beam extraction and transport
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Beam Extraction and Transport Taneli Kalvas Department of Physics, - PowerPoint PPT Presentation

Beam Extraction and Transport Taneli Kalvas Department of Physics, University of Jyvskyl, Finland 7 June, 2012 CAS2012, Senec, Slovakia Contact: T. Kalvas <taneli.kalvas@jyu.fi> Presentation outline Introduction to ion source


  1. Particle tracking codes Particle tracking codes for ion source extraction and LEBT systems: • Calculation of electrostatic fields in electrode geometry including space charge effects. • Calculation/importing of magnetostatic fields. • Tracking of particles in the fields. • Diagnostics and other supportive methods.

  2. Available codes of this type • IG UN — Plasma modelling for negative and positive ions, 2D only • P B G UNS — Plasma modelling for negative and positive ions, 2D only • S IM I ON — Simple 3D E -field solver and particle tracer, low quality space charge modelling, no plasma • K OBRA — More advanced 3D E-field solver, positive ion plasma modelling, PIC capability • L ORENTZ — State of the art 3D EM solver and particle tracer with a lot of capabilities, no plasma modelling • I B S IMU — Plasma modelling for negative and positive ions, 1D–3D E-field solver

  3. Ion Beam Simulator IBSimu is an ion optical code package made especially for the needs of ion source extraction design. Using Finite Difference Method (FDM) in a regular cartesian mesh the code can model • Systems of electrostatic and magnetic lenses • High space charge beams (low energy) • Positive and negative multispecies 3D plasma extraction

  4. Ion Beam Simulator IBSimu is an ion optical code package made especially for the needs of ion source extraction design. Using Finite Difference Method (FDM) in a regular cartesian mesh the code can model • Systems of electrostatic and magnetic lenses • High space charge beams (low energy) • Positive and negative multispecies 3D plasma extraction The code is made as a C++ library and is released freely under GNU Public Licence ∗ . • Highly versatile and customizable. • Can be used for batch processing and automatic tuning of parameters. *) http://ibsimu.sourceforge.net/

  5. Ion optics with FDM Calculation is based on evenly sized square cartesian grid(s): • Solid mesh (node type): vacuum, 0.0012 solid, near solid, neumann bound - ary condition, ... 0.001 • Electric potential 0.0008 y (m) • Electric field 0.0006 • Magnetic field 0.0004 • Space charge density • Trajectory density 0.0002 0.0004 0.0006 0.0008 0.001 x (m)

  6. Electrostatic field solver Poisson’s equation ∇ 2 φ = − ρ ǫ 0 Finite Difference representation for vacuum node i : φ i − 1 − 2 φ i + φ i +1 = − ρ i , h 2 ǫ 0 Neumann boundary node i : − 3 φ i + 4 φ i +1 − φ i +2 = dφ 2 h dx and Dirichlet (fixed) node i : φ i = φ const

  7. 1D example Solve a 1D system of length L = 10 cm, charge ρ = 1 · 10 − 6 C/m 3 and boundary conditions ∂φ ∂x ( x = 0) = 0 V/m and φ ( x = L ) = 0 V . The system is discretized to N = 6 nodes. Problem in matrix form:       2 h ∂φ − 3 4 − 1 0 0 0 φ 1 ∂x (0)       − h 2 ρ 1 − 2 1 0 0 0 φ 2       ǫ 0             − h 2 ρ 0 1 − 2 1 0 0 φ 3       ǫ 0 = ·            − h 2 ρ  0 0 1 − 2 1 0 φ 4       ǫ 0            − h 2 ρ  0 0 0 1 − 2 1 φ 5       ǫ 0       0 0 0 0 0 1 φ 6 φ ( L ) Solving the matrix equation we get ...

  8. 1D example ... perfect agreement with analytic result 600 Numerical solution Analytic solution 500 400 φ (V) 300 200 100 0 0 2 4 6 8 10 x (cm) but only because of flat charge distribution and boundaries defined exactly at node locations.

