H.Tatsuno@20150930 KEK測定器開発セミナー
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KEK測定器開発セミナー 2015年9月30日
荷電粒子ビーム環境における超伝導遷移端 X線検出器の性能評価
頭脳循環プロジェクト「超伝導検出器の原子核実験への応用」
竜野 秀行 (KEK / NIST)
High-resolution Exotic Atom x-ray spectroscopy with Transition-Edge Sensors
X - - PowerPoint PPT Presentation
H.Tatsuno@20150930 KEK 1 KEK 2015930 X (KEK / NIST)
H.Tatsuno@20150930 KEK測定器開発セミナー
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KEK測定器開発セミナー 2015年9月30日
頭脳循環プロジェクト「超伝導検出器の原子核実験への応用」
竜野 秀行 (KEK / NIST)
High-resolution Exotic Atom x-ray spectroscopy with Transition-Edge Sensors
H.Tatsuno@20150930 KEK測定器開発セミナー
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Contents
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・QED test (µ-atoms) ・CPT symmetry (H, p-He) ・Proton radius (µ-H) ・Mass (p,π-,K-) ・Strong force (p,π-,K-)
u s
uu d
strong force with strangeness
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“強い力の漸近的自由性” 高エネルギーで強い相互作用は弱くなる
低エネルギーでは相互作用が強 くなり計算は難しい エキゾチック原子はほぼ静止系 での強い相互作用を研究できる → 低エネルギーQCDの理解
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e−
beam stop
K−
Nucleus
n∗ ∼ ne
K
me
n*~30 for 4He
mK* reduced kaon mass
・highly excited states ・~103 times reduced mass ・keV order energy levels
me = 0.511 MeV mα = 3727.4 MeV mK = 493.7 MeV
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K−
Nucleus
Auger
X-ray
Cascade down (de-excitation)
・nuclear absorption ・shift and width ・Auger & radiative
Strong interaction
Coulomb + Strong
Coulomb only
X-ray detector ΔE: shift Γ: width ・time scale ~ ps
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K− p Λ(1405)
Γ1s ~ 500 eV ΔE1s ~ 300 eV
Kaonic Hydrogen
M.Bazzi et al., Phys. Lett. B 704, 113 (2012)
Deser-Truemanの式
∆E1s + iΓ1s 2 = 2α3µ2aK−p
scattering length
high-dense matter
3 quarks (uds)? meson - baryon?
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Theories: two approaches ‘deep potential’ ‘shallow potential’
question!
pp K− K−
4He
pp K− n K−
3He
Kaonic Helium K-nucleus cluster
deep shallow nuclear bound state?
radius
K-nucleus potential
atomic state
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deep shallow
Phenomenological
Vopt(r=0) ~ - (180 + 73i) MeV
Chiral unitary
Vopt(r=0) ~ - (40 + 55i) MeV
K-4He 3d-2p (6.4 keV)
K-3He 3d-2p (6.2 keV) 0.23 eV
Isotope shift (K-4He - K-3He)
0.01 eV
— Strong-interaction Shift & Width calc.
— Charge-density dist calc. for 4He&3He
two typical models : [Pheno.] Mares, Friedman, Gal, NPA770(06)84 [Chiral] Ramos, Oset, NPA671(00)481
Width : 2 ~ 4 eV
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deep shallow
Phenomenological
Vopt(r=0) ~ - (180 + 73i) MeV
Chiral unitary
Vopt(r=0) ~ - (40 + 55i) MeV
K-4He 3d-2p (6.4 keV)
K-3He 3d-2p (6.2 keV) 0.23 eV
Isotope shift (K-4He - K-3He)
0.01 eV
— Strong-interaction Shift & Width calc.
— Charge-density dist calc. for 4He&3He
two typical models : [Pheno.] Mares, Friedman, Gal, NPA770(06)84 [Chiral] Ramos, Oset, NPA671(00)481
Width : 2 ~ 4 eV Dominant systematic uncertainty (~0.15 eV) due to kaon-mass uncertainty will be cancelled.
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2p Level Shift [eV]
20 10
E1 E2 E3
@KEK-PS (Japan) @DAΦNE (Italy)
Publication year
: K - He
3
: K - He
4
6 2 7 2 8 2 9 2 1 2 1 1 2 1 2
. . .
