DEVELOPMENT OF GRAPHENE/METAL INTERFACES FOR LARGE SPIN-ORBIT INTERACTIONS (NIEjr06)
NATHANAEL TONG HU DING GUAN
GRAPHENE/METAL INTERFACES FOR LARGE SPIN-ORBIT INTERACTIONS (NIE jr - - PowerPoint PPT Presentation
DEVELOPMENT OF GRAPHENE/METAL INTERFACES FOR LARGE SPIN-ORBIT INTERACTIONS (NIE jr 06) NATHANAEL TONG HU DING GUAN Presentation Flow Background Aims & Objectives Methodology Results & Discussion Conclusions
NATHANAEL TONG HU DING GUAN
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due to overlapping sp2 orbitals
each carbon atom form the π and π* states.
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C2
σ
C1
π π
conductivity is based on its electrons’ quantum states
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Conduction band
Valence band
Conduction band Conduction band
Valence band Valence band
Band gap
Conductor Semiconductor Insulator
valence & conduction bands meet
to move freely between the 2 bands
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difficult to show contrast between the graphene transistors on/off states
band bending at the Fermi Level is observed.
graphene (ϕG)
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a substrate-induced band gap in graphene and
induced band gaps across different metal interfaces
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CVD graphene growth PMMA-assisted wet transfer Obtain Gr/Metal interface
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(2 sccm) (10 sccm)
60 minutes 1100°C
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Poly(Methyl- methacrylate) layer onto Cu/Gr
substrate with FeCl3 solution
graphene layer
manually
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Scanning Electron Microscopy Raman Spectroscopy I-V Measurements I-Z Spectra
Using Scanning Electron Microscope (SEM) imaging, we took high magnification images of
Using the images taken, we were able to identify any visual defects on the graphene surface.
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SEM image of Cu/Gr (x600) SEM image of ITO/Gr (x600) SEM image of Pt/Gr (x600) SEM image of W/Gr (x600)
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SEM image of Cu/Gr (x2,000) SEM image of ITO/Gr (x2,000) SEM image of Pt/Gr (x2,000) SEM image of W/Gr (x2,000)
Using Raman Spectroscopy, we characterized the G and 2D peaks of graphene in our samples. These principle peaks tell us more about the quality
and helps us confirm our samples are actually graphene.
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SiO2 ITO Si W Pt
Using a 2 probe method, we measured the I-V characteristics of the graphene samples. We plotted the voltage (V) as a function of current (A) to obtain a linear graph.
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Si W Cu ITO Pt SiO2
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Substrate Resistance/Ω Pt 4012 W 2919 Cu 4746 ITO 3413 Si 5041 SiO2 6655
𝑆 =
𝑊 𝐽 , we can deduce
the resistance of the graphene layer on the substrate
Using a Scanning Tunneling Microscope (STM), we obtained the I-Z spectra of the graphene samples. The I-Z spectras yield information on the local barrier height (band gap)
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between the magnitude of the tunneling current ( I(Z) ) and the tip sample distance ( 𝑨 ) can be expressed as I(z) ∝ 𝑓−2𝜆𝑨, where κ (decay constant), dependent on the barrier height (ϕBH), is given as κ = 5.1√ϕBH(eV )nm−1
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Substrate Barrier height/eV Pt 0.4 W 0.7 Undoped Graphene 0.1
linear graph with a gradient of -2𝜆
can hence be calculated.
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Band bending at Fermi level Possible utility in spintronic devices
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a relatively small band gap induced in pure, un-doped graphene
Uncertainty of recorded resistance
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hall effect
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Our utmost appreciation to our supervisor, Dr. Rohit Medwal, for his unwavering guidance, mentorship and encouragement during this past year. Thanks to Prof. R. S. Rawat, Head/NSSE, for allowing us access to the lab and facilities for us to carry out our research. We would like to express our sincerest gratitude to our mentor, Ms Loh Yuhui, for her support throughout this project; Dr Joseph Vas for offering his knowledge and expertise; Mr Pae Jian Yi for his patience and advice; Mr Mishra Mayank for his time and patience; Mr Avinash for his kindness and support; our fellow NRP participants Charmaine and Jin Feng for lending us their time and help. Thank you to Nanyang Technological University for offering us this invaluable opportunity to participate in NRPjr 2018.
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