  9. Jagged boundaries In higher dimensions basic FDM generally suffers from jagged boundaries (nodes don’t coincide with surfaces). 0.08 0.06 0.04 0.02 y (m) 0 -0.02 -0.04 -0.06 -0.08 -0.08 -0.06 -0.04 -0.02 0 0.02 0.04 0.06 0.08 x (m)

  10. Smooth boundaries Derivatives in Poisson’s equation featured with uneven distances βφ ( x 0 − αh ) − ( α + β ) φ ( x 0 ) + αφ ( x 0 + βh ) = − ρ ( x 0 ) 1 ǫ 0 2 ( α + β ) αβh 2

  11. Smooth boundaries A much better solution with smooth boundaries is achieved. 0.08 0.06 0.04 0.02 y (m) 0 -0.02 -0.04 -0.06 -0.08 -0.08 -0.06 -0.04 -0.02 0 0.02 0.04 0.06 0.08 x (m)

  12. Electric field calculation Electric field is calculated between the nodes simply by E = V h . Ex Ey Ey Ex Electric field nodes between potential nodes.

  13. Trajectory calculation Population of virtual particles is calculated with following properties: • Charge: q • Mass: m • Current carried: I • Time, position and velocity coordinates: – 2D: ( t, x, v x , y, v y ) – Cylindrical symmetry: ( t, x, v x , r, v r , ω ) , ω = dθ dt – 3D: ( t, x, v x , y, v y , z, v z )

  14. Trajectory calculation Calculation of trajectories done by integrating the equations of motion dx = v x dt dy = v y dt dz = v z dt dv x a x = q = m ( E x + v y B z − v z B y ) dt dv y a y = q = m ( E y + v z B x − v x B z ) dt dv z a z = q = m ( E z + v x B y − v y B x ) dt

  15. Trajectory calculation ... and in cylindrical symmetry: dx = v x dt dr = v r dt dv x a x = q = m ( E x + v r B θ − v θ B r ) dt dv r a r + rω 2 = q m ( E y + v θ B x − v x B θ ) + rω 2 = dt � q 1 r ( a θ − v r ω ) = 1 dω � = m ( v x B r − v r B x ) − 2 v r ω , dt r where v θ = r dθ dt = rω

  16. Space charge deposition Particle trajectories deposit space charge to the geometry I ρ = Av , where A is the cross section of the particle. Linear/bilinear weighing used (finite particle size): weight 1 d x -h 0 +h Several particles needed per mesh for smooth space charge field.

  17. Emittance growth The rms emittance can grow and shrink: • Particle -particle scattering • EM-field fluctuations – Power supply ripples – Plasma instabilities • Nonlinear fields in electrostatic and magnetic optics • Nonlinear fields from beam/plasma space charge • Collimation • Simulation artefact: mesh induced emittance growth Typically accelerator systems are designed to be as linear as possible.

  18. Beam space charge effects Assuming constant space charge of the beam ρ = J/v . In cylindrical case one can calculate the E -fields from Gauss law: I r E = , r < r beam r 2 2 πǫ 0 v beam I 1 E = r , r > r beam 2 πǫ 0 v and the potential in the beam tube: r 2 � � r beam � � I − 1 φ = + log , r < r beam 2 r 2 2 πǫ 0 v r tube 2 beam � r � I φ = 2 πǫ 0 v log , r > r beam r tube

  19. Beam space charge effects Potential in a 100 mm tube with a 10 mA, 10 keV proton beam 500 r beam = 20 mm r beam = 10 mm 450 r beam = 5 mm 400 r beam = 2.5 mm 350 300 φ (V) 250 200 150 100 50 0 −40 −20 0 20 40 r (mm)

  20. Beam space charge blow -up Ion at the beam boundary experiences a repulsive force qI F r = qE r = ma r = 2 πǫ 0 rv z . The particle acceleration is a r = d 2 r dt 2 = d 2 r d 2 z d 2 r dt 2 = v 2 dz 2 . z dz 2 Therefore d 2 r 1 a r = K 1 = r , where dz 2 v 2 z qI K = . 2 πǫ 0 mv 3 z The DE can be integrated after change of variable λ = dr dz and gives dr � dz = 2 K log( r/r 0 ) , assuming dr dz = 0 at z = 0 .