Detector: SDD ΔE2p [eV]
M.Bazzi et al., Phys. Lett. B 697, 199 (2011) M.Bazzi et al., Phys. Lett. B 681, 310 (2009) S.Okada et al., Phys. Lett. B 653, 387 (2007)
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2 − 1.5 − 1 − 0.5 − 0.5 1 1.5 2
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2p Level Shift [eV]
20 10
E1 E2 E3
@KEK-PS (Japan) @DAΦNE (Italy)
Publication year
: K - He
3
: K - He
4
6 2 7 2 8 2 9 2 1 2 1 1 2 1 2
. . .
SDD ±2 eV
Isotop shift (K4He - K3He) [eV]
Phen Chiral ΔE2p [eV]
M.Bazzi et al., Phys. Lett. B 697, 199 (2011) M.Bazzi et al., Phys. Lett. B 681, 310 (2009) S.Okada et al., Phys. Lett. B 653, 387 (2007)
Detector: SDD
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2p Level Shift [eV]
20 10
E1 E2 E3
@KEK-PS (Japan) @DAΦNE (Italy)
Publication year
: K - He
3
: K - He
4
6 2 7 2 8 2 9 2 1 2 1 1 2 1 2
. . .
TES ±0.2 eV
SDD ±2 eV
Isotop shift (K4He - K3He) [eV]
Phen Chiral Goal ΔE2p [eV]
New measurement technique !
M.Bazzi et al., Phys. Lett. B 697, 199 (2011) M.Bazzi et al., Phys. Lett. B 681, 310 (2009) S.Okada et al., Phys. Lett. B 653, 387 (2007)
J-PARC E62
Detector: SDD
2 − 1.5 − 1 − 0.5 − 0.5 1 1.5 2
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Transition Edge Sensor
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normal conducting sate super- conducting sate Temperature Resistance ~ 100 mK Width of transition edge ΔE~ a few mK
Ener Thermometer sensitivity
Absorber Heat capacity : C Thermal conductance : G Low temperature heat sink
~ pJ/K ~ nW/K
Thermometer
T
X-ray energy : E
TES and electro-thermal feedback
Ib Rsh
L
SQUID Readout
吸収体 Bi
Si3N4
Si
SQUID
ΔT bias point R0/RN~0.2 RN
TES
τrise~L/(Rsh+R0)
R0
τfall~C/G
α = d log R d log T
a few mK
super- conducting state normal- conducting state
∆E = 2.355 r kBT 2C α
Emax ∝ C α
TES TES TES TES TES TES
Out M Feedback M Out 2
TES TES TES
Out 1 Feedback 1 I2(t) IN(t) I1(t)
Detector Bias
SQUID Bias Feedback 2 time I1(t) time I2(t) time IN(t) Boxcar Modulation Functions
RSH RSH RSH RSH RSH RSH RSH RSH RSH RA RA RA RA RA RA RA RA RA RA RA
Time Division Multiplexing (TDM)
K.D. Irwin and G.C. Hilton, Cryogenic Particle Detection
column row trow=320ns 30 rows tflame=9.6μs
time
9.6μs
electrical cross talk in a column
17
1ch
8 columns
SQUID noise √Nrow
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J.N. Ullom et al., Synchrotron Radiation News, Vol. 27, 24 (2014)
Bi + TES Au coated Si collimator
33 cm
1cm
Photo credit : J. Uhlig
http://www.hpd-online.com/102_cryostat.php
30 ch TDM(time division multiplexing) readout
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Cryostat ・Pulse tube (50K, 3K) + ADR (1K, 50mK) ・Temp regulation (75mK) hold time 36 hours ・Manufactured by HPD, designed at NIST TES array ・240 pixel Mo-Cu bilayer TES ・4-µm thick Bi absorber → 85% efficiency at 6 keV ・pixel area: 305 µm x 320 µm → total 23mm2
salt pills 1K and 50mK stages
GGG FAA GGG
Gadolinium-Gallium Garnet ~600mK Ferric- Ammonium Alum ~40mK
NbTi magnet coil (9A, 4T)
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Experiment
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π-/K- beam
~ ~
Target
scattered charged particles
Degrader
NIST designed 240-pixel TES array (Mo-Cu bilayer, 4 μm Bi absorber)
1 pixel 320um x 300um, total ~23 mm2
Photos by D.R. Schmidt (NIST)
8 x 30 ch TDM chips
TES current (abr.)
