SLIDE 19 Experimental Setup
CKT
#nunk #Mos #nnz #Pnnz Memory (MB)
Direct GPSCP
test1 202,738 67,451 1,156,428 823,156 204.91 37.21(5.5X) test2 202,738 114,664 2,081,570 1,689,365 450.80 73.90(6.1X) 3 608 12 192 603 3 12 301 2 626 443 916 8 1 6 1 ( 2X) test3 608,127 192,603 3,127,301 2,626,443 916.78 176.15(5.2X) test4 608,127 327,426 5,629,682 4,857,630 1,651.22 250.11(6.6X) test5 1 187 452 644 852 10 837 454 9 460 210 3 136 83 468 19(6 7X) test5 1,187,452 644,852 10,837,454 9,460,210 3,136.83 468.19(6.7X) test6 63,981
494,757 204.53 30.92(6.6X)
- Tests 1-5: large PDNs with on-chip voltage regulators
- #nunk: number of unknowns in the circuits
- #Mos: number of MOSFET in the circuits
- #nnz: number of non-zero elements in the MNA matrix
- Test 6: Industrial analog design (only MNA matrix available)
19
- #nnz: number of non-zero elements in the MNA matrix
- #Pnnz: number of non-zero elements in the preconditioner matrix
- Memory: memory cost during LU factorization of MNA matrix