  21. Beam space charge blow -up The solution is separable and can be again integrated to a final solution � r r 0 � z = √ F , where r 0 2 K � r � r/r 0 � dy F = √ log y . r 0 y =1 (1) Low divergence was assumed to be able to use equation for E r . (2) Constant v z was assumed (beam potential changes neglected). Example: Parallel zero-emittance beam of 181 Ta 20+ accelerated with 60 kV has initial radius of r 0 = 15 mm. The size of a 120 mA beam after a drift of 100 mm can be solved from F ( r/r 0 ) = 1 . 189 , which gives r = 20 mm. Linear effect ⇒ no rms emittance growth.

  22. Beam space charge compensation Transport of high -intensity, low-energy beams can be difficult due to space charge blow-up. Beam compensation helps in low E-field areas. • Background gas ionization: e − and X + created within the beam. • Opposite sign to beam trapped in beam potential, while same sign particles accelerated out ⇒ decreasing beam potential. • Secondary electron emission from beam halo hitting beam tube providing compensating particles for positive beams. • Also methods for active compensation: running electron beam in opposite direction of the main beam. • Usually increased by feeding background gas into the beamline.

  23. Beam space charge compension Measurement of ion energy distribution ejected from beam Reproduced from D. S. Todd, BIW 2008 Gives an indication of the compensation degree.

  24. Beam space charge compension Compensation by thermal particles trapped in the beam potential is difficult to estimate. Creation rate dρ c = Jnσ c dt ρ beam 1 τ = � = � dρ c vnσ c dt

  25. Beam space charge compension Compensation by thermal particles trapped in the beam potential is difficult to estimate. Creation rate dρ c = Jnσ c dt ρ beam 1 τ = � = � dρ c vnσ c dt Pulsed beams may or may not be long enough for reaching equilibrium. From N. Chauvin, ICIS 2011

  26. Beam space charge compension If creation rate is high, the SCC is finally limited by leakage of compensating particles from the potential well as SCC approaches 100 %. Electrons are fast ⇒ X + SCC < 100 % Ions are slow ⇒ X − overcompensation is possible.

  27. Beam space charge compension If creation rate is high, the SCC is finally limited by leakage of compensating particles from the potential well as SCC approaches 100 %. Electrons are fast ⇒ X + SCC < 100 % Ions are slow ⇒ X − overcompensation is possible. SCC is location dependent because compensating particles move in the potential well. Leakage in the beam ends cause at least local loss of SCC. Leakage may be limited by accelerating einzel lens or by magnetic fields. Background gas causes beam losses. Typically a 1–2 % sacrifice is sufficient for good SCC.

  28. Beam space charge compension If creation rate is high, the SCC is finally limited by leakage of compensating particles from the potential well as SCC approaches 100 %. Electrons are fast ⇒ X + SCC < 100 % Ions are slow ⇒ X − overcompensation is possible. SCC is location dependent because compensating particles move in the potential well. Leakage in the beam ends cause at least local loss of SCC. Leakage may be limited by accelerating einzel lens or by magnetic fields. Background gas causes beam losses. Typically a 1–2 % sacrifice is sufficient for good SCC. Modelling: • Simple model for SCC: scaling the effective beam current globally or locally with a SCC -factor. • PIC simulation (for example W ARP or S OL M AX P) with modelling of trapped particle dynamics

  29. Einzel focusing Einzel is a cylindrically symmetric focusing lens, which is characterized by voltage ratio R = V einzel − V tube , V tube − V 0 where V einzel is the center electrode potential, V tube is the beam tube potential and V 0 is the potential where particle kinetic enrgy is zero. The einzel lens can be accelerating ( R > 0 ) or decelerating ( R < 0 ).