slow down
4 2
6
Time [ms]
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π-/K- beam
~ ~
Target
scattered charged particles
Degrader
Test experiment at a pion beam line of Paul Scherrer Institute (Switzerland)
NIST designed 240-pixel TES array (Mo-Cu bilayer, 4 μm Bi absorber)
1 pixel 320um x 300um, total ~23 mm2
Photos by D.R. Schmidt (NIST)
8 x 30 ch TDM chips
TES current (abr.)
slow down
4 2
6
Time [ms]
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BC1 BC2 BC4 Carbon moderator Lead collimator π beam ~170 MeV/c TES array Carbon target X-ray tube
Overhead view
BC3 Lead shield
6cm
ADR cryostat
Beam intensity monitor
✓ TES in-beam performance study ✓ measured πC 4-3 transition x-rays ~6.4 keV ✓ in-situ energy calibration (Cr and Co fluorescence)
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Measurement at the πM1 beam line of PSI
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Measurement at the πM1 beam line of PSI
Cryostat Beam Electronics Target
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Frequency (Hz)
210
310
410
/ Hz)
2PSD (Counts
3 −10
2 −10
1 −10
Noise Noise
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“Optimal filtering”
Time past trigger (ms)
2 − 1 − 1 2 3 4 5 6 7
Normalized pulse height
0.0 0.2 0.4 0.6 0.8 1.0
Average pulse Average pulse Time past trigger (ms)
2 − 1 − 1 2 3 4 5 6 7 0.03 − 0.02 − 0.01 − 0.00 − 0.01 0.02
Optimal Filter Optimal Filter
Sample #
250 252 254 256 258 260 262 264
Pulse Height
1000 2000 3000 4000 5000 6000 7000 8000
Lag [sample #]
2.0 − 1.5 − 1.0 − 0.5 − 0.0 0.5 1.0 1.5 2.0
Pulse Height
13280 13300 13320 13340 13360 13380 13400
This filtering is equivalent to fitting for pulse height and timing lag. Average pulse 1024 samples Noise PSD Filter to convolute with data + autocorrelation 320 ns x 30 ch =9.6 us
lag= -2 lag= -1 lag= 2 lag= 1 filtering result
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Energy [eV] 6000 7000 8000 9000 10000 11000 12000 ) [eV] σ FWHM (2.355 4 6 8 10 12 14
■ beam 1.45 MHz
▲ beam 2.8 MHz
CrKa FeKa GaKa GeKa AsKa SeKa BrKa CoKa
Energy dependence of energy resolution
CuKa MnKa max. dynamic range ~14 keV
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Energy [keV] 5 6 7 8 105 104 103 102 10 1 Counts / 1 eV FeKα CrKα CrKβ CoKα CoKβ CuKα
πC 4-3 position
X-ray energy [eV]
5500 6000 6500 7000 7500
Pulse height
13000 14000 15000 16000 17000 18000
cubic spline interpolation ch 3
FeKα each pixel FeKα (from stainless steal): useful to verify the energy calibration
CoKα CrKα CrKβ CoKβ
Beam off
✓ ΔEFWHM ~ 5 eV (beam off) at 6.4 keV
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Analysis to achieve the 0.1 eV systematic uncertainty
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Energy [eV] 6840 6860 6880 6900 6920 6940 6960 6980 7000 Counts / 1 eV 2000 4000 6000 8000 10000 12000 14000 16000 18000 20000
Co Kα1,2 peaks (beam off)
Co Kα1 Co Kα2
Fit line with CoKa complex FWHM 6.1 eV
Co Kα calibration lines
Red: simple fit with Voigt profiles (Hölzer fit)
Hölzer et al., PRA 56 (1997) 4554
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Energy [eV] 6840 6860 6880 6900 6920 6940 6960 6980 7000 Counts / 1 eV
2
10
3
10
4
10
Lorentzians Δ Energy -0.5 eV
・Peak location shift = −0.5 eV
LE tail
What creates the LE tail ? Thermally evaporated Bi absorber
・Bi grains structure ? ・Heat trapping in lattice ?
