers: R I,J ; S I,J ; iAmp

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SLIDE 3

Aaron Roodman SLAC National Accelerator Laboratory Project & Community Workshop

Focal Plane Characterization

Deferred Charge

Deferred Charge: RTM-005

  • Large deferred charge signal seen in Amp 5 and Amp 11.
  • Deferred charge signal scales as a function of flux, up to some

flux value. Stacked Xray hits: 2 Amps in RTM-005 show long-time constant deferred charge A Snyder

Bias Shifts

row number Defect

  • Y. Utsumi

Bias image with Bright Defect: Bias shifts in pixels read-out after saturated pixels

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SLIDE 4

Aaron Roodman SLAC National Accelerator Laboratory Project & Community Workshop

Focal Plane Characterization

Cross-Talk

A Snyder

Results: RTM-005 crosstalk

No observed sensor to sensor Xtalk: measurements consistent with noise or due to artifacts

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SLIDE 5

Aaron Roodman SLAC National Accelerator Laboratory Project & Community Workshop

Focal Plane Characterization

Noise Correlations

Correlation Coefficients: Pixel-by-Pixel in

  • verscan region

P O’Connor Noise Correlations: Pixel value Amp #i vs. Mean(other 15 Amps)

S02 & S21 have read noise >9 e-

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SLIDE 6

Aaron Roodman SLAC National Accelerator Laboratory Project & Community Workshop

I&T Camera Data Analysis Opportunities

Focal Plane Electro-Optical Testing will occur with 1) 2 ETUs starting Nov 2018 (3 weeks) 2) 9 RTMs (+CRM) starting Feb 2019 (7 weeks) 3) All Rafts starting June 2019 (7 weeks) Total Focal Plane testing time is limited, and quick turn-around on analysis of test data is going to be

  • essential. Default test analysis will be run, but

there is much to study beyond that. Camera Test Rapid Response Team to follow-up problems, issues & anomalies