  30. Einzel focusing Focusing power as a function of R. 1600 Accelerating Einzel (R > 0) Decelerating Einzel (R < 0) 1400 1200 Focal length (mm) 1000 800 600 400 200 0 0 0.5 1 1.5 2 2.5 3 |R|

  31. Einzel focusing Focal length changes with particle radius: aberrations Accelerating Decelerating 1 1 Scaled focal length (a.u.) Scaled focal length (a.u.) 0.9 0.9 0.8 0.8 0.7 0.7 f = 1200 mm lens f = 1200 mm lens f = 1000 mm lens f = 1000 mm lens f = 800 mm lens 0.6 0.6 f = 800 mm lens f = 600 mm lens f = 600 mm lens f = 400 mm lens f = 400 mm lens 0.5 0.5 f = 200 mm lens f = 200 mm lens 0.4 0.4 0 5 10 15 20 25 0 5 10 15 20 25 Starting radius (mm) Starting radius (mm) • Beam should fill less than half of the Einzel radius (28 mm in the example case). • Accelerating should be preferred if not voltage/E -field limited (less aberrations, limits space charge compensation leakage)

  32. Magnetic solenoid lens Magnetic equivalent to Einzel lens Solenoid field using on -axis field: B z ( r, z ) ≈ B 0 ( z ) − 1 2 B 0 ( z ) ′ r B r ( r, z ) ≈ Focal length of solenoid q 2 1 � B 2 f = z dz 8 Em

  33. Magnetic solenoid lens Solenoid spherical aberrations 1.05 1 Scaled focal length 0.95 0.9 0.85 B = 270 mT 0.8 B = 225 mT B = 180 mT 0.75 B = 135 mT B = 90 mT 0.7 0 5 10 15 20 25 30 35 40 45 50 Starting radius (mm) Filling about half of the bore leads to ∼ 5–10 % focal length variation.

  34. Parallel plates for beam deflection Simplest possible electrostatic dipole 2 q v 2 = mV acc z L a x ∆ t = q L +V v x = mE x v z θ d v x = q L θ mE x ≈ v z v 2 -V z V plate L θ = V acc d Good example: q and m do not effect trajectories in electrostatic systems.

  35. Parallel plates for beam chopping Fast beam chopping can be done with parallel plates: LBNL built neutron generator using 15 ns rise -time ± 1500 V switches for generating 5 ns beam pulses. PIC simulation with IBS IMU .

  36. Magnetic beam deflection Cyclotron radius mv z r = qB � 1 2 mV acc = B q rθ ≈ L � q θ = LB 2 mV acc Valid for small angles Image from Radia Beam Technologies

  37. Magnetic dipole lenses Homogenous sector magnet focuses in bending plane (x) A B R ϕ Barber’s rule: center of curvature and two focal points are on a straight line For symmetric setup: A = B = R/ tan( φ 2 ) For a 90 degree magnet: A = B = R No focusing power in transverse plane (y)

  38. Magnetic dipole lenses If magnet edge angles deviate from 90 ◦ , the focusing power in x -direction can be adjusted. α β A B R ϕ Positive angle (as shown in figure) ⇒ less focusing power in x-direction. Negative angle ⇒ more focusing power in x-direction.

  39. Magnetic dipole lenses The fringing fields provide focusing in y -direction if edge angle ( α and β ) positive. v F B R Focusing in x-direction can be traded for y-focusing: f y = tan( α ) Important case: symmetric (same focal length in x and y) double focusing dipole: 2 tan( α ) = 2 tan( β ) = tan( φ 2 ) 2 R A = B = tan( φ 2 ) For φ = 90 ◦ , α = β = 26 . 6 ◦ and A = B = 2 R .