Energy [eV] 6840 6860 6880 6900 6920 6940 6960 6980 7000 Counts / 1 eV 2000 4000 6000 8000 10000 12000 14000 16000 18000 20000
Co Kα1,2 peaks (beam off)
Co Kα1 Co Kα2
Fit line with CoKa complex FWHM 6.1 eV
Co Kα calibration lines
Red: simple fit with Voigt profiles (Hölzer fit)
Hölzer et al., PRA 56 (1997) 4554
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Energy [eV] 6840 6860 6880 6900 6920 6940 6960 6980 7000
Fit residual
800 − 600 − 400 − 200 − 200 400 600 800
Energy [eV] 6840 6860 6880 6900 6920 6940 6960 6980 7000 Counts / 1 eV
2
10
3
10
4
10
Fit residual and ±3σ lines fit line with LE tail (16.7%)
Co Kα1 Co Kα2
with LE tail ・<ΔEFWHM> = 5.2 eV ・LE tail fraction = 16.7% ・LE tail slope β = 28.6 eV
Empirical fit of low-energy tail
exponential tail
= convolution Exp*Gauss
A exp ✓E − E0 β ◆ Erfc ✓E − E0 √ 2σ + σ √ 2β ◆
LETail (E, σ, β) =
w/o LE tail ・Energy shift = −0.5 eV ・<ΔEFWHM> = 6.1 eV
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Energy [eV] 6000 7000 8000 9000 10000 11000 12000 Low-energy tail fraction 0.12 0.14 0.16 0.18 0.2 0.22 0.24 0.26 0.28 0.3
CrKa FeKa GaKa GeKa AsKa SeKa BrKa CoKa CuKa MnKa
Energy dependence of the LE tail fraction
E Peak shift ・Peak location shift affects the E scale w/o LE tail
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Energy [eV] 6000 7000 8000 9000 10000 11000 12000 Low-energy tail fraction 0.12 0.14 0.16 0.18 0.2 0.22 0.24 0.26 0.28 0.3
CrKa FeKa GaKa GeKa AsKa SeKa BrKa CoKa CuKa MnKa
Energy dependence of the LE tail fraction
Estimate the LE tail fraction for pionic atom X-rays
π-C 4-3
→ reduce the systematic uncertainty
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0.2 − 0.2 0.4 0.6 0.8 1 3 4 5 6 7 8 9 10 11 12
Energy [eV] 6840 6860 6880 6900 6920 6940 6960 6980 7000 Normalized
5 −
10
4 −
10
3 −
10
2 −
10
1 −
10
Co Kα1 Co Kα2 LE tail HE tail
beam 1.45 MHz beam off beam 2.8 MHz
・What degrades ΔE ? ・What causes the low-E and high-E tails ?
Thermal crosstalk due to the charged particle hits
ΔEFWHM [eV]
beam off 1.45 MHz 2.8 MHz Charged particle hit rate Hz/pixel
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Position Y [mm]
2 4
Triggered pules (Mn X-rays + beam)
Thermal crosstalk due to charged particle hits
Time [ms]
1 2
Mn X-ray pulse height
zoom
3
TES current (abr.) TES current (abr.)
1 2
3
Position X [mm]
2 4
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Position Y [mm]
2 4
Triggered pules (Mn X-rays + beam)
small pulses (far from the cluster)
Thermal crosstalk due to charged particle hits
same timing pulses (cluster)
Time [ms]
1 2
zoom
3
TES current (abr.) TES current (abr.)
1 2
3
Position X [mm]
2 4
cluster events
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Position Y [mm]
2 4
Triggered pules (Mn X-rays + beam)
small pulses
Thermal crosstalk due to charged particle hits
same timing pulses (cluster)
Time [ms]
1 2
Mn X-ray pulse height
zoom
3
TES current (abr.) TES current (abr.)