  40. Magnetic dipole lenses Radially inhomogenous sector magnet y axis of rotation B F nG /R 0 G 0 x 0 F B Magnetic field approximation from ∇ × B = 0 : � � 1 − n x B y ( x, y ) = B 0 R 0 + · · · � � n y B x ( x, y ) = B 0 R 0 + · · · Radial focusing if n < 1 , vertical focusing if n > 0 , symmetric at n = 1 2 .

  41. Magnetic dipole applications Important applications for magnetic dipoles • Species analysis/selection • Switching magnets Image from D. Leitner, BIW 2010 Image from Danfysik

  42. Electrostatic quadrupole focusing Electrostatic quadrupole: ideally hyperbolic electrodes, cylindrical ok 1 /f x = k tan( kw ) V quad − k tanh( kw ) ,where k 2 = 1 /f y = G 0 V acc • Used as doublets or triplets for focusing in both directions. • Can also provide beam steering if electrodes independently controlled.

  43. Electrostatic quadrupole focusing Aberrations as a function of trajectory radius 285 −205 −210 280 Focal length f x (mm) Focal length f y (mm) −215 275 −220 −225 270 −230 265 −235 −240 260 −245 255 −250 0 5 10 15 20 25 30 0 5 10 15 20 25 30 Starting radius (mm) Starting radius (mm) Less than 5 % aberration at r < r max .

  44. Electrostatic quadrupole focusing Aberrations as a function of trajectory radius 285 −205 −210 280 Focal length f x (mm) Focal length f y (mm) −215 275 −220 −225 270 −230 265 −235 −240 260 −245 255 −250 0 5 10 15 20 25 30 0 5 10 15 20 25 30 Starting radius (mm) Starting radius (mm) Less than 5 % aberration at r < r max . qB Magnetic quad the same with k 2 B = G 0 mv z .

  45. Electrostatic vs magnetic LEBT • Electrostatic fields do not separate ion species. – Same focusing for all species. – Magnetic: separation of important (minor) beam. • Electrostatic lenses are more compact. • Power efficiency: Einzel ∼ 1 W, Solenoid ∼ 1000 W, water cooling usually required for magnetic elements. • Space charge compensation can be conserved in magnetic lenses. • Magnets are spark -free.

  46. Beam Extraction from Plasma

  47. Plasma -beam interface Ions are extracted from a plasma ion source 1. Full space charge compensation ( ρ − = ρ + ) in the plasma 2. No compensation in extracted beam (single polarity)

  48. Plasma -beam interface Ions are extracted from a plasma ion source 1. Full space charge compensation ( ρ − = ρ + ) in the plasma 2. No compensation in extracted beam (single polarity) The boundary is often thought as a sharp surface known as the plasma meniscus dividing the two areas. • Works as a thought model. • In reality compensation drops going from plasma to beam in a transition layer with thickness ∼ λ D ⇒ plasma sheath. • E-field in extraction rises smoothly from zero.

  49. Plasma flux The plasma flux to a surface is � J = 1 kT 4 qn ¯ v = qn 2 πm Extraction hole: ion beam samples plasma species with weight ∝ m − 1 / 2 .

  50. Plasma flux The plasma flux to a surface is � J = 1 kT 4 qn ¯ v = qn 2 πm Extraction hole: ion beam samples plasma species with weight ∝ m − 1 / 2 . Plasma flux sets the maximum current extractable I = JA meniscus , where the area of plasma meniscus A meniscus � = A aperture and therefore not quite constant. N -dimensional simulations needed for better estimates.