1 2
3
Position X [mm]
2 4
275µm Si substrate High energy particle ~100 keV
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Thermal crosstalk due to charged particle hits
Heat transport time in Si : ~µsec
diffused & attenuated
Pulse height of cluster events (data) Thermal diffusion calculation
Simple diffusion calculation in Si High-E particle
~100 keV
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Thermal crosstalk due to charged particle hits
Heat transport time in Si : ~µsec
diffused & attenuated
Pulse height of cluster events (data) Thermal diffusion calculation
Simple diffusion calculation in Si High-E particle
~100 keV
・large xtalk pulses: yes ・small xtalk pulses: cannot cut → degrade ΔE ・if xtalk coincident with X-ray, cannot cut → high-E tail
Time [ms]
4 6
2
TES current (abr.)
Can cut the xtalk events ?
These small thermal crosstalk create “second pulses”
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Energy [eV] 6840 6860 6880 6900 6920 6940 6960 6980 7000 Counts / 1 eV 0.005 0.01 0.015 0.02 0.025 0.03
Cut of thermal crosstalk piled-up events
CoKα CoKβ CrKα CrKβ CoKα
Normalized Corrected pulse area
1 2 3 1 2 3 CoKα
(Pulse area - baseline) / nSamples
6% 4% 90%
~6% low-E component contains high-E component baseline shift, gain shift,
Filtered pulse height Energy [eV] Energy [eV]
energy dependent slope
reject reject
(logZ)
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Energy [eV] 6840 6860 6880 6900 6920 6940 6960 6980 7000 Normalized
5 −
10
4 −
10
3 −
10
2 −
10
1 −
10 Energy [eV] 6840 6860 6880 6900 6920 6940 6960 6980 7000 Normalized
5 −
10
4 −
10
3 −
10
2 −
10
1 −
10
Co Kα1 Co Kα2
beam 1.45 MHz beam off beam 2.8 MHz
with correlation cut
Fit for 1.45 MHz beam data ・<ΔEFWHM> = 7.1 eV ・LE tail fraction = 23.1% ・HE tail fraction = 9.1%
with cut
suppressed the LE tail
Cut of thermal crosstalk pileup events
・<ΔEFWHM> = 6.9 eV ・LE tail fraction = 17.3% ・HE tail fraction = 8.3%
・suppressed the LE tail ・slightly improved ΔE
Fit with the correlation cut
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10
π-atom peak with clear timing correlation
FWHM ~ 7 eV
✓ Excellent energy resolution even in the hadron beam ✓ Good timing resolution comparable with SDDs ✓ Accurate energy calibration using Cr&Co lines ✓ piC x-ray energies agree with EM calc.
5 eV (beam off)→7 eV (beam on) [FWHM@ 6.4 keV] < 0.1 eV accuracy @ FeKa
✓ ΔEFWHM ~ 7eV (beam on) at 6.4 keV ✓ ΔtFWHM =1.2 µs ✓ FeKα energy uncertainty ±0.04 eV ✓ πC 4f-3d syst uncertainty~ ±0.1 eV
Fe Kα fluorescence (stainless steel) excited by x-ray tube
TESs work!!
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44 Energy [eV] 6340 6360 6380 6400 6420 6440 6460 Counts / 1 eV 50 100 150 200 250 300 350
・Data taking 13.5 hours ・Beam (π- & e-) 1.45 MHz ・Calib. X-ray 4.4 Hz/pixel ・Beam hit (pixel) 0.4 Hz/pixel ・Beam hit (array) ~400 Hz/cm2 ・Temp regulated 75mK ±7µK
FeKα1 FeKα2 πC 4f-3d
πC 4d-3p ・<ΔEFWHM> (beam off) = 4.7 eV at FeKα ・<ΔEFWHM> (beam on) = 6.8 eV at FeKα
209 pixels FWHM 6.8 eV
・Energy uncertainty (πC 4f-3d) = ±0.13 (stat) ±0.09 (syst) eV
The dominant uncertainty source is the background (tail of FeKα) ±0.07 eV Energy calibrated with Cr and Co lines
H.Tatsuno@20150930 KEK測定器開発セミナー
45 Energy [eV] 6340 6360 6380 6400 6420 6440 6460 Counts / 1 eV 50 100 150 200 250 300 350
・Data taking 13.5 hours ・Beam (π- & e-) 1.45 MHz ・Calib. X-ray 4.4 Hz/pixel ・Beam hit (pixel) 0.4 Hz/pixel ・Beam hit (array) ~400 Hz/cm2 ・Temp regulated 75mK ±7µK
FeKα1 FeKα2 πC 4f-3d
πC 4d-3p ・<ΔEFWHM> (beam off) = 4.7 eV at FeKα ・<ΔEFWHM> (beam on) = 6.8 eV at FeKα
209 pixels FWHM 6.8 eV
Energy calibrated with Cr and Co lines E-calib accuracy ±0.04 eV
・Energy uncertainty (πC 4f-3d) = ±0.13 (stat) ±0.09 (syst) eV
The dominant uncertainty source is the background (tail of FeKα) ±0.07 eV
H.Tatsuno@20150930 KEK測定器開発セミナー
46 Energy [eV] 6340 6360 6380 6400 6420 6440 6460 Counts / 1 eV 50 100 150 200 250 300 350
・Data taking 13.5 hours ・Beam (π- & e-) 1.45 MHz ・Calib. X-ray 4.4 Hz/pixel ・Beam hit (pixel) 0.4 Hz/pixel ・Beam hit (array) ~400 Hz/cm2 ・Temp regulated 75mK ±7µK
FeKα1 FeKα2 πC 4f-3d
πC 4d-3p ・<ΔEFWHM> (beam off) = 4.7 eV at FeKα ・<ΔEFWHM> (beam on) = 6.8 eV at FeKα
209 pixels FWHM 6.8 eV
・Energy uncertainty (πC 4f-3d) = ±0.13 (stat) ±0.09 (syst) eV
The dominant uncertainty source is the background (tail of FeKα) ±0.07 eV Energy calibrated with Cr and Co lines
H.Tatsuno@20150930 KEK測定器開発セミナー
47 Energy [eV] 6340 6360 6380 6400 6420 6440 6460 Counts / 1 eV 50 100 150 200 250 300 350
FeKα1 FeKα2 πC 4f-3d
πC 4d-3p ・<ΔEFWHM> (beam off) = 4.7 eV at FeKα ・<ΔEFWHM> (beam on) = 6.8 eV at FeKα
209 pixels FWHM 6.8 eV
The TESs work well ! Achieved the precision goal !!
Energy calibrated with Cr and Co lines
・Data taking 13.5 hours ・Beam (π- & e-) 1.45 MHz ・Calib. X-ray 4.4 Hz/pixel ・Beam hit (pixel) 0.4 Hz/pixel ・Beam hit (array) ~400 Hz/cm2 ・Temp regulated 75mK ±7µK ・Energy uncertainty (πC 4f-3d) = ±0.13 (stat) ±0.09 (syst) eV
The dominant uncertainty source is the background (tail of FeKα) ±0.07 eV
H.Tatsuno@20150930 KEK測定器開発セミナー
48 Energy [eV] 6340 6360 6380 6400 6420 6440 6460 Counts / 1 eV 50 100 150 200 250 300 350
FeKα1 FeKα2 πC 4f-3d
πC 4d-3p ・<ΔEFWHM> (beam off) = 4.7 eV at FeKα ・<ΔEFWHM> (beam on) = 6.8 eV at FeKα
209 pixels FWHM 6.8 eV
The TESs work well ! Achieved the precision goal !!