  51. Chil d-Langmuir law Ion beam propagation may also be limited by space charge. The 1D Child-Langmuir law gives the maximum current density for the special case where the beam is starting with v 0 = 0 (not plasma). � V 3 / 2 J = 4 2 q 9 ǫ 0 d 2 . m 100 4 kW Current density (mA/cm 2 ) 80 Child−Langmuir limit 3 kW 60 40 2 kW 20 0 0 10 20 30 40 50 Acceleration voltage (kV)

  52. Plasma electrode shape For electrons starting from a flat surface with v 0 = 0 a perfectly perpendicular beam can be achieved with so -called Pierce geometry . θ = 67.5°

  53. Plasma electrode shape For electrons starting from a flat surface with v 0 = 0 a perfectly perpendicular beam can be achieved with so -called Pierce geometry . θ = 67.5° For ion sources, there is no magic geometry because the plasma sheath shape plays a major role in the optics of the plasma-electrode to puller-electrode gap.

  54. Thermal plasma sheath Classic 1D plasma sheath theory: In an electron -ion plasma a positive plasma potential is formed due to higher mobility of electrons. Situation is described by Poisson equation � eU �� �� d 2 U dx 2 = − en 0 1 − 2 eU − exp , m i v 2 ǫ 0 kT e 0 where the entering the sheath have an initial velocity � kT e v 0 > v Bohm = m i or energy E 0 > 1 Bohm = 1 2 m i v 2 2 kT e . Model applies quite well for positive ion plasma extraction.

  55. Positive ion plasma extraction model Groundbreaking work by S. A. Self, Exact Solution of the Collisionless Plasma-Sheath Equation , Fluids 6 , 1762 (1963) and J. H. Whealton, Optics of single-stage accelerated ion beams extracted from a plasma , Rev. Sci. Instrum. 48 , 829 (1977): • Model has been used very successfully for describing positive ion extraction systems since. • Assumptions: no ion collisions, no ion generation, electron density only a function of potential (no magnetic field). • Take the model with a semiempirical approach and use it as a tool proving to yourself that it works for your case — don’t take it for granted.

  56. Positive ion plasma extraction model Modelling of positive ion extraction • Ray -traced positive ions entering sheath with initial velocity • Nonlinear space charge term (analytic in Poisson’s equation): � U − U P � ρ e = ρ e0 exp kT e /e U 0.002 bulk 0.0015 plasma U P y (m) 0.001 thermal electrons 0.0005 x positive ions 0 0.0005 0.001 0.0015 0.002 0 x (m)

  57. Example: Triode extraction Three dimensional modelling of slit -beam system for PPPL ICIS 2007, J. H. Vainionpaa, et. al., Rev. Sci. Instrum. 79, 02C102 (2008)

  58. Negative ion plasma extraction model Modelling of negative ion extraction • Ray -traced negative ions and electrons • Analytic thermal and fast positive charges • Magnetic field suppression for electrons inside plasma negative ions, U electrons � − eU � extraction ρ th = ρ th0 exp bulk kT i plasma positive U ions P � � eU �� trapped ρ f = ρ f0 1 + erf thermal E i ions simulation area x

  59. Negative ion plasma extraction model Magnetic field suppression for electrons inside plasma • Electrons highly collisional until velocity large enough • Magnetic field suppression for electrons inside plasma Total e + H 2 collision cross section 1.6e−19 1.4e−19 1.2e−19 Cross section (m 2 ) 1e−19 8e−20 6e−20 4e−20 2e−20 0 0 5 10 15 20 25 30 35 40 45 50 Electron energy (eV)

  60. Difficulties in modelling extraction systems Amount of parameters fed to the model is quite large • Extracted species: J i , T i , v 0 • Positive ion plasma model: T e , U P • Negative ion plasma model: T i , E i / T i , gas stripping loss of ions • All: space charge compensation degree and localization in LEBT Methods: educated guessing (literature data), plasma measurements and matching to beam measurements (emittance scans).

  61. Electron dumping Negative ion source extraction systems need to dispose of the co -extracted electrons ⇒ magnetic elements needed • Solenoidal focusing field (LANSCE, BNL) • Source dipole B-field (ISIS Penning) • Dipole field bending e − to dump, source tilt for ions • Dipole-antidipole dump and correction.

  62. Electron dumping Negative ion source extraction systems need to dispose of the co -extracted electrons ⇒ magnetic elements needed • Solenoidal focusing field (LANSCE, BNL) • Source dipole B-field (ISIS Penning) • Dipole field bending e − to dump, source tilt for ions • Dipole-antidipole dump and correction. Practical boundary conditions: • X-ray generation • Heat load on dump (continuous, peak) • Current load on power supplies

  63. Design project example K150 cyclotron at the Texas A&M needed a H − /D − source and extraction Using spare LBNL style H − multicusp ion source. Requirements: • DC beam of 1 mA H − and 0.5 mA D − . • Beam energy from 5 keV to 15 keV.

  64. Texas A&M: Extraction requirements The application at the cyclotron needed a new H − /D − extraction for 1 mA: • Negative ion extraction design is dominated by the necessary removal of co -extracted electrons (Factor of 10–20 more than ions).

  65. Texas A&M: Extraction requirements The application at the cyclotron needed a new H − /D − extraction for 1 mA: • Negative ion extraction design is dominated by the necessary removal of co -extracted electrons (Factor of 10–20 more than ions). • Design by T. Kuo for newer TRIUMF sources has fixed energy at puller electrode and two anti-parallel B-fields for removing electrons and returning the H − back to original angle.

  66. Texas A&M: Extraction requirements The application at the cyclotron needed a new H − /D − extraction for 1 mA: • Negative ion extraction design is dominated by the necessary removal of co -extracted electrons (Factor of 10–20 more than ions). • Design by T. Kuo for newer TRIUMF sources has fixed energy at puller electrode and two anti-parallel B-fields for removing electrons and returning the H − back to original angle. • With the LBNL source, this is not possible, because of internal filter field extends to extraction. Going with simple dipole field, tilted source design and fixed energy at tilt.

  67. Texas A&M: Extraction design First the geometry, electrde voltages and plasma parameters were optimized using cylindrically symmetric simulations (fast). Table of electrode voltages HV Puller Einzel -5 +1 -3.2 -8 -2 -5.8 -12 -6 -8.2 -15 -9 -10.5

  68. Texas A&M: 3D geometry design Geometry was optimized for low -aberration emittance and centered beam

  69. Example: SNS ion source baseline extraction

  70. SNS: plasma parameters Previously, the same plasma parameters were used as in other published simulation work. Fine tuning was now made made to match results to experimental emittance data.

  71. SNS: plasma parameters Previously, the same plasma parameters were used as in other published simulation work. Fine tuning was now made made to match results to experimental emittance data. • Transverse temperature of e − and H − T t = 2 . 0 eV • Plasma potential U P = 15 V • Emitted electron to ion ratio I e − /I H − = 10 • Thermal positive ion to negative ion ratio ρ X + /ρ H − = 0 . 5 • Initial energy of particles E 0 = 2 . 0 eV

  72. SNS: Extraction simulation Tilted SNS extraction delivering 64 mA of H − beam to the RFQ.

  73. Plasma -beam transition behaviour 30 mA/cm 2 60 mA/cm 2 120 mA/cm 2

  74. Emittance comparison 0.35 Experimental data at RFQ (y,y’) 0.3 Simulation data at RFQ (y,y’) Simulation data at RFQ (x,x’) RMS emittance (mm mrad) 0.25 0.2 0.15 0.1 0.05 10 20 30 40 50 60 Extracted H − current (mA) Experimental emittance data: B. X. Han, RSI 81 02B721 (2010)

  75. Proposed design

  76. Puller voltage adjust

  77. Emittance comparison 0.35 Experimental data at RFQ (y,y’) New extraction (y,y’) New extraction (x,x’) 0.3 Baseline puller (y,y’) Baseline puller (x,x’) RMS emittance (mm mrad) 0.25 0.2 0.15 0.1 0.05 10 20 30 40 50 60 70 80 90 100 Extracted H − current (mA)

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