Energy calibrated with Cr and Co lines
・Data taking 13.5 hours ・Beam (π- & e-) 1.45 MHz ・Calib. X-ray 4.4 Hz/pixel ・Beam hit (pixel) 0.4 Hz/pixel ・Beam hit (array) ~400 Hz/cm2 ・Temp regulated 75mK ±7µK ・Energy uncertainty (πC 4f-3d) = ±0.13 (stat) ±0.09 (syst) eV
The dominant uncertainty source is the background (tail of FeKα) ±0.07 eV
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J-PARC E62 experiment K- 3He and 4He
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∗Spokesperson †Co-spokesperson ‡Co-spokesperson
J.W. Fowlerb, H. Fujiokae, C. Guaraldoa, F. Parnefjord Gustafssonf, T. Hashimotog, R.S. Hayanoh∗, J.P. Hays-Wehleb, G.C. Hiltonb, T. Hiraiwai, M. Iioj, M. Iliescua,
J.N. Ullomb,m, S. Yamadan, T. Yamazakih, and J. Zmeskalc
a Laboratori Nazionali di Frascati dell’ INFN, Frascati, RM, I-00044, Italy b National Institute of Standards and Technology (NIST), Boulder, CO, 80303, USA c Stefan-Meyer-Institut f¨
ur subatomare Physik, Vienna, A-1090, Austria
d Department of Physics, University of Zagreb, Zagreb, HR-10000, Croatia e Department of Physics, Kyoto University, Kyoto, 606-8502, Japan f Department of Chemical Physics, Lund University, Lund, 221 00, Sweden g RIKEN Nishina Center, RIKEN, Wako, 351-0198, Japan h Department of Physics, The University of Tokyo, Tokyo, 113-0033, Japan i Research Center for Nuclear Physics (RCNP), Osaka University, Osaka, 567-0047, Japan j High Energy Accelerator Research Organization (KEK), Tsukuba, 305-0801, Japan k Japan Atomic Energy Agency (JAEA), Tokai, 319-1184, Japan l Department of Physics, Tokyo Institute of Technology, Tokyo, 152-8551, Japan m Department of Physics, University of Colorado at Boulder, Boulder, CO, 80309-0390, USA n Department of Physics, Tokyo Metropolitan University, Tokyo, 192-0397, Japan
H.Tatsuno@20150930 KEK測定器開発セミナー
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K- beam
existing target system for Liq. Helium 3 & 4
(used for K-pp search, E15 expt.)
stop K- in a target
NIST TES system Kaon beam detectors
H.Tatsuno@20150930 KEK測定器開発セミナー
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beam off 1.45 MHz 2.8 MHz
J-PARC K1.8BR
PSIπM1
simulation
H.Tatsuno@20150930 KEK測定器開発セミナー
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12
Energy (eV)
2000 4000 6000 8000 10000
Counts / 1 eV
50 100 150 200 250 300
Data MC(all) beam)
MC( beam)
MC( beam)
absorption)
MC(
e- beam incident
Good reproducibility of hit rate & spectral shape
Comparison of PSI data with the simulation
Sim result for each initial particles
TES trigger rate /pixel Measured 0.71 ± 0.11 /sec Simulation 0.64 / sec
J-PARC will be less severe compared with PSI
πM1 at PSI K1.8BR at J-PARC Beam momentum 173 MeV/c 900 MeV/c Total beam intensity 2.8×106 /sec 8.0×105 / spill K−/π−/µ−/e− ratio —/ 40% / 5% / 55% 20% / 60% / 10% / 10% TES trigger rate / pixel 0.64/sec 0.17 /spill Energy deposit on Si 152 MeV/sec 46 MeV/spill
(@ 50 kW) ( normalized by # of incident beam )
H.Tatsuno@20150930 KEK測定器開発セミナー
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Energy (eV)
6000 6100 6200 6300 6400 6500 6600 6700
Counts / 2 eV
20 40 60 80 100 50 kW beam intensity 2 week data taking 2p → 3d He
3
kaonic
1
α
Fe K
2
α
Fe K 2p → 3d He
4
kaonic
K-4He : ~0.2 K-3He : ~0.35
Assuming 6 eV FWHM resolution
240 counts 120 counts
Asynchronous bg. : 1.5 counts /eV Synchronous bg. : 6 counts /eV Fe Kα intensities are controllable with applied voltage of x-ray tube
precision
eV eV
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✓ First application of the TES-based hadronic atom spectroscopy ✓ We have understood… ✓ Absolute energy of π-C 4-3 X-rays
・ E uncertainty ±0.13(stat) ±0.09 (syst) eV
✓ LE tail elimination with different Bi fabrication process
・ energy calibration accuracy ±0.04 eV
✓ Kaonic helium x-ray measurement with TESs at J-PARC
・ low-energy tail (linear E) ・ thermal crosstalk (LE and HE tails) ・ ΔE degrades ・ area correlation cut for LE tail ↓